Patent application number | Description | Published |
20120248694 | Printing Apparatus - There is provided a printing apparatus including: a printing mechanism; a plurality of trays; a discharge mechanism; a plurality of detection mechanisms which detect whether a height of the sheets stacked on the trays is not less than a threshold value; and a controller which controls the discharge mechanism and the printing mechanism. When the detection mechanisms detect that all heights of the sheets stacked on the trays are not less than the threshold value, the controller controls the discharge mechanism to discontinue a discharge of the sheets. After the discharge of the sheets is discontinued, when the detection mechanisms detect that the heights of the sheets stacked on at least two trays became smaller than the threshold value, the controller controls the discharge mechanism to resume the discharge of the sheets on a tray which is other than a tray which is recovered first. | 10-04-2012 |
20140001698 | Image Forming Apparatus | 01-02-2014 |
20140036293 | PRINTER - A printer includes a print unit; a processor; and memory storing computer readable instructions that, when executed by the processor, cause the printer to: operate the printing unit in an operation mode, which is one of a power supply mode and a power saving mode, wherein power consumption in the power saving mode is less than power consumption in the power supply mode; execute a correction process to acquire a correction value; adjust printing characteristics of the print unit in accordance with the acquired correction value; and in case that a particular condition is satisfied while the correction process is performed and there is a print job to be executed in accordance with the adjusted printing characteristics after completing the correction process, change the operation mode from the power supply mode to the power saving mode after completing the correction process and executing the print job. | 02-06-2014 |
20150244899 | IMAGE PROCESSING APPARATUS - An image processing apparatus includes: an image processing unit; an authentication-information input unit; a storage unit; and a controller. The storage unit stores a plurality of secure jobs and a plurality of authentication information associated with the secure jobs respectively. The controller is configured to: acquire first authentication information; in a case that the first authentication information matches an authentication information stored in the storage unit, cause the image processing unit to execute a secure job stored in the storage unit and associated with the authentication information; acquire second authentication information which has been inputted during an interruption of the secure job; and in a case that the second authentication information matches another authentication information, and that another secure job associated with the another authentication information is executable by the image processing unit, cause the image processing unit to execute the another secure job. | 08-27-2015 |
20150278668 | IMAGE FORMING APPARATUS, NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUM STORING COMPUTER-READABLE INSTRUCTIONS, AND PRINTING APPARATUS - An image forming apparatus including an image forming unit and a controller causing the image forming unit to perform printing in printing periods after respective non-printing periods occurring alternately with the printing periods, determining a number of sheets to be printed in each of the printing periods in accordance with a number of sheets remaining to be printed in a print job, wherein, when printing periods include a first printing period and a second printing period, determining a number of sheets to be printed in the first printing period and determining a number of sheets to be printed in the second printing period which is in relation to the determined number of sheets to be printed in the first printing period, and determining a length of each of the non-printing periods in accordance with the determined number of sheets to be printed in each of the printing periods. | 10-01-2015 |
Patent application number | Description | Published |
20130295374 | GRAPHENE SHEET FILM CONNECTED WITH CARBON NANOTUBES, METHOD FOR PRODUCING SAME, AND GRAPHENE SHEET CAPACITOR USING SAME - A graphene sheet film as a film-like assembly of two or more graphene sheets | 11-07-2013 |
20150248972 | LINKED STACKS OF PARTLY REDUCED GRAPHENE, METHOD FOR PRODUCING LINKED STACKS OF PARTLY REDUCED GRAPHENE, POWDER COMPRISING LINKED STACKS OF PARTLY REDUCED GRAPHENE, FILM COMPRISING LINKED STACKS OF PARTLY REDUCED GRAPHENE, GRAPHENE ELECTRODE FILM, METHOD FOR PRODUCING GRAPHENE ELECTRODE FILM, AND GRAPHENE CAPACITOR - The object of the present invention is to provide linked stacks of reduced graphene, in which excellent electrical property on the surface of graphene may be utilized, a method for producing the same, powder comprising the same, and film comprising the same. The object may be solved by using linked stacks of partly reduced graphene | 09-03-2015 |
20150291431 | ULTRATHIN GRAPHENE PIECE, APPARATUS FOR PREPARING ULTRATHIN GRAPHENE PIECE, METHOD FOR PREPARING ULTRATHIN GRAPHENE PIECE, CAPACITOR, AND METHOD OF MANUFACTURING CAPACITOR - The problem addressed by the present invention is to provide an apparatus for preparing ultrathin graphene pieces capable of preparing ultrathin graphene pieces in which less than 10 pieces of graphene are overlapped in large quantities, a method for preparing ultrathin graphene pieces capable of preparing the ultrathin graphene pieces with high yield, an ultrathin graphene piece in which less than 10 pieces of graphene are overlapped, a capacitor having high performance by using the ultrathin graphene piece as an electrode, and an efficient method of manufacturing the capacitor. The above-described problem can be solved by using an apparatus | 10-15-2015 |
Patent application number | Description | Published |
20130246048 | TEXT PROOFREADING APPARATUS AND TEXT PROOFREADING METHOD - A Japanese proofreading apparatus has a correction history corpus, a proofreading candidate generation unit, a proofreading availability determination unit, and an automatic proofreading unit. The correction history corpus stores negative sentences as post-proofreading sentences and positive example sentences as post-proofreading sentences, in association with each other. The proofreading candidate generation unit acquires the post-proofreading sentences corresponding to the pre-proofreading sentences from the correction history corpus, according to characteristics of a proofreading target sentence. The proofreading availability determination unit selects, from the post-proofreading sentences acquired by the proofreading candidate generation unit, post-proofreading sentences with degrees of similarity between the proofreading target sentence and the post-proofreading sentences equal to or more than a predetermined threshold value, as proofreading candidates. The automatic proofreading unit proofreads the proofreading target sentence, using, out of the post-proofreading sentences selected by the proofreading availability determination unit, a post-proofreading sentence with the highest degree of similarity. | 09-19-2013 |
20140350913 | TRANSLATION DEVICE AND METHOD - A translation device includes a processor that executes a procedure. The procedure includes: generating plural original text candidates by applying each of plural predetermined different pre-editing rules or rule combinations to an original text expressed in a first language; translating each of the plural original text candidates into respective translated text candidates expressed in a second language, and translating each of the translated text candidates into a respective reverse translated text expressed in the first language; and generating a concept structure expressing a semantic structure of each of the original text candidates and each of the reverse translation texts, and selecting a translated text candidate that corresponds to the original text candidate whose degree of similarity between the concept structure of the original text candidate and the concept structure of the reverse translated text corresponding to the original text candidate is a specific value or greater. | 11-27-2014 |
20160055249 | INFORMATION PROCESSING METHOD, INFORMATION PROCESSING APPARATUS AND STORAGE MEDIUM - An information processing method executed by an information processing apparatus, includes receiving a keyword; extracting one or more experts related to a document including the keyword from document information, the document information including a plurality of documents registered within a period of time including a plurality of periods and information on an expert related to each of the plurality of documents; determining a score in each period based on a ratio of a number of registered documents related to the keyword to a number of all registered documents and a coefficient increased in value as the period becomes newer, with respect to each of the one or more experts; determining an expert value related to the keyword for each of the one or more experts by adding together the score in each period; and ranking each of the one or more experts based on comparison of the expert value. | 02-25-2016 |
Patent application number | Description | Published |
20080246497 | SEMICONDUCTOR WAFER INSPECTION APPARATUS - Efficiency of a charging processing of an insulator sample is improved. And, an electron optical system is adjusted according to a contact resistance value of the insulator sample. Breakdown of a sample is performed before the charging processing, and then, the charging processing is performed. A control parameter of the electron optical system is selected using a result of a resistance value of the sample for checking the breakdown. | 10-09-2008 |
20080277583 | Charged particle beam apparatus - Electrification affected on a surface of a sample which is caused by irradiation of a primary charged particle beam is prevented when plural frames are integrated to obtain an image of a predetermined area of the sample in a charged particle beam apparatus. The predetermined area of the sample is scanned with a primary electron beam from an electron gun, and plural frames are generated and integrated while detecting generated secondary electrons with a detector to obtain the image of the predetermined area. If it is determined by a detection signal of the detector that an electrification amount at the predetermined area becomes a specified value when generating plural frames, an electricity removal voltage is applied to a boosting electrode to remove or reduce the electrification, prior to generation of the next frame. Accordingly, the signal-to-noise ratio of the image obtained by integrating plural frames can be improved. | 11-13-2008 |
20090057557 | Localized static charge distribution precision measurement method and device - A charged particle beam device including a function for measuring localized static charges on a sample. A primary charged particle beam scans a sample positioned in a mirror state to acquire an image. The acquired image may be an image of the sample or may be an image of a structural component in the charged particle optical system. The acquired image is compared with a standard sample image and the localized static charge is measured. | 03-05-2009 |
20090166557 | Charge control apparatus and measurement apparatus equipped with the charge control apparatus - The invention solves charge nonuniformity of a specimen surface resulting from emission variation of a carbon nanotube electron source and individual difference of emission characteristics. During charge control processing, charge of the specimen surface is measured in real time. As means for solving charge nonuniformity resulting from nonuniformity of electron illumination density, electrons illuminating the specimen and the specimen are moved relatively to average electron illumination density. Moreover, an absorption current flowing into the specimen and the numbers of secondary electrons emitted from the specimen and of backscattered electrons are measured as means for monitoring charge of the specimen surface in real time. | 07-02-2009 |
20090179151 | APPARATUS AND METHOD FOR INSPECTION AND MEASUREMENT - An electrification control electrode B is installed at a measured or inspected specimen side of an electrification control electrode A, and a constant voltage is applied from an electrification control electrode control portion of an electrification control electrode B according to an electrification state of a specimen, whereby a variation of an electrification state and a potential barrier of a specimen surface formed before an inspection is suppressed. A retarding potential is applied by an electrification control electrode, and the electrification control electrode B is disposed below the electrification control electrode A adjusted to equal potential to a specimen. As a result, it is possible to adjust the amount that secondary electrons emitted from a specimen such as a wafer to which a primary electron beam is irradiated return to a specimen, and thus it is possible to stably maintain an inspection condition of high sensitivity during an inspection. | 07-16-2009 |
20100051806 | CHARGED PARTICLE BEAM APPARATUS - A charged particle beam apparatus is provided which has high resolving power and a wide scanning region (observation field of view). The apparatus has a unit for adjusting the focus, a unit for adjusting astigmatism, a unit for controlling and detecting scanning positions and a controller operative to control the focus adjustment and astigmatism adjustment at a time in interlocked relation to the scanning positions, thereby assuring compatibility between the high resolving power and the observation view field of a wide area. | 03-04-2010 |
20110303843 | SAMPLE OBSERVING METHOD AND SCANNING ELECTRON MICROSCOPE - Provided is a sample observing method wherein the effect on throughput is minimized, and a pattern profile can be obtained at high accuracy even in a complicated LSI pattern, regardless of the scanning direction of an electron beam. In the sample observing method, the presence or absence of an edge parallel to a scanning direction ( | 12-15-2011 |
20120153145 | SCANNING ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD - A scanning electron microscope of the present invention performs scanning by changing a scanning line density in accordance with a sample when an image of a scanned region is formed by scanning a two-dimensional region on the sample with an electron beam or is provided with a GUI having sample information input means which inputs information relating to the sample and display means which displays a recommended scanning condition according to the input and performs scanning with a scanning line density according to the sample by selecting the recommended scanning condition. As a result, in observation using a scanning electron microscope, a suitable scanning device which can improve contrast of a profile of a two-dimensional pattern and suppress shading by suppressing the influence of charging caused by primary charged particle radiation and by improving a detection rate of secondary electrons and a scanning method are provided. | 06-21-2012 |
20140027635 | CHARGED PARTICLE BEAM APPARATUS - Provided is a charged particle beam apparatus adapted so that even when an additional device is not mounted in the charged particle beam apparatus, the apparatus rapidly removes, by neutralizing, a local charge developed on a region of a sample that has been irradiated with a charged particle beam. | 01-30-2014 |
20150036914 | METHOD FOR ESTIMATING SHAPE BEFORE SHRINK AND CD-SEM APPARATUS - In the present invention, at the time of measuring, using a CD-SEM, a length of a resist that shrinks when irradiated with an electron beam, in order to highly accurately estimate a shape and dimensions of the resist before shrink, a shrink database with respect to various patterns is previously prepared, said shrink database containing cross-sectional shape data obtained prior to electron beam irradiation, a cross-sectional shape data group and a CD-SEM image data group, which are obtained under various electron beam irradiation conditions, and models based on such data and data groups, and a CD-SEM image of a resist pattern to be measured is obtained (S | 02-05-2015 |
20150248944 | ABERRATION CORRECTOR AND CHARGED PARTICLE BEAM APPARATUS USING THE SAME - Provided are an aberration corrector that reduces irregularity of a magnetic field of a multipole to obtain an image of high resolution and a charged particle beam apparatus using the same. The aberration corrector includes a plurality of magnetic field type poles, a ring that magnetically connects the plurality of poles with one another and an adjustment member disposed between the pole and the ring to adjust a spacing between the pole and the ring per pole. | 09-03-2015 |