Patent application number | Description | Published |
20080278151 | SYSTEM AND METHODS FOR INSPECTING INTERNAL CRACKS - A method for inspecting an internal cavity in a part is provided. The method includes inserting a probe into the internal cavity. The method also includes controlling movement of the probe using a defined scan path to scan the probe over a region of interest in the internal cavity. The method also includes applying multiple multifrequency excitation signals to the probe to generate a number of multifrequency response signals. The multifrequency excitation signals are applied at multiple positions within the internal cavity. The method further includes performing a multifrequency phase analysis on the multifrequency response signals to inspect the internal cavity. | 11-13-2008 |
20090072822 | SYSTEM AND METHOD FOR INSPECTION OF PARTS - An inspection system for detecting a flaw in a part is provided. The inspection system includes a generally C-shaped core having an opening for receiving the part. The system also includes a driver coil wrapped around the core for creating a magnetic field in the opening. The system further includes at least one single element or multiple element eddy current sensor disposed in the opening. | 03-19-2009 |
20090115410 | EDDY CURRENT PROBE AND METHODS OF ASSEMBLING THE SAME - A method of assembling an eddy current array probe to facilitate nondestructive testing of a sample is provided. The method includes positioning a plurality of differential side mount coils at least partially within a flexible material. The method also includes coupling the flexible material within a tip portion of the eddy current array probe, such that the flexible material has a contour that substantially conforms to a portion of a surface of the sample to be tested. | 05-07-2009 |
20090115411 | FLEXIBLE EDDY CURRENT ARRAY PROBE AND METHODS OF ASSEMBLING THE SAME - A method of assembling an eddy current probe for use in nondestructive testing of a sample is described. The method includes positioning at least one substantially planar spiral drive coil within the eddy current probe, such that the drive coil is at least one of adjacent to and at least partially within a flexible material. The method further includes coupling at least one unpackaged solid-state magnetic field sensor to the at least one drive coil. | 05-07-2009 |
20100085045 | Omnidirectional Eddy Current Array Probes and Methods of Use - Omnidirectional eddy current array probes for detecting flaws in a conductive test object generally includes semi-circular wave shaped continuous drive lines in two rows disposed in two layers that are multiplexed for omnidirectional inspection without blind spots. The semicircular wave shaped continuous drive lines are superimposed to form pseudo-circular drive lines, wherein each row of drive lines is offset laterally by a distance preferably equal to a quarter wavelength of the wave pattern. For only parallel and perpendicular flaws, the drive multiplexing is not needed and each row will have only one set of drive lines. In alternate embodiments, there can be square-shaped, oval shaped, rectangular-shaped or other shaped wave patterns as well. Also disclosed are methods for sensing surface flaws and compensating their response. | 04-08-2010 |
20100127699 | SYSTEM AND METHOD FOR INSPECTION OF PARTS WITH COMPLEX GEOMETRIES - An inspection system for inspecting a part is provided. The inspection system includes a multi-dimensional array of eddy current sensors that conforms to a contour of a three dimensional shape of the part. The inspection system also includes a controller coupled to the multi-dimensional array, wherein the controller is configured to electronically scan the part via an electrical connection of the eddy current sensors to an eddy current instrument. The inspection system further includes a processor coupled to the eddy current instrument, wherein the processor is configured to analyze output from the eddy current instrument and the controller to accomplish inspection of the part. | 05-27-2010 |
20100207619 | METHOD AND SYSTEM FOR INTEGRATING EDDY CURRENT INSPECTION WITH A COORDINATE MEASURING DEVICE - A method for integrating a measurement device for use in measuring a machine component includes providing a coordinate measuring machine (CMM) and combining eddy current (EC) capabilities and CMM capabilities to form an inspection probe. The method further includes installing the inspection probe on the CMM so that the inspection probe measures external boundaries of the machine component with the CMM capabilities and substantially simultaneously measures at least one of internal boundaries, internal defects, surface defects, and material properties of the machine component with the EC capabilities, which are directly linked to actual component dimensional information provided by CMM. The inspection data can be simultaneously linked to and/or displayed with a CAD model to enable a direct comparison between the inspection data and the nominal requirements specified on the CAD model. | 08-19-2010 |
20100321012 | DRIVE COIL, MEASUREMENT PROBE COMPRISING THE DRIVE COIL AND METHODS UTILIZING THE MEASUREMENT PROBE - The invention provides a drive coil and measurement probe comprising the drive coil. The measurement probes can be used, for example, in in-situ, non-destructive testing methods, also provided herein. | 12-23-2010 |
20110068784 | EDDY CURRENT INSPECTION SYSTEM AND METHOD - A multi-frequency eddy current (MFEC) inspection system is provided for inspection of case hardening depth on a part. The MFEC inspection system comprises a generator configured to generate one or more multi-frequency excitation signals and an eddy current probe configured to be disposed at one side of the part. The eddy current probe comprises one or more drivers and one or more pickup sensors. The one or more drivers are configured to receive the one or more multi-frequency excitation signals to induce eddy currents in the part. The one or more pickup sensors are configured to detect the induced eddy currents within a local area of the part to generate one or more multi-frequency response signals. The MFEC system further comprises a processor configured to receive the one or more multi-frequency response signals for processing to determine a case hardening depth of the local area of the part. A pulse eddy current inspection system and an eddy current inspection method are also presented. | 03-24-2011 |
20110215799 | MAGNETIC INSPECTION SYSTEMS FOR INSPECTION OF TARGET OBJECTS - Inspection systems provided herein may include a drive coil capable of being excited to generate a substantially uniform magnetic field about an object. The object includes a ferromagnetic adhesive adhered thereto. The inspection systems may also include an array of sensor coils adapted to detect the magnetic field from the drive coil after the magnetic field interacts with the ferromagnetic adhesive and to produce a voltage output corresponding to the detected magnetic field. | 09-08-2011 |
20120043962 | METHOD AND APPARATUS FOR EDDY CURRENT INSPECTION OF CASE-HARDENDED METAL COMPONENTS - A method for determining a case depth of a hardened layer in a surface of a metal object includes: (a) placing an eddy current probe at a location adjacent the surface; (b) using the eddy current probe, generating a time-varying eddy current in the object; (c) using the eddy current probe, outputting a measured eddy current and providing a signal representative of the measured eddy current to a computer; (d) using the computer, comparing the time-varying measured eddy current to a correlation of measured eddy currents to known case depths; and (e) determining the case depth at the location of the probe based on the correlation. | 02-23-2012 |
20130106409 | EDDY CURRENT ARRAY PROBE | 05-02-2013 |