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Cesky
Michael D. Cesky, Rochester, MN US
| Patent application number | Description | Published |
|---|---|---|
| 20090077518 | DERIVED LEVEL RECOGNITION IN A LAYOUT EDITOR - A computer program product stored on machine readable media includes machine executable instructions for displaying a layout of a circuit design, the product including instructions for: over a plurality of layers within a design, identifying at least one of a derived level and a device defined within the plurality; and displaying the at least one derived level and device to a user. | 03-19-2009 |
| 20090125860 | Auto-Routing Small Jog Eliminator - In a method of routing a wire to a shape in an integrated circuit for minimizing undesirable jog creation during a masking process, a plurality of possible placements of the wire relative to a selected edge of the shape resulting in the wire being connected to the shape are determined. A cost is assigned to each placement, the cost indicating an amount of jog that would be created in the masking process corresponding to the placement, wherein a greater cost indicates that a greater jog would be created in the masking process than would be created by a placement assigned a lesser cost. A placement having a lowest cost of the plurality of possible placements is selected. | 05-14-2009 |
Michael David Cesky, Rochester, MN US
| Patent application number | Description | Published |
|---|---|---|
| 20080204154 | Method and Enhanced Phase Locked Loop Circuits for Implementing Effective Testing - A method and enhanced phase-locked loop (PLL) circuit enable effective testing of the PLL. A phase frequency detector generates a differential signal, receiving a reference signal and a feedback signal of an output signal of the PLL circuit. A charge pump is coupled to the phase frequency detector receiving the differential signal. The charge pump applies either negative or positive charge pulses to a low-pass filter, which generates a tuning voltage input applied to a voltage controlled oscillator. A first divider is coupled to the voltage controlled oscillator receives and divides down the VCO output signal, providing the output signal of the PLL circuit. A second divider receives the output signal of the PLL circuit and provides the feedback signal to the phase frequency detector. The output signal of PLL circuit is applied to a clock distribution. | 08-28-2008 |
| 20080208541 | Method and Enhanced Phase Locked Loop Circuits for Implementing Effective Testing - A method and enhanced phase-locked loop (PLL) circuit enable effective testing of the PLL, and a design structure on which the subject circuit resides is provided. A phase frequency detector generates a differential signal, receiving a reference signal and a feedback signal of an output signal of the PLL circuit. A charge pump is coupled to the phase frequency detector receiving the differential signal. The charge pump applies either negative or positive charge pulses to a low-pass filter, which generates a tuning voltage input applied to a voltage controlled oscillator. A first divider is coupled to the voltage controlled oscillator receives and divides down the VCO output signal, providing the output signal of the PLL circuit. A second divider receives the output signal of the PLL circuit and provides the feedback signal to the phase frequency detector. The output signal of PLL circuit is applied to a clock distribution. | 08-28-2008 |
Sharon H. Cesky, Rochester, MN US
| Patent application number | Description | Published |
|---|---|---|
| 20100195408 | Non-Body Contacted Sense Amplifier with Negligible History Effect - In a method of mitigating hysteresis effect in a sense amplifier circuit, a data value is sensed from a data source with the sense amplifier during a first period. The data value is stored in a latch. The data valued stored in the latch is inverted, thereby generating an inverted data value. The data source is isolated from the sense amplifier and the inverted data value is read with the sense amplifier during a second period immediately following the first period. | 08-05-2010 |
Sharon Huertas Cesky, Rochester, MN US
| Patent application number | Description | Published |
|---|---|---|
| 20090285039 | METHOD AND APPARATUS FOR LOCALLY GENERATING A VIRTUAL GROUND FOR WRITE ASSIST ON COLUMN SELECTED SRAM CELLS - A method and apparatus for write assist for a static random access memory (SRAM) array, is provided, which increases the write ability of the SRAM cell by locally raising the source voltage. One embodiment involves locally generating a virtual ground for write assist on column selected SRAM cells, including locally raising the source voltage to increase the write ability of the SRAM cell; wherein locally raising the source voltage comprises locally generating a virtual source/ground node for boosting the write ability of a column of SRAM cells without using an additional on-chip or off-chip supply; thereby decreasing the voltage differential across the source and supply of the column of SRAM cells during a write, and restoring the standard chip differential during a read. | 11-19-2009 |
| 20090287971 | METHOD AND APPARATUS FOR TESTING A RANDOM ACCESS MEMORY DEVICE - A method and apparatus for testing a random access memory device is provided. One embodiment involves providing an interface between Logic Built in Self Test (LBIST) and Array Built in Self Test (ABIST) paths for memory testing, including providing a cross-coupled NAND device with an LBIST test path; configuring the cross-coupled NAND device for interfacing ABIST and LBIST paths by modeling a worst case scenario for timing from a domino read static random access memory (SRAM) array; and modifying data in the cross-coupled NAND device using an LBIST controlled data path at essentially the latest point in time when a read may propagate from the array to provide full AC test coverage of down stream logic. | 11-19-2009 |