Patent application number | Description | Published |
20110126082 | MICRO CONTROLLER UNIT INCLUDING AN ERROR INDICATOR MODULE - A micro controller unit including an error indicator hardware module, the error indicator module being arranged to respond to event signals representative of internal and external fault and error events perturbing the micro controller unit function by registering in non-volatile memory a record of the nature of each of the events, wherein the record of the events is inaccessible to alteration. | 05-26-2011 |
20110145625 | MULTI-CORE CLOCKING SYSTEM WITH INTERLOCKED 'ANTI-FREEZE' MECHANISM - A clocking system, comprises a plurality of clocked data processing devices and a clock control circuit controlling a generation of a plurality of clock signals and an application of the clock signals to the plurality of data processing devices, allowing to clock at least one of the data processing devices while freezing all but the at least one of the data processing devices. A method for clocking a plurality of clocked data processing devices comprises controlling a generation of a plurality of clock signals and controlling an application of the clock signals to the plurality of data processing devices, allowing to clock at least one of the data processing devices while freezing all but the at least one of the data processing devices. | 06-16-2011 |
20130229737 | INTEGRATED CIRCUIT DEVICE AND METHOD FOR DETECTING AN EXCESSIVE VOLTAGE STATE - An integrated circuit device comprising at least one analogue to digital converter. The at least one ADC comprises at least one input operably coupled to at least one external contact of the integrated circuit device. The integrated circuit device further comprises detection circuitry comprising at least one detection module. The at least one detection module being arranged to receive at a first input thereof an indication of a voltage level at the at least one input of the at least one ADC, compare the received indication to a threshold value, and if the received indication exceeds the threshold value, output an indication that an excessive voltage state at the at least one input of the at least one ADC has been detected. | 09-05-2013 |
20140298005 | MICROPROCESSOR DEVICE, AND METHOD OF MANAGING RESET EVENTS THEREFOR - A microprocessor device comprises at least one reset management module. The at least one reset management module is arranged to detect a reset event comprising a first reset level, determine if at least one reset condition has been met upon detection of the reset event comprising the first reset level, and cause a reset of a second reset level upon determining that the at least one reset condition has been met. | 10-02-2014 |
20140317395 | MICROPROCESSOR, AND METHOD OF MANAGING RESET EVENTS THEREFOR - A microprocessor comprises at least one reset management module. The at least one reset management module is arranged to detect a reset event, determine if at least one reset condition has been met upon detection of the reset event, and cause at least a part of the microprocessor to remain in a reset state upon determining that the at least one reset condition has been met. | 10-23-2014 |
20150137841 | BUILT-IN SELF TEST SYSTEM, SYSTEM ON A CHIP AND METHOD FOR CONTROLLING BUILT-IN SELF TESTS - A built-in self test system comprises an integrated circuit device comprising a plurality of functional units coupled to built-in self test circuitry; a low power control unit operable to switch the integrated circuit device into a low power mode and to generate a BIST wake-up signal during or before entering the low power mode; and a built-in self test control unit coupled to the built-in self test circuitry and the low power control unit and arranged to initiate a built-in self test when receiving the BIST wake-up signal. | 05-21-2015 |
20150211470 | COLD-CRANK EVENT MANAGEMENT - Systems and methods for managing cold-crank events. In an embodiment, a method may include detecting a cold-crank event and setting a switching circuit to a non-conductive state, where the switching circuit is configured to couple a first regulator to a memory circuit such that setting the switching circuit to the non-conductive state de-couples the memory circuit from the first regulator. The method may also include setting the switching circuit to a conductive state in current limitation mode during a recovery period following the cold-crank event to re-couple the memory circuit to the first regulator. In another embodiment, an electronic device include a switching circuit, a first regulator coupled to a first terminal of the switching circuit, a second regulator coupled to a second terminal of the switching circuit, a logic circuit coupled to the switching circuit, and a memory circuit coupled to the second terminal of the switching circuit. | 07-30-2015 |
20150293829 | METHOD AND APPARATUS FOR MONITORING GENERAL PURPOSE INPUT OUTPUT, GPIO, SIGNALS - An apparatus and method for monitoring general purpose input output, GPIO, signals at GPIO pins of a GPIO port of a system on chip, SoC. The apparatus comprises a first checksum generation unit adapted to generate a first checksum on the basis of GPIO bits stored in GPIO registers of the SoC, being connected via corresponding input output, IO, pad circuits to provide analog GPIO signals at the GPIO pins. A second checksum generation unit is adapted to generate a second checksum on the basis of the analog GPIO signals at the GPIO pins representing the GPIO bits. Checker logic is adapted to compare the first checksum generated by the first checksum generation unit with a second checksum generated by the second checksum generation unit. | 10-15-2015 |