| Patent application number | Description | Published |
|---|
| 20090242763 | Environmental Cell for a Particle-Optical Apparatus - The invention relates to an environmental cell for use in e.g. an electron microscope. The environmental cell shows an aperture ( | 10-01-2009 |
| 20100171037 | COMPACT SCANNING ELECTRON MICROSCOPE - A compact electron microscope uses a removable sample holder having walls that form a part of the vacuum region in which the sample resides. By using the removable sample holder to contain the vacuum, the volume of air requiring evacuation before imaging is greatly reduced and the microscope can be evacuated rapidly. In a preferred embodiment, a sliding vacuum seal allows the sample holder to be positioned under the electron column, and the sample holder is first passed under a vacuum buffer to remove air in the sample holder. | 07-08-2010 |
| 20100194874 | User Interface for an Electron Microscope - A user interface for operation of a scanning electron microscope device that combines lower magnification reference images and higher magnification images on the same screen to make it easier for a user who is not used to the high magnification of electron microscopes to readily determine where on the sample an image is being obtained and to understand the relationship between that image and the rest of the sample. Additionally, other screens, such as, for example, an archive screen and a settings screen allow the user to compare saved images and adjust the settings of the system, respectively. | 08-05-2010 |
| 20100230590 | Compact Scanning Electron Microscope - A compact electron microscope is robust, simple to operate, and preferably requires no special utilities. Imaging can begin shortly after a sample is inserted. A preferred simplified design includes permanent magnets for focusing, lack a vacuum controller and vacuum gauge, and uses a backscattered electron detector and no secondary electron detector. | 09-16-2010 |
| 20110133083 | COMPACT SCANNING ELECTRON MICROSCOPE - A compact electron microscope uses a removable sample holder having walls that form a part of the vacuum region in which the sample resides. By using the removable sample holder to contain the vacuum, the volume of air requiring evacuation before imaging is greatly reduced and the microscope can be evacuated rapidly. In a preferred embodiment, a sliding vacuum seal allows the sample holder to be positioned under the electron column, and the sample holder is first passed under a vacuum buffer to remove air in the sample holder. | 06-09-2011 |
