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Bronk
Brian Scott Bronk, East Lyme, CT US
| Patent application number | Description | Published |
|---|---|---|
| 20110251379 | COMPOUNDS USEFUL FOR TREATING NEURODEGENERATIVE DISORDERS - As described herein, the present invention provides compounds useful for treating or lessening the severity of a neurodegenerative disorder. The present invention also provides methods of treating or lessening the severity of such disorders wherein said method comprises administering to a patient a compound of the present invention, or composition thereof. Said method is useful for treating or lessening the severity of, for example, Alzheimer's disease. | 10-13-2011 |
Burt V. Bronk, Abington, MD US
| Patent application number | Description | Published |
|---|---|---|
| 20090033938 | Process and apparatus for measurements of Mueller matrix parameters of polarized light scattering - A method and apparatus for measuring Mueller matrix parameters from scattered light. The apparatus is advantageous for use in countering bioterrorism by detecting information concerning airborne pathogens, particularly microorganism in aerosol form. The system provided is portable, more efficient, and less sensitive to wavelength changes. The method uses variation in retardation over wavelength as opposed to variation in retardation with time. | 02-05-2009 |
Kelly J. Bronk, Kewaskum, WI US
William T. Bronk, Shelburne, VT US
| Patent application number | Description | Published |
|---|---|---|
| 20090058450 | METHOD OF AND SYSTEM FOR FUNCTIONALLY TESTING MULTIPLE DEVICES IN PARALLEL IN A BURN-IN-ENVIRONMENT - A method of and a system for testing semiconductor devices heat a plurality of devices to a burn-in temperature, and perform functional tests in parallel on the plurality of devices at the burn-in temperature. Systems include a burn-in oven and a test multiplexer. The burn-in oven is adapted to receive and heat the devices to the burn-in temperature. The test multiplexer is adapted to apply functional test signals to and receive output signals from the devices in the burn-in oven. | 03-05-2009 |