Patent application number | Description | Published |
20100037020 | PIPELINED MEMORY ACCESS METHOD AND ARCHITECTURE THEREFORE - A memory array and a method for accessing a memory array including: receiving an address from a host related to relevant data; accessing a first module based on the address received from the host, wherein accessing the first module includes: decoding the address for the first module; enabling a wordline based on the decoded address for the first module and sensing the contents of one or more bits at the decoded address for the first module; and outputting information regarding the first module; and accessing a second module based on the address received from the host, wherein accessing the second module includes: decoding the address for the second module; enabling a wordline based on the decoded address for the second module and sensing the contents of one or more bits at the decoded address for the second module; and outputting information regarding the second module, wherein the step of decoding the address for the second module occurs while the step of enabling a wordline based on the decoded address for the first module and sensing the contents of one or more bits at the decoded address for the first module occurs. | 02-11-2010 |
20100084724 | MEMORY CELL WITH STRESS-INDUCED ANISOTROPY - A magnetic memory element that has a stress-induced magnetic anisotropy. The memory element has a ferromagnetic free layer having a switchable magnetization orientation switchable, a ferromagnetic reference layer having a pinned magnetization orientation, and a non-magnetic spacer layer therebetween. The free layer may be circular, essentially circular or nearly circular. | 04-08-2010 |
20100110756 | VARIABLE RESISTIVE MEMORY PUNCHTHROUGH ACCESS METHOD - Variable resistive punchthrough access methods are described. The methods include switching a variable resistive data cell from a high resistance state to a low resistance state by passing a write current through the magnetic tunnel junction data cell in a first direction. The write current is provided by a transistor being electrically coupled to the variable resistive data cell and a source line. The write current passes through the transistor in punchthrough mode. | 05-06-2010 |
20100302849 | NAND FLASH MEMORY WITH INTEGRATED BIT LINE CAPACITANCE - Method and apparatus for outputting data from a memory array having a plurality of non-volatile memory cells arranged into rows and columns. In accordance with various embodiments, charge is stored in a volatile memory cell connected to the memory array, and the stored charge is subsequently discharged from the volatile memory cell through a selected column. In some embodiments, the volatile memory cell is a dynamic random access memory (DRAM) cell from a row of said cells with each DRAM cell along the row coupled to a respective column in the memory array, and each column of non-volatile memory cells comprises Flash memory cells connected in a NAND configuration. | 12-02-2010 |
20110026307 | VARIABLE RESISTIVE MEMORY PUNCHTHROUGH ACCESS METHOD - Variable resistive punchthrough access methods are described. The methods include switching a variable resistive data cell from a high resistance state to a low resistance state by passing a write current through the magnetic tunnel junction data cell in a first direction. The write current is provided by a transistor being electrically coupled to the variable resistive data cell and a source line. The write current passes through the transistor in punchthrough mode. | 02-03-2011 |
20110058404 | VARIABLE RESISTIVE MEMORY PUNCHTHROUGH ACCESS METHOD - Variable resistive punchthrough access methods are described. The methods include switching a variable resistive data cell from a high resistance state to a low resistance state by passing a write current through the magnetic tunnel junction data cell in a first direction. The write current is provided by a transistor being electrically coupled to the variable resistive data cell and a source line. The write current passes through the transistor in punchthrough mode. | 03-10-2011 |
20110156115 | APPARATUS FOR VARIABLE RESISTIVE MEMORY PUNCHTHROUGH ACCESS METHOD - Variable resistive punchthrough access methods are described. The methods include switching a variable resistive data cell from a high resistance state to a low resistance state by passing a write current through the magnetic tunnel junction data cell in a first direction. The write current is provided by a transistor being electrically coupled to the variable resistive data cell and a source line. The write current passes through the transistor in punchthrough mode. | 06-30-2011 |
20120230084 | APPARATUS FOR VARIABLE RESISTIVE MEMORY PUNCHTHROUGH ACCESS METHOD - Variable resistive punchthrough access methods are described. The methods include switching a variable resistive data cell from a high resistance state to a low resistance state by passing a write current through the magnetic tunnel junction data cell in a first direction. The write current is provided by a transistor being electrically coupled to the variable resistive data cell and a source line. The write current passes through the transistor in punchthrough mode. | 09-13-2012 |