| Patent application number | Description | Published |
|---|
| 20080250283 | POWER SAVING FLIP-FLOP - A scannable flip-flop and method are provided. The flip-flop includes a clock input, a normal data input, a test data input, a normal data output and a scan data output. The flip-flop has a normal operating mode during which the normal data output is enabled and the scan data output disabled and has a scan-shift mode during which the normal data output is disabled and the scan data output is enabled. | 10-09-2008 |
| 20080258700 | METHOD AND APPARATUS FOR ADJUSTING ON-CHIP DELAY WITH POWER SUPPLY CONTROL - An apparatus and method are provided for powering an integrated circuit chip with a supply voltage generated externally to the chip. An on-chip clock signal is generated with a ring oscillator fabricated on the integrated circuit chip. The supply voltage is altered as a function of a difference between a frequency of the on-chip clock signal and a reference clock frequency. | 10-23-2008 |
| 20090051006 | N CELL HEIGHT DECOUPLING CIRCUIT - A decoupling circuit disposed between a first rail and a second rail, where a third power rail is disposed between the first and second rails. A resistor having a first electrode and a second electrode is disposed between the first and second rails. Two capacitors are disposed between the first and second rails. The resistor is connected to the third rail and the two capacitors. In this manner, the two capacitors are connected in series with respect to the resistor, and in parallel with respect to one another. A first of the two capacitors is connected to the first rail, and a second of the two capacitors is connected to the second rail. At least one of the resistor and the two capacitors is disposed at least in part beneath the third rail. | 02-26-2009 |
| 20090134912 | ADJUSTABLE HOLD FLIP FLOP AND METHOD FOR ADJUSTING HOLD REQUIREMENTS - A method and apparatus are provided for storing a value in a process register of an electrical circuit, which indicates a strength of a process in which the circuit was fabricated, and adjusting an input delay applied to data signals received by a synchronous storage element of the electrical circuit based on the stored value. | 05-28-2009 |
| 20110063926 | Write Through Speed Up for Memory Circuit - A method of performing a write-through operation with a memory circuit having a write enable line, a write address line, a data in line, a read address line, a data out line, a bit array, a comparator, and a mux. A write address is received on the write address line, a read address is received on the read address line, data is received on the data in line. The comparator determines as a first condition whether the write address is identical to the read address, and determines as a second condition whether the write enable line is enabled. When both the first condition and the second condition are met, the comparator signals the mux to directly output the data receiving on the data in line on the data out line without writing the data to the bit array. In this manner, the memory circuit checks to determine whether a write-through operation is called for. If it is, then the mux sends the data on the data in line directly to the data out line, instead of retrieving data from the bit array of the memory, such as through the read decoder, which would take much longer. | 03-17-2011 |
| 20110066905 | Test Pin Gating for Dynamic Optimization - An improvement to an integrated circuit of a type having a test enable line for enabling an electrical test of the integrated circuit only when the test enable line is at a logical high value, and output lines that are only used during the electrical test of the integrated circuit, where the improvement is a switch circuit for disabling a state change in the output lines when the test enable line is at a logical low value. In this manner, the output lines do not switch during functional use of the integrated circuit, and cannot be aggressors on the data signals that are carried by the data lines that are used during the functional use of the integrated circuit. In addition, these non-switching output lines can act as guard traces that run between the data lines, further electrically isolating the data lines from one another. Further, because they do not switch during functional use of the integrated circuit, the overall power consumption of the integrated circuit is reduced. | 03-17-2011 |
| 20110084726 | ADJUSTABLE HOLD FLIP FLOP AND METHOD FOR ADJUSTING HOLD REQUIREMENTS - A method and apparatus are provided for storing a value in a process register of an electrical circuit, which indicates a strength of a process in which the circuit was fabricated, and adjusting an input delay applied to data signals received by a synchronous storage element of the electrical circuit based on the stored value. | 04-14-2011 |
