Bleloch
Andrew Bleloch, Chorley GB
Patent application number | Description | Published |
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20110192976 | ABERRATION-CORRECTING DARK-FIELD ELECTRON MICROSCOPY - A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. An aberration corrector corrects the electron beam for at least a spherical aberration. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope operates in a dark-field mode in which a zero beam of the electron beam is not detected. The microscope may also be capable of operating in an incoherent illumination mode. | 08-11-2011 |
20130043387 | ABERRATION-CORRECTING DARK-FIELD ELECTRON MICROSCOPY - A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. An aberration corrector comprising either a foil or a set of concentric elements corrects the electron beam for at least a spherical aberration. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope may be configured to operate in a dark-field mode in which a zero beam of the electron beam is not detected. The microscope may also be capable of operating in an incoherent illumination mode. | 02-21-2013 |
20130146764 | INCOHERENT TRANSMISSION ELECTRON MICROSCOPY - A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. An aberration corrector corrects the electron beam for at least a spherical aberration. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope may operate in an incoherent mode and may be used to locate a sequence of objects on a molecule. | 06-13-2013 |
Andrew Bleloch, Brinscall GB
Patent application number | Description | Published |
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20110233403 | INCOHERENT TRANSMISSION ELECTRON MICROSCOPY - A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. An aberration corrector corrects the electron beam for at least a spherical aberration. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope may operate in an incoherent mode and may be used to locate a sequence of objects on a molecule. | 09-29-2011 |
20140284475 | INCOHERENT TRANSMISSION ELECTRON MICROSCOPY - A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope may be adapted to generate two or more images that are substantially incoherently related to one another, store the images, and combine amplitude signals at corresponding pixels of the respective images to improve a signal-to-noise ratio. Alternatively or in addition, the transmission electron microscope may be adapted to operate the specimen holder to move the specimen in relation to the beam optics during exposure or between exposures to operate the transmission electron microscope in an incoherent mode. | 09-25-2014 |
Andrew L. Bleloch, Redwood City, CA US
Patent application number | Description | Published |
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20150320116 | VAPORIZER DEVICE - A vaporizer device includes a cartridge configured to hold a vaporizable substance, a wick element coupled to the cartridge, where the wick element is configured to contact the vaporizable substance located in the cartridge and an induction heating element inductively coupled to the wick element, where the wick element is configured to heat the vaporizable substance based on induction heating of the wick element by the induction heating element. | 11-12-2015 |