Patent application number | Description | Published |
20110240853 | ION SOURCES, SYSTEMS AND METHODS - Ion sources, systems and methods are disclosed. In some embodiments, the ion sources, systems and methods can exhibit relatively little undesired vibration and/or can sufficiently dampen undesired vibration. This can enhance performance (e.g., increase reliability, stability and the like). In certain embodiments, the ion sources, systems and methods can enhance the ability to make tips having desired physical attributes (e.g., the number of atoms on the apex of the tip). This can enhance performance (e.g., increase reliability, stability and the like). | 10-06-2011 |
20120057015 | SCAN METHOD - In general, in one aspect, the disclosure features a method and system for imaging of samples, for example, imaging samples with charged particles. | 03-08-2012 |
20120141693 | ION SOURCES, SYSTEMS AND METHODS - Ion sources, systems and methods are disclosed. | 06-07-2012 |
20120145896 | GAS DELIVERY IN A MICROSCOPE SYSTEM - Disclosed are systems and methods for applying a voltage gradient to a gas delivery system, delivering a gas through a length of the gas delivery system having the voltage gradient, the gas having a pressure-distance product of less than about 1×010 | 06-14-2012 |
20120241640 | ION SOURCES, SYSTEMS AND METHODS - Ion sources, systems and methods are disclosed. In some embodiments, the ion sources, systems and methods can exhibit relatively little undesired vibration and/or can sufficiently dampen undesired vibration. This can enhance performance (e.g., increase reliability, stability and the like). | 09-27-2012 |
20130256532 | ION SOURCES, SYSTEMS AND METHODS - Ion sources, systems and methods are disclosed. In some embodiments, the ion sources, systems and methods can exhibit relatively little undesired vibration and/or can sufficiently dampen undesired vibration. This can enhance performance (e.g., increase reliability, stability and the like). In certain embodiments, the ion sources, systems and methods can enhance the ability to make tips having desired physical attributes (e.g., the number of atoms on the apex of the tip). This can enhance performance (e.g., increase reliability, stability and the like). | 10-03-2013 |
20140306121 | ION SOURCES, SYSTEMS AND METHODS - Ion sources, systems and methods are disclosed. | 10-16-2014 |
20150213997 | ION SOURCES, SYSTEMS AND METHODS - Ion sources, systems and methods are disclosed. | 07-30-2015 |