Patent application number | Description | Published |
20080246550 | Selective envelope modulation enabling reduced current consumption - A modulation system includes an amplitude modulation path and a phase modulation path coupled to the amplitude modulation path. One of the amplitude modulation path and the phase modulation path receive a reduced current such that the reduced current reduces power consumption by the system. Preferably, the amplitude modulation path receives the reduced current. The amplitude modulation path has a first set of components and a second set of components. The first set of components consumes less power by using slower operation. The second set of components consumes less power by effectively not operating, or being turned off. | 10-09-2008 |
20090257526 | METHODS AND APPARATUS FOR CONDITIONING COMMUNICATIONS SIGNALS BASED ON DETECTION OF HIGH-FREQUENCY EVENTS IN POLAR DOMAIN - Methods and apparatus for conditioning communications signals based on detection of high-frequency in the polar domain. High-frequency events detected in a phase-difference component of a complex baseband signal in the polar domain are detected and used as a basis for performing hole-blowing on the complex baseband signal in the quadrature domain and/or nonlinear filtering either or both the magnitude and phase-difference components in the polar domain. Alternatively, high-frequency events detected in the phase-difference signal that correlate in time with low-magnitude events detected in a magnitude component of the complex baseband signal are used as a basis for performing hole-blowing on the complex baseband signal in the quadrature domain and/or nonlinear filtering either or both the magnitude and phase-difference components in the polar domain. | 10-15-2009 |
20120100813 | SYSTEM FOR TESTING MULTI-ANTENNA DEVICES USING BIDIRECTIONAL FADED CHANNELS - A test system for testing multiple-input and multiple-output (MIMO) systems is provided. The test system may convey radio-frequency (RF) signals bidirectionally between a device under test (DUT) and at least one base station. The DUT may be placed within a test chamber during testing. An antenna mounting structure may surround the DUT. Multiple antennas may be mounted on the antenna mounting structure to transmit and receive RF signals to and from the DUT. A first group of dual-polarized antennas may be coupled to the base station through downlink circuitry. A second group of dual-polarized antennas may be coupled to the base station through uplink circuitry. The uplink and downlink circuitry may each include a splitter/combiner, channel emulators, amplifier circuits, and switch circuitry. The channel emulators and amplifier circuits may be configured to provide desired path loss, spatial interference, and channel characteristics to model real-world wireless network transmission. | 04-26-2012 |
20130234741 | Methods for Characterizing Tunable Radio-Frequency Elements - A wireless electronic device may contain at least one antenna tuning element for use in tuning the operating frequency range of the device. The antenna tuning element may include radio-frequency switches, continuously/semi-continuously adjustable components such as tunable resistors, inductors, and capacitors, and other load circuits that provide desired impedance characteristics. A test station may be used to measure the radio-frequency characteristics associated with the tuning element. The test station may provide adjustable temperature, power, and impedance control to help emulate a true application environment for the tuning element without having to place the tuning element within an actual device during testing. The test system may include at least one signal generator and a tester for measuring harmonic distortion values and may include at least two signal generators and a tester for measuring intermodulation distortion values. During testing, the antenna tuning element may be placed in a series or shunt configuration. | 09-12-2013 |
20130257454 | Methods for Characterizing Tunable Radio-Frequency Elements in Wireless Electronic Devices - A wireless electronic device may contain an antenna tuning element for tuning the device's operating frequency range. The antenna tuning element may include radio-frequency switches, continuously/semi-continuously adjustable components such as tunable resistors, inductors, and capacitors, etc. A test system may be used to measure the radio-frequency characteristics associated with the tuning element assembled with an electronic device. The test system may include a test host, a test chamber, a signal generator, power meters, and radio-frequency testers. The electronic device under test (DUT) may be placed in the test chamber. The signal generator may generate radio-frequency test signals for energizing the antenna tuning element. The power meters and radio-frequency testers may be used to measure conducted and radiated signals emitted from the DUT while the DUT is placed in different desired orientations. A phantom object is optionally placed in the vicinity of the DUT to simulate actual user scenario. | 10-03-2013 |
20130328582 | Methods and Apparatus for Performing Wafer-Level Testing on Antenna Tuning Elements - A test system for testing an antenna tuning element is provided. The test system may include a tester, a test fixture, and a probing structure. The probing structure may include probe tips configured to mate with corresponding solder bumps formed on a device under test (DUT) containing an antenna tuning element. The DUT may be tested in a shunt or series configuration. The tester may be electrically coupled to the test probe via first and second connectors on the test fixture. An adjustable load circuit that is coupled to the second connector may be configured in a selected state so that a desired amount of electrical stress may be presented to the DUT during testing. The tester may be used to obtain measurement results on the DUT. Systematic effects associated with the test structures may be de-embedded from the measured results to obtain calibrated results. | 12-12-2013 |
20140087668 | Methods and Apparatus for Performing Coexistence Testing for Multi-Antenna Electronic Devices - Radio frequency test systems for characterizing antenna performance in various radio coexistence scenarios are provided. In one suitable arrangement, a test system may be used to perform passive radio coexistence characterization. During passive radio coexistence characterization, at least one signal generator may be used to feed aggressor signals directly to antennas within an electronic device under test (DUT). The aggressor signals may generate undesired interference signals in a victim frequency band, which can then be received and analyzed using a spectrum analyzer. During active radio coexistence characterization, at least one radio communications emulator may be used to communicate with a DUT via a first test antenna. While the DUT is communicating with the at least one radio communications emulator, test signals may also be conveyed between DUT | 03-27-2014 |
20140266941 | Electronic Device With Hybrid Inverted-F Slot Antenna - An electronic device may be provided with a housing. The housing may have a periphery that is surrounded by peripheral conductive structures such as a segmented peripheral metal member. A segment of the peripheral metal member may be separated from a ground by a slot. An antenna feed may have a positive antenna terminal coupled to the peripheral metal member and a ground terminal coupled to the ground and may feed both an inverted-F antenna structure that is formed from the peripheral metal member and the ground and a slot antenna structure that is formed from the slot. Control circuitry may tune the antenna by controlling adjustable components that are coupled to the peripheral metal member. The adjustable components may include adjustable inductors and adjustable capacitors. | 09-18-2014 |
20140302797 | Methods and Apparatus for Testing Electronic Devices Under Specified Radio-frequency Voltage and Current Stress - Test systems for characterizing devices under test (DUTs) are provided. A test system for testing a DUT in a shunt configuration may include a signal generator and a matching network that is coupled between the signal generator and the DUT and that is optimized to apply desired voltage/current stress to the DUT with reduced source power. The matching network may be configured to provide matching and desired stress levels at two or more frequency bands. In another suitable embodiment, a test system for testing a DUT in a series configuration may include a signal generator, an input matching network coupled between the DUT and a first terminal of the DUT, and an output matching network coupled between the DUT and a second terminal of the DUT. The input and output matching network may be optimized to apply desired voltage/current stress to the DUT with reduced source power. | 10-09-2014 |
20140329558 | Electronic Device With Multiple Antenna Feeds and Adjustable Filter and Matching Circuitry - Electronic devices may include antenna structures. The antenna structures may form an antenna having first and second feeds at different locations. A first transceiver may be coupled to the first feed using a first circuit. A second transceiver may be coupled to the second feed using a second circuit. The first and second feeds may be isolated from each other using the first and second circuits. The second circuit may have a notch filter that isolates the second feed from the first feed at operating frequencies associated with the first transceiver. The first circuit may include an adjustable component such as an adjustable capacitor. The adjustable component may be placed in different states depending on the mode of operation of the second transceiver to ensure that the first feed is isolated from the second feed. | 11-06-2014 |