Patent application number | Description | Published |
20100134793 | OPTICAL EVALUATION METHOD BY MEANS OF LASER PULSES AND CORRESPONDING APPARATUS - An optical evaluation method and an apparatus for performing said method are described. First laser pulses of a first type and second laser pulses of a second type that differs from the first type are sent onto a sample to be examined. The sample is hit with first incident light from the two laser pulses in at least one manner of simultaneously, within a very short time lag between the two laser pulses, and a time-correlated manner of the two laser pulses, thereby generating a first optical signal, and hit with second incident light from the two laser pulses, thereby generating a second optical signal. The generated first and second optical signals are detected with at least one detector; and an electronic difference between the first and second optical signals is generated. | 06-03-2010 |
20110149290 | METHOD FOR EXAMINING AN OBJECT WITH THE AID OF A MICROSCOPE AND A MICROSCOPE FOR EXAMINING AN OBJECT - A microscope for examining an object includes a laser light source generating pulsed light so as to illuminate the object. A measuring system including a detector is adapted to detect detection light coming from the object and the measuring system generates a measurement signal based on the detection light. The microscope includes a programmable integrated circuit including a control element and at least one of a first delay element and a second delay element. The control element is configured to generate a first control signal adapted to control the detector and the measuring system. The control element is further configured to generate a second control signal adapted to control the laser light source. The first and second delay elements are configured to delay the first and second control signals, respectively. | 06-23-2011 |
20110304900 | ACOUSTO-OPTICAL SYSTEM, MICROSCOPE AND METHOD OF USE OF THE ACOUSTO-OPTICAL SYSTEM - An acousto-optical system is described comprising at least one acousto-optical element having at least one transducer that is attached to a crystal, a driver unit for generating at least one acoustic signal for driving acousto-optical elements modifying light transmitted through the acousto-optical element and comprising at least one digital data processing unit, at least one digital-to-analog converter transforming the digital combination signal into an initial analog driver signal, and an amplifier for amplifying the initial analog driver signal to become said analog electronic driver signal. Further, a microscope and a method of operating the acousto-optical element is are described. Various objectives are achieved like more flexibility, real time compensation for non-linearity and reducing the number, size, costs and energy consumption of electronic components. | 12-15-2011 |
20120175505 | Method and Device for Scanning-Microscopy Imaging of a Specimen - A method and a device for scanning-microscopy imaging of a specimen ( | 07-12-2012 |
20120193513 | LASER SYSTEM FOR A MICROSCOPE AND METHOD FOR OPERATING A LASER SYSTEM FOR A MICROSCOPE - The invention relates to a laser system ( | 08-02-2012 |
20120236398 | Phase Filters for a Scanning Microscope - The aim of the invention is an optical device for a scanning microscope, said device enabling the focusing of a light beam largely independent of wavelengths; and thus high-resolution microscopy, in particular STED microscopy, in a wider wavelength spectrum is facilitated. At least two phase filters lie on a support. Advantageously, the support is a filter wheel or a filter slider which can be introduced into the beam path of the light beam, said beam path preferably being the beam path of the stimulating light beam in an STED microscope. Several phase filters preferablylie on the support in the shape of a matrix. The support is designed as a glass substrate on which each phase filter is applied. To achieve said aim, another position is additionally found on the support for adjustment purposes, wherein the wavefront of the light is not influenced when it passes through said position, that is, the position is an empty position on which no phase filter is found. | 09-20-2012 |
20130003172 | SCANNING MICROSCOPE AND METHOD FOR OPTICALLY SCANNING ONE OR MORE SAMPLES - A device in the form of a scanning microscope, a device in the form of a structural unit for a microscope and a method and a device for optically scanning one or more samples. A device in the form of a scanning microscope has a light source ( | 01-03-2013 |
20130010340 | DEVICE FOR SCANNING AN OBJECT, METHOD FOR OPERATING THE DEVICE AND SCANNING MICROSCOPE - The invention relates to a device for scanning an object comprising a carrier body ( | 01-10-2013 |
20130032699 | DEVICE AND METHOD FOR COUNTING PHOTONS - A device for counting photons includes a detector unit that is configured to generate an detected signal. A switching unit is configured to be impinged upon by the detected signal and to trigger a switching state for each detection pulse so as to generate a state signal. A sampling unit is configured to sample the state signal at a predetermined sampling frequency. A serial-parallel converter unit is configured to parallelize the serially generated sampled data by grouping successive sampled data into a sampled data packet. An evaluation unit is configured to evaluate the binary values of sampled data packets so as to identify a partial counter result indicating the number of switching state changes occurring in the switching unit, and to add partial counter results identified in individual clock cycles. | 02-07-2013 |
20130043376 | DETECTOR DEVICE - A detector device is configured to receive light and generate electrical signals. The detector device includes a housing, a detector disposed in the housing and a cooling component disposed in the housing. The cooling component is at least one of: positioned so as to have a light path extend through the cooling component, where the light path is defined by light that is received for detection; designed so as to include a thermally conductive, electrically insulating intermediate element; and disposed in direct contact a light sensor of the detector and/or a substrate bearing the light sensor. | 02-21-2013 |
20130043377 | DETECTOR APPARATUS - A detector apparatus is configured to receive light and generate electrical signals. The detector apparatus includes a light sensor having a light incidence side and a cooling component. The cooling component is in direct contact with at least one of the light sensor, on the light incidence side, or a substrate carrying the light sensor. | 02-21-2013 |
20130043378 | DETECTOR APPARATUS - A detector apparatus is configured to receive light and generate electrical signals. The detector apparatus includes a housing, a detector disposed in the housing and a cooling component disposed in the housing. The cooling component electrically insulates the detector with respect to the housing or is part of an insulator electrically that insulates the detector with respect to the housing. | 02-21-2013 |
20130044370 | DEVICE AND METHOD FOR SCANNING AN OBJECT AND A MICROSCOPE - The invention relates to a device for scanning an object comprising a focusing lens system ( | 02-21-2013 |
20130119276 | Method for Measuring the Lifetime of an Excited State in a Sample - The present invention relates to a method for measuring the lifetime of an excited state in a sample, in particular a fluorescence lifetime, and to an apparatus for carrying out such a method. First, an excitation pulse is generated and a sample region is illuminated with the excitation pulse. Then, a first digital data sequence is generated which is representative of the power-time profile of the excitation pulse, and a first switching instant is determined from the first digital data sequence. Moreover, the detection light emanating from the sample region is detected by a detector, and a second digital data sequence is generated which is representative of the power-time profile of the detection light, and a second switching instant is determined from the second digital data sequence. Finally, the time difference between the first and second switching instants is calculated. | 05-16-2013 |
20130140437 | Method and Apparatus for Examining a Sample - A method and an apparatus for examining a sample. The apparatus has a light source for generating excitation light in pulses which occur in succession at an excitation pulse frequency, for illuminating a sample region with the excitation pulse, and having a detector for detecting the detection light emanating from the sample region. The apparatus is characterized in that, for each detected photon of the detection light, the detector generates an electrical pulse and thereby a sequence of electrical pulses, and an analog-digital converter is provided that generates a digital data sequence by sampling the sequence of electrical pulses at a sampling rate. | 06-06-2013 |
20140300958 | ARRANGEMENT FOR USE IN THE ILLUMINATION OF A SPECIMEN IN SPIM MICROSCOPY - An arrangement for use in illuminating a sample in SPIM microscopy includes an illumination objective configured to receive and focus a light strip or a quasi-light strip. The quasi-light strip is made up of a light bundle continuously moved back and forth in a light-strip plane. A deflection apparatus is configured to deflect the light strip or the quasi-light strip, after the light strip or the quasi-light strip has passed through the illumination objective, in such a way that the light strip or the quasi-light strip propagates at an angle different from zero degrees with respect to an optical axis of the illumination objective. The illumination objective and the deflection apparatus are arranged movably relative to one another. | 10-09-2014 |
20140306098 | DETECTOR APPARATUS - A detector apparatus that is embodied to receive light and to generate electrical signals has a housing and a detector arranged in the housing. The detector includes a light sensor that is embodied to receive light and to release electrons. The light sensor is at a lower electrical potential level than the housing; and that the detector is in thermally conductive contact with the housing via an electrically insulating intermediate arrangement, the thermal conduction direction inside the housing being opposite to the light propagation direction of the light to be detected. | 10-16-2014 |