| Patent application number | Description | Published |
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| 20080231322 | Circuit Device and Method of Controlling a Voltage Swing - In particular illustrative embodiments, circuit devices and methods of controlling a voltage swing are disclosed. The method includes receiving a signal at an input of a digital circuit device including a capacitive node. The method also includes selectively activating a voltage level adjustment element to regulate an electrical discharge path from the capacitive node to an electrical ground to prevent complete discharge of the capacitive node. In a particular illustrative embodiment, the received signal may be a clock signal. | 09-25-2008 |
| 20090039867 | Circuit Device and Method of Measuring Clock Jitter - In an embodiment, a method is disclosed that includes receiving a clock signal at a delay chain of a circuit device and determining a value of the clock signal at a selected point within the delay chain. The method also includes adjusting the selected point when the value does not indicate detection of an edge of the clock signal. | 02-12-2009 |
| 20090058463 | Sequential Circuit Element Including A Single Clocked Transistor - A method is disclosed that includes propagating data via a first data path of a sequential circuit element in response to a clock signal received at a single clocked transistor of the sequential circuit element. The method also includes retaining information related to the data propagated via the first path at a retention circuit element of a second data path, where the first data path includes a first transistor that is responsive to an output of the single clocked transistor. The first transistor has a higher current flow capacity than a second transistor associated with the second data path. | 03-05-2009 |
| 20090070554 | Register File System and Method for Pipelined Processing - The present disclosure includes a multi-threaded processor that includes a first register file associated with a first thread and a second register file associated with a second thread. At least one hardware resource is shared by the first and second register files. In addition, the first thread may have a pipeline access position that is non-sequential to the second thread. A method of accessing a plurality of register files is also disclosed. The method includes reading data from a first register file while concurrently reading data from a second register file. The first register file is associated with a first instruction stream and the second register file is associated with a second instruction stream. The first instruction stream is sequential to the second instruction stream in an execution pipeline of a processor, and the first register file is in a non-adjacent location with respect to the second register file. | 03-12-2009 |
| 20090108895 | Latch Structure and Self-Adjusting Pulse Generator Using the Latch - The disclosure includes a latch structure and self-adjusting pulse generator using the latch. In an embodiment, the system includes a first latch and a pulse generator coupled to provide a timing signal to the first latch. The pulse generator includes a second latch that has characteristics matching the first latch. | 04-30-2009 |
| 20090119477 | Configurable Translation Lookaside Buffer - The disclosure includes a method and system of configuring a translation lookaside buffer (TLB). In an embodiment, the TLB includes a first portion and a second portion. The first portion or the second portion may be selectively disabled in response to a value of a TLB configuration indicator. | 05-07-2009 |
| 20090267649 | Clock Gating System and Method - A clock gating system and method is disclosed. In a particular embodiment, the system includes an input logic circuit having at least one input to receive at least one input signal and having an output at an internal enable node. A keeper circuit includes at least one switching element that is responsive to a gated clock signal and is coupled to the internal enable node to selectively hold a logical voltage level at the internal enable node. The system further includes a gating element responsive to an input clock signal and to the logical voltage level at the internal enable node to generate the gated clock signal. | 10-29-2009 |
| Patent application number | Description | Published |
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| 20100228944 | Apparatus and Method to Translate Virtual Addresses to Physical Addresses in a Base Plus Offset Addressing Mode - An apparatus and method to translate virtual addresses to physical addresses in a base plus offset addressing mode are disclosed. In an embodiment, a method includes performing a first translation lookaside buffer (TLB) lookup based on a base address value to retrieve a speculative physical address. While performing the TLB lookup based on the base address value, the base address value is added to an offset value to generate an effective address value. The method also includes performing a comparison of the base address value and the effective address value based on a variable page size to determine whether the speculative physical address corresponds to the effective address. | 09-09-2010 |
| 20110193592 | VOLTAGE LEVEL SHIFTER WITH DYNAMIC CIRCUIT STRUCTURE HAVING DISCHARGE DELAY TRACKING - An apparatus is disclosed. In a particular embodiment, the apparatus includes a a dynamic circuit structure that includes a dynamic node coupling a precharge circuit, a discharge circuit, and a gated keeper circuit. The gated keeper circuit is enabled by a signal from a discharge delay tracking circuit. | 08-11-2011 |
| 20110193609 | Voltage Level Shifter with Dynamic Circuit Structure having Discharge Delay Tracking - In a particular embodiment, an apparatus includes a dynamic circuit structure that includes a dynamic node coupling a precharge circuit, a discharge circuit, and a gated keeper circuit. The gated keeper circuit is enabled by a signal from a discharge delay tracking circuit. | 08-11-2011 |
| 20110231719 | Logic Built-In Self-Test Programmable Pattern Bit Mask - In a particular embodiment, a method is disclosed that includes mapping failing bit positions within multiple scan chains to memory locations of a memory mask. The method also includes executing logic built-in self-test (LBIST) testing on a semiconductor device using the memory mask to selectively mask certain results within the multiple scan chains. The results are associated with performance of LBIST testing on the semiconductor device. | 09-22-2011 |
