| Patent application number | Description | Published |
|---|
| 20080208270 | HIGH VOLTAGE CAPACITOR ROUTE WITH INTEGRATED FAILURE POINT - An implantable medical device may have a circuit failure mode. The disclosed circuit may have an integrated failure point designed to fail prior to those portions of the circuit. The integrated failure point may include a narrowed portion of a high voltage lead and a grounded lead having a narrow gap separating the grounded lead from the narrowed portion of the high voltage lead. During a high stress fault condition the narrowed portion of the high voltage lead acts as a fuse, forming a vaporized cloud of metal, which shorts current in the high voltage lead across the narrow gap to the grounded lead, thus protecting the remaining portion of the circuit from the high stress condition. | 08-28-2008 |
| 20090012574 | IMPLANTABLE MEDICAL DEVICE WITH TEMPERATURE MEASURING AND STORING CAPABILITY - An implantable medical device such as a cardiac pacemaker or implantable cardioverter/defibrillator with the capability of storing body temperature measurements taken periodically and/or when triggered by particular events. | 01-08-2009 |
| 20090157128 | SENSING THRESHOLD CONTROL TO LIMIT AMPLITUDE TRACKING - A depolarization sensing threshold can be determined using an amplitude-limited portion of a cardiac signal received using an implantable medical device. One or more cardiac depolarizations can be detected using the cardiac signal and the depolarization sensing threshold. | 06-18-2009 |
| 20090157133 | SUPRAVENTRICULAR TACHY SENSING VECTOR - A system includes a pulse generator including a can electrode and a lead couplable to the pulse generator, the lead including a distal coil electrode and a proximal coil electrode, wherein both of the coil electrodes are electrically uncoupled from the can electrode such that a unipolar sensing vector is provided between at least one of the coil electrodes and the can electrode. | 06-18-2009 |
| 20090192563 | METHOD AND APPARATUS FOR ADJUSTING CARDIAC EVENT DETECTION THRESHOLD BASED ON DYNAMIC NOISE ESTIMATION - An implantable cardiac rhythm management (CRM) device includes a sensing and detection circuit that senses at least one cardiac signal and detects cardiac electrical events from the sensed cardiac signal using a detection threshold that is adjusted based on a dynamic noise estimation. The sensed cardiac signal is filtered to produce a filtered cardiac signal having a signal frequency band and a noise signal having a noise frequency band. The noise frequency band is substantially different from the signal frequency band. A dynamic noise floor is produced based on the noise signal and used as the minimum value for the detection threshold. A cardiac electrical is detected when the amplitude of the filtered cardiac signal exceeds the detection threshold. | 07-30-2009 |
| 20090216297 | TELEMETRY DOUBLE BUFFERING AND OVERSAMPLING FOR AN IMPLANTABLE MEDICAL DEVICE - This document discusses, among other things, a communication circuit for an IMD comprising a radio frequency (RF) modulator to modulate and demodulate IMD data signals, first and second serial buffer registers to store received demodulated data and to store transmit data for modulation and configured to operate according to a first clock signal, and a parallel buffer register to receive data in parallel from the first and second serial buffer registers and configured to operate according to a second clock signal that is slower than the first clock signal. The communication circuit also includes a telemetry control circuit configured to, when in the receive mode, alternate between serially receiving data into the first serial buffer register while the parallel buffer receives data from the second serial buffer register, and serially receiving data into the second serial buffer register while the parallel buffer receives data from the first serial buffer. | 08-27-2009 |
| 20110066199 | HIGH VOLTAGE CAPACITOR ROUTE WITH INTEGRATED FAILURE POINT - An implantable medical device may have a circuit failure mode. The disclosed circuit may have an integrated failure point designed to fail prior to those portions of the circuit. The integrated failure point may include a narrowed portion of a high voltage lead and a grounded lead having a narrow gap separating the grounded lead from the narrowed portion of the high voltage lead. During a high stress fault condition the narrowed portion of the high voltage lead acts as a fuse, forming a vaporized cloud of metal, which shorts current in the high voltage lead across the narrow gap to the grounded lead, thus protecting the remaining portion of the circuit from the high stress condition. | 03-17-2011 |
