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Bakowski
Antonio Bakowski, S.j. Dos Campos BR
| Patent application number | Description | Published |
|---|---|---|
| 20090083576 | FAULT TREE MAP GENERATION - A method for Fault Tree Map generation employs to transformation of Fault Trees of production installation, specific installation, technical system (Hardware and integrated Hardware/Software) to new Fault Tree diagram (Fault Tree Map), which permits drastically compact the Fault Tree depiction and facilitates performing of the Fault Tree qualitative analysis, including evaluation of combination of latent failures and evident failures, repeated events and critical events position influence, and failure propagation potentiality, besides facility of localization of each Fault Tree logical Gate and relevant failures in the fault tree printed report. Generation takes place using special symbols, which permit to reflect the Fault Tree logic, present all Fault Tree failures with graphically identification of the failure type, and show the failure repetition and also the failure critically (importance) to Fault Tree Top Event probability. The method presents exceptional advantages to analysis of large-scale, extended Fault Trees, allowing vastly decrease the time of analysis and elevate the analysis quality and Fault Tree perception, including for specialists, who are not the Fault Tree authors. | 03-26-2009 |
Ben Bakowski, Romsey GB
| Patent application number | Description | Published |
|---|---|---|
| 20090138833 | METHOD, APPARATUS AND COMPUTER PROGRAM FOR FACILITATING THE IMPROVEMENT OF A USER INTERFACE - There is disclosed a method, apparatus and computer program for facilitating improvement of a user interface. A plurality of critical paths though the user interface are determined. A complexity of each of the critical paths is calculated. The complexity of the critical paths relative to a level of criticality of those paths is then indicated. | 05-28-2009 |
| 20090265693 | METHOD AND SYSTEM FOR TEST RUN PRIORITIZATION FOR SOFTWARE CODE TESTING IN AUTOMATED TEST EXECUTION - A method and system for software code testing for an automated test execution environment is provided. Testing involves importing test case information into a tooling environment based on code coverage and targeted testing, the test information including test name and code coverage data including classes and methods exercised by the code; generating a test hierarchy by analyzing the individual test case information; selecting tests including one or more of: all tests for a full regression run, a subset of tests for basic quality assurance or testing a particular area of functionality, and tests that exercise a recently changed class; executing selected tests to generate a pass/fail result for each test and correlating the test results; performing test run prioritization to recommend which remaining tests to execute. | 10-22-2009 |
| 20090265694 | METHOD AND SYSTEM FOR TEST FAILURE ANALYSIS PRIORITIZATION FOR SOFTWARE CODE TESTING IN AUTOMATED TEST EXECUTION - A method and system for software code testing for an automated test execution environment is provided. Testing involves importing test case information into a tooling environment based on code coverage and targeted testing, the test information including test name and code coverage data including classes and methods exercised by the code; generating a test hierarchy by analyzing the individual test case information; selecting tests including one or more of: all tests for a full regression run, a subset of tests for basic quality assurance or testing a particular area of functionality, and tests that exercise a recently changed class; executing selected tests to generate a pass/fail result for each test and correlating the test results; performing test failure analysis prioritization to prioritize any failures. | 10-22-2009 |
Mietek Bakowski, Stillingson SE
| Patent application number | Description | Published |
|---|---|---|
| 20090206347 | Semiconductor Device - A unipolar semiconductor device having a drift layer ( | 08-20-2009 |
Richard Bakowski, Warners, NY US
| Patent application number | Description | Published |
|---|---|---|
| 20100076655 | INPUT TORQUE LIMITING CLUTCH FOR POWER TRANSFER ASSEMBLY - A vehicle driveline component that includes an input member, at least one output member and a preloaded clutch that is disposed between the input member and the at least one output member. The preloaded clutch limits drive torque transmitted form the input member to each output member. The driveline component is selected from a group consisting of transfer cases, propshafts, viscous couplings and differentials. A related method is also provided. | 03-25-2010 |
Richard A. Bakowski, Warners, NY US
| Patent application number | Description | Published |
|---|---|---|
| 20110218070 | ELECTRIC DRIVE TWO-SPEED TRANSAXLE - An electric drive module for a motor vehicle includes an electric motor, a first input member, a first output member and a two-speed module selectively drivingly interconnecting the first input member and the first output member at one of two different drive ratios. A reduction unit includes a second input member being driven by the first output member and has a second output member being driven at a reduced speed relative to the second input member. A differential assembly has an input driven by said second output member. A first differential output drives a first output shaft, and a second differential output drives a second output shaft. | 09-08-2011 |
Tomasz Bakowski, Levittown, NY US
| Patent application number | Description | Published |
|---|---|---|
| 20110059556 | Rapid and Continuous Analyte Processing in Droplet Microfluidic Devices - The compositions and methods described herein are designed to introduce functionalized microparticles into droplets that can be manipulated in microfluidic devices by fields, including electric (dielectrophoretic) or magnetic fields, and extracted by splitting a droplet to separate the portion of the droplet that contains the majority of the microparticles from the part that is largely devoid of the microparticles. Within the device, channels are variously configured at Y- or T junctions that facilitate continuous, serial isolation and dilution of analytes in solution. The devices can be limited in the sense that they can be designed to output purified analytes that are then further analyzed in separate machines or they can include additional channels through which purified analytes can be further processed and analyzed. | 03-10-2011 |