Axel Nackaerts
Axel Nackaerts, Haasrode BE
Patent application number | Description | Published |
---|---|---|
20090112344 | DESIGN OPTIMIZATION - A method for optimizing a design for a device is disclosed. Such an optimization is performed with respect to a predetermined metric, e.g. device speed, area, power consumption or yield. In one aspect, the method comprises obtaining a design for a device. The design comprises design components. The method also comprises determining from the design components at least one group of first design components that has a higher sensitivity to the predetermined metric than second design components. The first design components may be on the critical path in the design. The method further comprises tuning the first design components and the technology for manufacturing the first design components thus reducing the variability of the first design components and obtaining an optimized design with respect to the predetermined metric. | 04-30-2009 |
20090137102 | METHOD FOR MAKING QUANTUM DOTS - A method for forming at least one quantum dot at least one predetermined location on a substrate is disclosed. In one aspect, the method comprises providing a layer of semiconductor material on an insulating layer on the substrate. The layer of semiconductor material is patterned so as to provide at least one line of semiconductor material having a width (w | 05-28-2009 |
20110084313 | Methods for Manufacturing Dense Integrated Circuits - One inventive aspect relates to a method for forming integrated circuits and circuits obtained therewith. The method of forming a circuit pattern in a device layer of a semiconductor substrate comprises decomposing the circuit pattern in two constituent orthogonal subpatterns. The method further comprises transferring the pattern of a first subpattern to a hard mask layer overlying the device layer. The method further comprises transferring the pattern of the other subpattern to a photosensitive layer overlying the patterned hard mask layer. The method further comprises patterning the device layer using the patterned hard mask layer and the patterned photosensitive layer as a mask. The method further comprises removing the patterned hard mask layer and the patterned photosensitive layer. Furthermore memory or logic circuits obtained using the above technique are described. | 04-14-2011 |
Axel Nackaerts, Heverlee BE
Patent application number | Description | Published |
---|---|---|
20110175595 | SENSOR AND MEASUREMENT METHOD - The present invention relates to a sensor comprising a substrate ( | 07-21-2011 |
20120256645 | CAPACITIVE SENSOR, INTEGRATED CIRCUIT, ELECTRONIC DEVICE AND METHOD - A sensor for sensing an analyte includes capacitive elements, each having a pair of electrodes separated by a dielectric wherein the dielectric constant of the dielectric of at least one of the capacitive elements is sensitive to the analyte, the sensor further including a comparator adapted to compare a selected set of capacitive elements against a reference signal and to generate a comparison result signal, and a controller for iteratively selecting the set in response to the comparison result signal, wherein the sensor is arranged to produce a digitized output signal indicative of the sensed level of the analyte of interest. An IC comprising such a sensor, an electronic device comprising such an IC and a method of determining a level of an analyte of interest using such a sensor are also disclosed. | 10-11-2012 |
20120286803 | Sensor - The invention relates to an electrochemical sensor integrated on a substrate, the electrochemical sensor comprising: a field effect transistor integrated on the substrate and having a source, gate and drain connections, said gate of the field effect transistor comprising: a sensing gate conductively coupled to a sensing electrode; and a bias gate, wherein the sensing gate is capacitively coupled to the bias gate and the bias gate is capacitively coupled to the substrate. | 11-15-2012 |
20130057157 | Lighting System - A lighting system uses interior and exterior light sensors for detecting lighting level and colour. A lighting unit has a controlled colour and intensity so that a colour match zone can be defined where the interior space lighting has colour temperature based on the exterior lighting conditions. | 03-07-2013 |
20130070807 | Temperature Sensor, Electronic Device and Temperature Measurement Method - Disclosed is a temperature sensor ( | 03-21-2013 |
20130328142 | INTEGRATED CIRCUIT WITH PRESSURE SENSOR AND MANUFACTURING METHOD - Disclosed is an integrated circuit ( | 12-12-2013 |
20130334619 | INTEGRATED CIRCUIT WITH ION SENSITIVE SENSOR AND MANUFACTURING METHOD - Disclosed is an integrated circuit comprising a substrate ( | 12-19-2013 |