Avanessian

Albrik Avanessian, Watertown, MA US

Patent application number	Description	Published
20090265673	INTERSECT AREA BASED GROUND RULE FOR SEMICONDUCTOR DESIGN - A design rule that determines a degree of overlap between two design elements in two adjoining levels by estimating a physical overlap area, or an “intersect area,” of corresponding structures in a semiconductor chip is provided. The estimation of the physical intersect area may factor in line edge biasing, critical dimension tolerance, overlay tolerance, and corner rounding to provide an accurate estimate of a physical area for each of the structures corresponding to the two design elements. The intersect area is employed as a metric to determine compliance with a ground rule, i.e., the ground rule is specified in terms of the intersect region. Other derived quantities such as electrical resistance, electromigration resistance, expected yield may be calculated from the intersect area, and may be advantageously employed to optimize the design data.	10-22-2009

Patent application number	Description	Published
20110045068	PHARMACEUTICAL FORMULATIONS FOR THE ORAL ADMINISTRATION OF PPI - The present invention relates to pharmaceutical formulations comprising a layer of compressed granules to facilitate the administration of oral PPI.	02-24-2011

Patent application number	Description	Published
20090263471	Controlled Release Pharmaceutical Composition of Venlafaxine Hydrochloride, and Process for Preparation Thereof - Herein is described a controlled release pharmaceutical composition of venlafaxine hydrochloride, an effective antidepressant, comprising an inert core; on which the active principle is uniformly layered, that in turn is coated with a layer comprising a hardening agent and a lipophilic agent; the process for the preparation of said pharmaceutical composition is also described.	10-22-2009