| Patent application number | Description | Published |
|---|
| 20080259990 | TEMPERATURE SENSOR CIRCUIT AND CALIBRATION METHOD THEREOF - A temperature sensor circuit comprises a first monitor voltage generation circuit that generates a first monitor voltage with a characteristic that changes with respect to temperature; a second monitor voltage generation circuit that generates a second monitor voltage with a characteristic that changes by a variation amount different from the first monitor voltage with respect to the temperature; and a differential amplifier circuit, to which the first and second monitor voltages are inputted and that outputs the result of comparing the two voltages. Further, the differential amplifier circuit of the temperature sensor circuit is capable of switching to a first connection state, which outputs the comparison result, and to a second connection state, which outputs an offset monitor voltage that is rendered by adding the offset voltage of the differential amplifier circuit to the first or second monitor voltage or subtracting the offset voltage therefrom. | 10-23-2008 |
| 20090039950 | INTERNAL POWER-SUPPLY CIRCUIT - An internal power-supply circuit generates an internal voltage based on a reference voltage, and has an external-power-supply terminal to which an external power-supply voltage having a first potential is applied during a normal operation and an external power-supply voltage having a second potential that is higher than the first potential is applied during a burn-in acceleration test, a reference-voltage generating unit for generating the reference voltage from the external power-supply voltage, and an internal-voltage generating unit for generating the internal voltage based on the reference voltage. The reference-voltage generating unit generates, during the normal operation, a normal reference voltage that is independent of the potential of the external power-supply voltage and generates, during the burn-in acceleration test, a first burn-in reference voltage that is dependent on the potential of the external power-supply voltage and a second burn-in reference voltage that has the same potential as the normal reference voltage. | 02-12-2009 |
| 20090086555 | VOLTAGE SUPPLY CIRCUIT AND SEMICONDUCTOR MEMORY - Each of first and second differential amplifiers has a function of increasing a bias current in response to the activation of a drivability control signal. A first driving circuit connects an output node to a high power supply line in response to the activation of an output signal of the first differential amplifier, and connects the output node to a low power supply line in response to the activation of an output signal of the second differential amplifier. Only during the activation period of the drivability control signal, a second driving circuit connects the output node to the high power supply line in response to the activation of the output signal of the first differential amplifier, and connects the output node to the low power supply line in response to the activation of the output signal of the second differential amplifier. | 04-02-2009 |
| 20090230770 | Internal Power Supply Circuit Having a Cascode Current Mirror Circuit - A current mirror circuit which is connected to first and second power supplies and generates a desired current, has a plurality of first transistors which are connected in parallel to the first power supply side and the gates of which are connected to a common node, a plurality of second transistors which are cascode-connected to the plurality of first transistors and the gates of which are supplied with a cascode bias potential and a cascode bias generation circuit which generates the cascode bias potential, wherein the cascode bias generation circuit maintains the cascode bias potential during normal operation at a first potential between the potentials of the first and second power supplies, and maintains the cascode bias potential during power-on at a second potential closer to the potential of the second power supply than the first potential. | 09-17-2009 |
| 20090259452 | SIMULATION SYSTEM AND COMPUTER PRODUCT - A simulation system includes electromagnetic field analyzing units that execute electromagnetic field analysis with respect to electromagnetic field analysis areas obtained by division of an area to be analyzed into the electromagnetic field analysis areas; one or more circuit analyzing units that execute circuit analysis with respect to a circuit unit in the area to be analyzed; and an aggregating unit that aggregates, from the electromagnetic field analyzing units, data for the circuit analysis by the one or more circuit analyzing units and transmits the data to the circuit analyzing units. The simulation system links plural processing units that mutually exchange data. | 10-15-2009 |
| 20100088566 | ANALYZING APPARATUS AND DATA STORAGE METHOD - An analyzing apparatus includes a result-data storing unit that determines whether result data that is calculated as a result of analysis is restorable by linear interpolation. If the result data is determined to be unrestorable by the linear interpolation, the result-data storing unit stores the result data in a predetermined storage unit. Moreover, the analyzing apparatus includes a data restoring unit that reads the result data from the storage unit. The data restoring unit performs the linear interpolation using the result data acquired, thereby restoring the result data. | 04-08-2010 |
| 20110050686 | THREE-DIMENSIONAL DATA DISPLAY APPARATUS AND METHOD - A three-dimensional data display apparatus is provided with a screen display processing section that generates a display screen with a structure arranged in a virtual space of a three-dimensional orthogonal coordinate system based on structure information stored in a data storage section and displays the display screen on a monitor, a grid setting-updating section that sets a grid in the virtual space, an operation information acquiring section that acquires operation information from a mouse, an input point position calculation section that calculates coordinates of an input point in the virtual space, calculates a moving destination of the input point based on the operation information, selects coordinates nearest to the moving destination of the input point from any one of the coordinates of each grid lattice based on the grid in the virtual space, the coordinates of a boundary of the structure and the coordinates of the point of intersection between the boundary of the structure and the grid and updates the coordinates of the input point and an input point display processing section that displays the input point at the updated coordinates. | 03-03-2011 |
| 20110082681 | COUPLED ANALYSIS SIMULATION APPARATUS AND COUPLED ANALYSIS SIMULATION METHOD - A coupled analysis simulation apparatus includes a coupled analysis processing unit configured to perform coupled analysis by performing electromagnetic field analysis and circuit analysis in coordination with each other, the electromagnetic field analysis being performed on a space including conductive layers to which an electronic circuit module is connected, the circuit analysis being performed on the electronic circuit module; a first generating unit configured to generate a virtual conductive part in a section or a region including connection parts connecting the electronic circuit module with the conductive layers; and a second generating unit configured to generate virtual connection parts that virtually connect the virtual conductive part with the conductive layers at positions where the connection parts are connected to the conductive layers. | 04-07-2011 |
