| Patent application number | Description | Published |
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| 20080208386 | SEMICONDUCTOR MANUFACTURING SYSTEM, CONTROLLER, SEMICONDUCTOR MANUFACTURING SYSTEM CONTROL METHOD, AND PROCESSING LIQUID COLLECTION METHOD - A semiconductor manufacturing system includes a semiconductor manufacturing apparatus, a first controller for controlling the semiconductor manufacturing apparatus, an auxiliary machine for the semiconductor manufacturing apparatus, a second controller for controlling the auxiliary machine, and a third controller for electrically coupling the first and second controllers. The second controller outputs an auxiliary machine-in-operation signal to the third controller when the auxiliary machine is operating, outputs an auxiliary machine-stopping signal to the third controller when the auxiliary machine is stopping, and operates or stops the auxiliary machine according to an instruction signal received from the third controller. The first controller receives the auxiliary machine-in-operation signal or the auxiliary machine-stopping signal via the third controller, and keeps the semiconductor manufacturing apparatus in operation or on standby when the first controller is receiving the auxiliary machine-in-operation signal. The third controller stops the auxiliary machine when the third controller detects that the semiconductor manufacturing apparatus is on standby, and outputs the auxiliary machine-in-operation signal, instead of the auxiliary machine-stopping signal received from the second controller, to the first controller. | 08-28-2008 |
| 20110046797 | SEMICONDUCTOR MANUFACTURING SYSTEM, CONTROLLER, SEMICONDUCTOR MANUFACTURING SYSTEM CONTROL METHOD, AND PROCESSING LIQUID COLLECTION METHOD - A semiconductor manufacturing system includes a semiconductor manufacturing apparatus, a first controller for controlling the semiconductor manufacturing apparatus, an auxiliary machine for the semiconductor manufacturing apparatus, a second controller for controlling the auxiliary machine, and a third controller for electrically coupling the first and second controllers. The second controller outputs an auxiliary machine-in-operation signal to the third controller when the auxiliary machine is operating, outputs an auxiliary machine-stopping signal to the third controller when the auxiliary machine is stopping, and operates or stops the auxiliary machine according to an instruction signal received from the third controller. The first controller receives the auxiliary machine-in-operation signal or the auxiliary machine-stopping signal via the third controller, and keeps the semiconductor manufacturing apparatus in operation or on standby when the first controller is receiving the auxiliary machine-in-operation signal. The third controller stops the auxiliary machine when the third controller detects that the semiconductor manufacturing apparatus is on standby, and outputs the auxiliary machine-in-operation signal, instead of the auxiliary machine-stopping signal received from the second controller, to the first controller. | 02-24-2011 |
| Patent application number | Description | Published |
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| 20090241316 | Method and Device For Installing Door Glass on Vehicle Door - A method of installing a door glass ( | 10-01-2009 |
| 20110004340 | WORKING SYSTEM AND WORK-AUTOMATING METHOD - Provided is a work assembling system ( | 01-06-2011 |
| 20110018291 | WORK ALIGNING SYSTEM AND METHOD OF MOVING WORK - A work aligning system capable of easily altering the kind of works to be aligned. The work aligning system ( | 01-27-2011 |
| 20110022218 | WORK MEASURING METHOD, METHOD FOR ATTACHING SUSPENSION ASSEMBLY AND APPARATUS FOR ATTACHING SUSPENSION ASSEMBLY - Provided is a work measuring method by which a deviation quantity of a work measuring point from a reference position can be measured in a short time. A work surface is set as a reference point when the measuring point is positioned at the reference position, and a distance from a photographing device to a reference surface is set as a reference distance. A deviation quantity of the measurement point in a direction intersecting a photographing direction on the reference surface is measured by the photographing device, and a deviation quantity of the measuring point in the photographing direction is measured by a laser distance sensor. Then, based on the deviation quantity measured by the photographing device, the deviation quantity measured by the laser distance sensor, and the reference distance, a deviation quantity of the measuring point in a direction intersecting the photographing direction is calculated. | 01-27-2011 |
| 20110160905 | WORKPIECE MOUNTING SYSTEM, WORKPIECE MOUNTING METHOD, SUNROOF UNIT HOLDING DEVICE, AND SUNROOF UNIT HOLDING METHOD - A workpiece mounting system which is highly versatile and can reduce a cycle time. A workpiece mounting system ( | 06-30-2011 |
