| Patent application number | Description | Published |
|---|
| 20080263481 | APPARATUS AND METHODS FOR POWER MANAGEMENT IN INTEGRATED CIRCUITS - A programmable logic device (PLD) includes a non-volatile memory, a configuration memory, and a control circuitry. The control circuitry couples to the non-volatile memory and to the configuration memory. A set of voltages are derived from the outputs of the control circuitry, and are applied to circuitry within the PLD. | 10-23-2008 |
| 20090267645 | PASSGATE STRUCTURES FOR USE IN LOW-VOLTAGE APPLICATIONS - Enhanced passgate structures for use in low-voltage systems are presented in which the influence of V | 10-29-2009 |
| 20090282306 | ERROR DETECTION ON PROGRAMMABLE LOGIC RESOURCES - Error detection circuitry is provided on a programmable logic resource. Programmable logic resource configuration data is loaded into a cyclic redundancy check (CRC) module where a checksum calculation may be performed. In one embodiment, the checksum may be compared to an expected value, which is a precomputed checksum on data prior to being programmed into or while data is being programmed into a programmable logic resource. In another embodiment, the expected value may be included in the checksum calculation. An output indicating whether an error is detected may be generated depending on the relationship between the checksum and the expected value, or on the value of the checksum. This output may be sent to an output pin that is accessible by user logic. | 11-12-2009 |
| 20100026340 | User-Accessible Freeze-Logic for Dynamic Power Reduction and Associated Methods - A programmable logic device (PLD) includes a configuration circuit, and first and second freeze-logic circuits. The configuration circuit provides configuration data for configuring programmable resources of the PLD during a configuration mode of the PLD. One of the two freeze-logic circuits provides a freeze logic signal during the configuration mode of the PLD. The other freeze-logic circuit provides a freeze logic signal during a user mode of the PLD. | 02-04-2010 |
| 20100321984 | CONFIGURATION RANDOM ACCESS MEMORY - Integrated circuits such as programmable logic device integrated circuits are provided that have configuration random-access memory elements. The configuration random-access memory elements are loaded with configuration data to customize programmable logic on the integrated circuits. Each memory element has a capacitor that stores data for that memory element. A pair of cross-coupled inverters are connected to the capacitor. The inverters ensure that the memory elements produce output control signals with voltages than range from one power supply rail to another. Each configuration random-access memory element may have a clear transistor. The capacitor may be formed in a dielectric layer that lies above the transistors of the inverters, the address transistor, and the clear transistor. The inverters may be powered with an elevated power supply voltage. | 12-23-2010 |
| 20110138240 | ERROR DETECTION ON PROGRAMMABLE LOGIC RESOURCES - Error detection circuitry is provided on a programmable logic resource. Programmable logic resource configuration data is loaded into a cyclic redundancy check (CRC) module where a checksum calculation may be performed. In one embodiment, the checksum may be compared to an expected value, which is a precomputed checksum on data prior to being programmed into or while data is being programmed into a programmable logic resource. In another embodiment, the expected value may be included in the checksum calculation. An output indicating whether an error is detected may be generated depending on the relationship between the checksum and the expected value, or on the value of the checksum. This output may be sent to an output pin that is accessible by user logic. | 06-09-2011 |
| 20110204919 | Apparatus and methods for adjusting performance of programmable logic devices - A programmable logic device (PLD) includes at least two regions. Each region includes electrical circuitry that has a set of transistors. Each of the two regions has a corresponding fixed transistor threshold voltage, a corresponding fixed transistor body bias, and a corresponding fixed supply voltage. | 08-25-2011 |
