Andrew Humphris
Andrew Humphris, Oxfordshire GB
Patent application number | Description | Published |
---|---|---|
20100186132 | PROBE ASSEMBLY FOR A SCANNING PROBE MICROSCOPE - A probe assembly is for use in a scanning probe microscope. The probe assembly includes a carrier having a plurality of at least three substantially identical probes, each probe having a tip that is located on a plane that is common to the plurality of probe tips and that is movable from this plane. The assembly also includes addressing means adapted to select one of the plurality of probes for relative movement with respect to a majority of the remainder of the probes. Such an assembly, with its potential to facilitate rapid, perhaps automated, replacement of a used probe, lends itself to use in high-speed scanning apparatus. | 07-22-2010 |
20100235955 | VIBRATION COMPENSATION IN PROBE MICROSCOPY - A The local probe microscopy apparatus ( | 09-16-2010 |
20110138506 | METHOD OF PROBE ALIGNMENT - A method of probe alignment is described in which an interrogating light beam is aligned with the probe of a scanning probe microscope. The methods described ensure that the light beam is positioned as closely as possible to a point directly above the probe tip. This improves image quality by removing variations that may arise if cantilever deflection is allowed to vary during the course of a scan and/or if scanning at high scanning speeds that may excite transient motion of the probe. | 06-09-2011 |
20110167525 | PROBE DETECTION SYSTEM - A probe detection system ( | 07-07-2011 |
20110247106 | DYNAMIC PROBE DETECTION SYSTEM - A dynamic probe detection system ( | 10-06-2011 |
20110296561 | CONTROL SYSTEM FOR SCANNING PROBE MICROSCOPE - A control system ( | 12-01-2011 |
20130042375 | CONTROL SYSTEM FOR A SCANNING PROBE MICROSCOPE - A control system | 02-14-2013 |
20150020244 | BEAM SCANNING SYSTEM - Apparatus for illuminating a probe of a probe microscope. A lens is arranged to receive a beam and focus it onto the probe. A scanning system varies over time the angle of incidence at which the beam enters the lens relative to its optical axis. The scanning system is typically arranged to move the beam so as to track movement of the probe, thereby maintaining the location on the probe at which the beam is focused. The scanning system may comprise a beam steering mirror which reflects the beam towards the lens; and a mirror actuator for rotating the beam steering mirror. | 01-15-2015 |
Andrew Humphris, Abingdon Oxforshire GB
Patent application number | Description | Published |
---|---|---|
20130014296 | PROBE ASSEMBLY FOR A SCANNING PROBE MICROSCOPE - A probe assembly for use with a scanning probe microscope includes a carrier supporting at least two probes mounted on a tilt stage arranged to tilt the carrier about an axis. The probes may be distributed on one or more surfaces. In use, the tilt stage operates either as a selection device, orienting a selected probe or surface towards a sample, and/or as an alignment tool, adjusting a planar array of probes such that they are better aligned with the sample. This offers the potential for automated exchange of probes, with increased speed and accuracy, during microscope operation. | 01-10-2013 |
Andrew Humphris, Oxforshire GB
Patent application number | Description | Published |
---|---|---|
20140026263 | ADAPTIVE MODE SCANNING PROBE MICROSCOPE - A scanning probe microscope comprising a probe that is mechanically responsive to a driving force. A signal generator provides a drive signal to an actuator that generates the driving force, the drive signal being such as to cause the actuator to move the probe repeatedly towards and away from a sample. A detection system is arranged to output a height signal indicative of a path difference between light reflected from the probe and a height reference beam. Image processing apparatus is arranged to use the height signal to form an image of the sample. Signal processing apparatus is arranged to monitor the probe as the probe approaches a sample and to detect a surface position at which the probe interacts with the sample. In response to detection of the surface position, the signal processing apparatus prompts the signal generator to modify the drive signal. | 01-23-2014 |
Andrew Humphris, Oxford GB
Patent application number | Description | Published |
---|---|---|
20140289911 | METHOD OF INVESTIGATING A SAMPLE SURFACE - A method of investigating a sample surface. A probe is brought into close proximity with a first sample and scanned across the first sample. A response of the probe to its interaction with the sample is monitored using a detection system and a first data set is collected indicative of said response. The probe and/or sample is tilted through a tilt angle. The probe is scanned across the first sample or across a second sample after the tilting step, and a response of the probe to its interaction with the scanned sample is monitored using a detection system and a second data set is collected indicative of said response. The method includes the additional step of analysing the first data set prior to tilting the probe and/or sample in order to determine the tilt angle. | 09-25-2014 |
Andrew Humphris, Abingdon GB
Patent application number | Description | Published |
---|---|---|
20150219684 | PHOTOTHERMAL ACTUATION OF A PROBE FOR SCANNING PROBE MICROSCOPY - Various methods of driving a probe of a scanning probe microscope are disclosed. One set of methods distribute the energy of a radiation beam over a wide area of the probe by either scanning the beam or increasing its illumination area. Another method changes the intensity profile of the radiation beam with a diffractive optical element, enabling a more uniform intensity profile across the width of the illumination. Another method uses a diffractive optical element to change the circumferential shape of the radiation beam, and hence the shape of the area illuminated on the probe, in order to match the shape of the probe and hence distribute the energy over a wider area. | 08-06-2015 |
20150219685 | MULTIPLE PROBE ACTUATION - A method of actuating a plurality of probes. Each probe may be made of two or more materials with different thermal expansion coefficients which are arranged such that when the probe is illuminated by an actuation beam it deforms to move the probe relative to a sample. Energy is delivered to the probes by sequentially illuminating them with an actuation beam via an objective lens in a series of scan sequences. Two or more of the probes are illuminated by the actuation beam in each scan sequence and the actuation beam enters the objective lens at a different angle to an optical axis of the objective lens for each probe which is illuminated in a scan sequence. The actuation beam is controlled so that different amounts of energy are delivered to at least two of the probes by the actuation beam during at least one of the scan sequences. | 08-06-2015 |
20150219686 | MULTIPLE PROBE DETECTION AND ACTUATION - A method of detecting the positions of a plurality of probes. An input beam is directed into an optical device and transformed into a plurality of output beamlets which are not parallel with each other. Each output beamlet is split into a sensing beamlet and an associated reference beamlet. Each of the sensing beamlets is directed onto an associated one of the probes with an objective lens to generate a reflected beamlet which is combined with its associated reference beamlet to generate an interferogram. Each interferogram is measured to determine the position of an associated one of the probes. A similar method is used to actuate a plurality of probes. A scanning motion is generated between the probes and the sample. An input beam is directed into an optical device and transformed into a plurality of actuation beamlets which are not parallel with each other. | 08-06-2015 |