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Andberg

John Andberg, Santa Cruz, CA US

Patent application numberDescriptionPublished
20110089966APPARATUS AND SYSTEMS FOR PROCESSING SIGNALS BETWEEN A TESTER AND A PLURALITY OF DEVICES UNDER TEST - Apparatus is for processing signals between a tester and devices under test. In one embodiment, the apparatus includes at least one multichip module. Each multichip module has a plurality of micro-electromechanical switches between a set of connectors to the tester and a set of connectors to devices under test. At least one driver is provided to operate each of the micro-electromechanical switches. Other embodiments are also disclosed.04-21-2011

Patent applications by John Andberg, Santa Cruz, CA US

John W. Andberg, Santa Cruz, CA US

Patent application numberDescriptionPublished
20100134134TEST ELECTRONICS TO DEVICE UNDER TEST INTERFACES, AND METHODS AND APPARATUS USING SAME - In one embodiment, a test system has a set of test electronics for testing a device under test (DUT). The test system also has at least one test electronics to DUT interface having a zero insertion force (ZIF) connector. Each ZIF connector has a ZIF connector to DUT clamping mechanism configured to i) apply a first orthogonal force to a probe card that interfaces with a DUT, by pressing the ZIF connector against the probe card, and simultaneously ii) exert at least one second orthogonal force on the probe card, the at least one second orthogonal force being opposite in direction to the first orthogonal force.06-03-2010

John William Andberg, Santa Cruz, CA US

Patent application numberDescriptionPublished
20090255098CLAMP WITH A NON-LINEAR BIASING MEMBER - In an embodiment, there is disclosed a clamp, having a housing; a latch member extending from within the housing, and the latch member translatable along a displacement axis; an actuator mounted to the housing and operatively associated with the latch member to translate the latch member along the displacement axis; and a nonlinear biasing member operatively associated with the latch member and the housing, and the nonlinear biasing member positioned to bias the latch member toward a retracted position. Other embodiments are also disclosed.10-15-2009

Patent applications by John William Andberg, Santa Cruz, CA US