Inventors list |
Assignees list |
Classification tree browser |
Top 100 Inventors |
Top 100 Assignees |
Anbai
Satoshi Anbai, Tokyo JP
| Patent application number | Description | Published |
|---|---|---|
| 20100140801 | Device - In a device acting as a semiconductor device, a first chip has a first protective layer pattern while a second chip has a second protective layer pattern which is two-dimensionally symmetrical with the first protective layer pattern to provide a reflection symmetrical relationship between the first and the second protective layer patterns. When the first and the second chips form a back-to-back structure, both the first and the second protective layer patterns are completely superposed with each other. | 06-10-2010 |
Toshihisa Anbai, Kawasaki JP
| Patent application number | Description | Published |
|---|---|---|
| 20090240984 | TEST APPARATUS FOR TESTING AN INFORMATION PROCESSING APPARATUS - A test apparatus for testing an information processing apparatus includes a control unit connected to the control signal line through the connector unit to receive command information from the processing unit to execute the program, and a switching unit connected to the control unit to connect the second communication signal line and the fourth communication signal line under the control of the control unit. | 09-24-2009 |
Yasukazu Anbai, Niigata JP
| Patent application number | Description | Published |
|---|---|---|
| 20090239992 | THERMOSETTING RESIN COMPOSITION AND UNCURED FILM COMPRISING THE SAME - To provide a thermosetting resin composition having excellent film-forming properties, which can form a cured product having low elastic modulus and having low dielectric constant and low dielectric loss tangent in a high frequency range; and a thermosetting resin composition comprising (A) a vinyl compound represented by the general formula (1), and (B) a rubber and/or a thermoplastic elastomer. | 09-24-2009 |