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Amanuma
Hirokatsu Amanuma, Saitama JP
| Patent application number | Description | Published |
|---|---|---|
| 20090291794 | VEHICULAR POWER TRANSMISSION APPARATUS - In a motor generator pulley | 11-26-2009 |
Ricardo Hidetoshi Amanuma, Resende-Rio De Janeiro BR
| Patent application number | Description | Published |
|---|---|---|
| 20090235609 | Rod with octagonal core purpose-built for civil construction - The object of this patent is an advance in the state of the art in the technique of manufacturing rods ( | 09-24-2009 |
Seiji Amanuma, Tokyo JP
| Patent application number | Description | Published |
|---|---|---|
| 20080238213 | SWITCHING CIRCUIT, SIGNAL OUTPUT DEVICE AND TEST APPARATUS - There is provided a switching circuit that opens or short-circuits between a first terminal and a second terminal in accordance with a control signal. The switching circuit includes a plurality of switching devices that is serially connected between the first terminal and the second terminal and each of which is opened or short-circuited in accordance with a provided control voltage, and a plurality of control circuits that is provided one-to-one corresponding to the plurality of switching devices, each of which provides a control voltage according to the control signal to the corresponding switching device, and that opens and short-circuits the plurality of switching devices in synchronization with each other. | 10-02-2008 |
| 20100045115 | SWITCHING CIRCUIT, SIGNAL OUTPUT DEVICE AND TEST APPARATUS - A test apparatus for a device under test (DUT) that includes a signal output device that outputs a signal according to a test signal and a detecting section that detects a signal output from the DUT that outputs a detection result. The signal output device includes an output port, a high-voltage side switching circuit between a first terminal and a second terminal, a low-voltage side switching circuit between a first terminal and a second terminal, and a control section that outputs the first and second control signals. Each of the high-voltage and the low-voltage side switching circuits include a plurality of switching devices serially connected between the first and second terminals. The plurality of switching devices are opened substantially in synchronization with each other, such that a voltage inputted to the first terminal is outputted from the second terminal by short-circuiting between the first and second terminals. | 02-25-2010 |
| 20100052435 | SWITCHING CIRCUIT, SIGNAL OUTPUT DEVICE AND TEST APPARATUS - A signal output device that outputs an output signal according to an input signal expressing a logical value that includes a high-voltage side switching circuit between a first terminal and a second terminal in accordance with a first control signal. The device includes a low-voltage side switching circuit between a first and second terminal for outputting a low-voltage side reference voltage in accordance with a second control signal and a control section. The high-voltage and low-voltage side switching circuits include a plurality of switching devices serially connected between the first terminal and the second terminal and each of which is opened in accordance with a provided control voltage. The control circuit opens the plurality of switching devices substantially in synchronization with each other, where a voltage inputted to the first terminal is outputted from the second terminal by short-circuiting between the first terminal and the second terminal. | 03-04-2010 |
Seiji Amanuma, Saitama JP
| Patent application number | Description | Published |
|---|---|---|
| 20110128020 | TEST APPARATUS AND POWER SUPPLY APPARATUS - Provided is a test apparatus that tests a device under test, comprising a plurality of capacitors that are each charged to a predetermined voltage; a switching section that switches which of the capacitors charged to a predetermined voltage supplies power to the device under test; and a judging section that judges acceptability of the device under test based on an operational result of the device under test. Also provided is a test apparatus that selects one of a plurality of capacitors and a corresponding one of a plurality of power supply units, according to content of a test performed after a test that uses another of the capacitors to supply power to the device under test. | 06-02-2011 |
Toshio Amanuma, Monsenhor Gustavo BR
| Patent application number | Description | Published |
|---|---|---|
| 20090235609 | Rod with octagonal core purpose-built for civil construction - The object of this patent is an advance in the state of the art in the technique of manufacturing rods ( | 09-24-2009 |
Yoshiyuki Amanuma, Kodaira JP
| Patent application number | Description | Published |
|---|---|---|
| 20080271001 | METHOD OF GENERATING PROGRAM, INFORMATION PROCESSING DEVICE AND MICROCOMPUTER - In programming in high-level language, a method of generating a program supporting external specifications for generating secure codes having high tamper-resistance and automatically generating an executable program having tamper-resistance with regard to a portion designated by a user is provided. A syntax analysis step, an intermediate representation generation step, a register allocation step, an optimization processing step, an assembly language generation step, a machine language generation step and a machine language program linkage step are executed. And between finish of reading of the source program and generating the executable program, a tamper-resistant code insertion step of automatically generating a code having tamper-resistance coping with unjust analysis of an operation content of the executable program is executed to the source program, the intermediate representation, the assembly language program or the machine language program based on an instruction of a user. | 10-30-2008 |
Yoshiyuki Amanuma, Kanagawa JP
| Patent application number | Description | Published |
|---|---|---|
| 20110193616 | SEMICONDUCTOR INTEGRATED CIRCUIT AND DATA PROCESSING SYSTEM - An arrangement for detecting local light irradiation in an illegal attack attempt to intentionally induce a malfunction or faulty condition is formed on a small chip occupancy area so as to provide high detection sensitivity. In a region containing a logic circuit, a plurality of series-coupled detection inverters are distributively disposed as photodetector elements having a constant logical value of primary-stage input. When at least one of the series-coupled detection inverters is irradiated with light, an output thereof is inverted, thereby producing a final output through the series-coupled detection inverters. Based on the final output thus produced, local light irradiation can be detected. | 08-11-2011 |