Patent application number | Description | Published |
20100127687 | Programmable Voltage Reference - A programmable voltage reference includes a temperature compensated current source and a voltage reference circuit. The temperature compensated current source includes an output configured to provide a reference current. The voltage reference circuit includes an input coupled to the output of the temperature compensated current source and a reference output. The voltage reference circuit includes a self-cascode metal-oxide semiconductor field-effect transistor structure that includes a first device that is diode-connected and operates in a weak inversion saturation region and a second device that operates in a weak inversion triode region. A length of the second device is selectable. The voltage reference circuit is configured to provide a reference voltage on the reference output based on the reference current. | 05-27-2010 |
20100156470 | VOLTAGE DETECTOR DEVICE AND METHODS THEREOF - A voltage detector device is disclosed that includes a coarse-range voltage detector and a fine-range voltage detector. The fine-range voltage detector is configured to remain inactive, so that it consumes a relatively small amount of power, while a monitored voltage is outside a first specified range. In response to determining that the monitored voltage is within the first specified range, the coarse-range voltage detector activates the fine-range voltage detector so that it can monitor the voltage. In response to the fine-voltage monitor determining the voltage falls within a second specified range, the fine-range voltage detector provides a signal to a functional module of an electronic device so that the functional module can provide a defined response, such as executing an interrupt routine. | 06-24-2010 |
20100327893 | Probing Structure for Evaluation of Slow Slew-Rate Square Wave Signals in Low Power Circuits - An integrated circuit probing structure ( | 12-30-2010 |
20110121809 | VOLTAGE REFERENCE CIRCUIT - A bandgap voltage reference unit on an integrated circuit ( | 05-26-2011 |
20110121865 | SYSTEMS AND METHODS FOR DETECTING INTERFERENCE IN AN INTEGRATED CIRCUIT - Apparatus, systems and methods are provided for protecting a processing system from electromagnetic interference. An integrated circuit comprises a sensing arrangement configured to sense an interference signal and an interference detection module coupled to the sensing arrangement. The interference detection module is configured to detect when a power level associated with the interference signal is greater than a threshold value. In one embodiment, the interference detection module generates an interrupt for a processing system when the power level associated with the interference signal is greater than the threshold value. | 05-26-2011 |
20120013365 | LOW VOLTAGE DETECTOR - A low voltage detector ( | 01-19-2012 |
20120242398 | PROGRAMMABLE TEMPERATURE SENSING CIRCUIT FOR AN INTEGRATED CIRCUIT - A programmable temperature sensing circuit includes a comparator, first and second CTAT sensing elements, first and second PTAT reference circuits, and a selection circuit. When a selection signal is a first logic state, an output terminal of the first PTAT reference circuit is coupled to the second CTAT temperature sensing element for providing a first threshold voltage to the second input of the comparator. When the selection signal is a second logic state different from the first logic state, a series-connection of the first PTAT reference circuit and the second PTAT reference circuit are coupled to the second CTAT temperature sensing element for providing a second threshold voltage to the second input of the comparator. The comparator provides an output voltage indication when a voltage provided by the first CTAT sensing element compares favorably with the selected one of the first or second threshold voltages. | 09-27-2012 |
20120323508 | LOW VOLTAGE DETECTOR - A low voltage detector ( | 12-20-2012 |
20130200943 | CHARGE PUMP VOLTAGE REGULATOR - A regulator ( | 08-08-2013 |
20140035560 | METHOD AND APPARATUS FOR LIMITING ACCESS TO AN INTEGRATED CIRCUIT (IC) - A method and apparatus for limiting access to an integrated circuit (IC) upon detection of abnormal conditions is provided. At least one of abnormal voltage detection, abnormal temperature detection, and abnormal clock detection are provided with low power consumption. Both abnormally low and abnormally high parameter values (e.g. abnormally low or high voltage, temperature, or clock frequency) may be detected. Abnormal clock detection may also detect a stopped clock signal, including a clock signal stopped at a low logic level or at a high logic level. Furthermore, abnormal clock detection may detect an abnormal duty cycle of a clock signal. A sampled bandgap reference may be used to provide accurate voltage and current references while consuming a minimal amount of power. Upon detection of an abnormal parameter value, one or more tamper indications may be provided to initiate tampering countermeasures, such as limiting access to the IC. | 02-06-2014 |
20140139201 | LOW-POWER VOLTAGE TAMPER DETECTION - Systems and methods for low-power voltage tamper detection are described. In some embodiments, an integrated circuit may include source-follower circuitry configured to produce a scaled down supply voltage. The integrated circuit may also include undervoltage detection circuitry coupled to the source-follower circuitry, the undervoltage detection circuitry configured to output a first signal having a first logic value if the scaled down supply voltage is greater than a low threshold voltage or a second logic value if the scaled down supply voltage is smaller than the low threshold voltage. Additionally or alternatively, the integrated circuit may include overvoltage detection circuitry coupled to the source-follower circuitry, the overvoltage detection circuitry configured to output a second signal having the first logic value if the scaled down supply voltage is smaller than a high threshold voltage or the second logic value if the scaled down supply voltage is greater than the high threshold voltage. | 05-22-2014 |
20140210565 | AMPLITUDE LOOP CONTROL FOR OSCILLATORS - Systems and methods for amplitude loop control for oscillators. In some embodiments, an electronic circuit may include oscillator circuitry configured to produce a periodic signal, and control circuitry operably coupled to the oscillator circuitry, the control circuitry including switched capacitor circuitry configured to determine a difference between maximum and minimum peak voltage values of the periodic signal, the control circuit configured to control a voltage amplitude of the periodic signal based upon the difference. In other embodiments, a method may include receiving a clock signal from a clock generator, determining, using a switched capacitor circuit, a first peak voltage value of the clock signal, determining, using the switched capacitor circuit, a second peak voltage value of the clock signal, and controlling a bias current applied to the clock generator based upon a difference between the first and second peak voltage values. | 07-31-2014 |
Patent application number | Description | Published |
20080204155 | OSCILLATOR DEVICES AND METHODS THEREOF - Oscillator devices and methods of operating such oscillator devices are disclosed. The oscillator devices include a current source, and an oscillation module to provide a clock signal. The frequency of the clock signal depends on the relationship between a threshold voltage of a transistor at the oscillation module and the current level provided by the current source. The transistor at the oscillation module is matched to a transistor at the current source so that the frequency of the clock signal is relatively insensitive to changes in device temperature. | 08-28-2008 |
20080218253 | LOW POWER VOLTAGE REFERENCE - A voltage reference includes a first cell configured to receive a first proportional to absolute temperature (PTAT) current and a second cell configured to receive a second PTAT current. The first cell includes a diode-connected stack of insulated-gate field-effect transistors (IGFETs). The diode-connected stack of IGFETs includes a first transistor that is configured to be biased in a triode weak inversion region. The second cell includes a diode-connected stack of IGFETs and a serially coupled resistor. A magnitude of the second PTAT current is based on a drain-to-source voltage of the first transistor and a value of the serially coupled resistor. The voltage reference provides a reference voltage at a reference node of the second cell based on the second PTAT current. | 09-11-2008 |
20080304348 | Current-mode memory cell - Methods and corresponding systems for reading a memory cell include a first current sourced from a first current source into a summing node, wherein the first current source is coupled to a first reference. A second current is sourced from a second current source into the summing node, wherein the second current source is coupled to the first reference through a programmable fuse. A third current is sunk from the summing node with a current sink, wherein the current sink is coupled to a second reference, and wherein a third current limit is greater than a first current limit and less than the sum of the first current limit and the second current limit. A voltage at the summing node is output in response to the first current, the second current, and the third current. The first and second current sources, and the current sink can be current mirrors. | 12-11-2008 |
20090102802 | TOUCH PANEL DETECTION CIRCUITRY AND METHOD OF OPERATION - A touch panel detection circuit includes current limiting circuitry that has a first portion coupled between a first supply voltage terminal and a first input node and a second portion coupled between a second input node and a second supply voltage terminal. Programmable precharge circuitry connects the first input node to the first supply voltage terminal via a conductive path that is in parallel with the first portion of the current limiting circuitry and precharges the first input node to a predetermined voltage. Comparison circuitry is coupled to the programmable precharge circuitry and to the first input node. The comparison circuitry detects a change in resistance between the first input node and the second input node and provides a signal in response thereto when the comparison circuitry is enabled by the programmable precharge circuitry. | 04-23-2009 |
20090278571 | DEVICE AND TECHNIQUE FOR TRANSISTOR WELL BIASING - A method includes receiving a set of voltages comprising at least a first voltage, a second voltage, and a third voltage and biasing a well of a transistor based on the extreme voltage of the set of voltages. Biasing the well of the transistor can include concurrently providing a first signal and a second signal based on a comparison of the first voltage and the second voltage and selectively coupling the well of the transistor to a source of the extreme voltage of the set of voltages based on the first signal, the second signal, and the third voltage. An electronic device comprises a transistor and a power switching module. The power switching module includes a set of inputs, each input configured to receive a corresponding one of a set of voltages comprising at least a first voltage, a second voltage, and a third voltage, and includes an output coupled to a well of the transistor, the output configured to provide the extreme voltage of the set of voltages. | 11-12-2009 |
20090315835 | TOUCH SCREEN DETECTION AND DIAGNOSTICS - A method includes driving a current through a touch screen that is based on contact of the touch screen, generating a proportional second current, and detecting contact of the touch screen from the second current. Another method includes providing a touch screen with parallel plates, disabling contact detection when a plate voltage is lower than a threshold voltage, and enabling contact detection when the plate voltage is at least equal to the threshold voltage. A device includes a first node and a second node coupled to a touch screen, a third node, a first current mirror coupled to the second node and the third node configured to generate a current at the third node that is proportional to a second current at the second node, and a detection circuit that provides a signal based on the first current that indicates contact of the touch screen. | 12-24-2009 |
20110309419 | PROCESS OF FORMING AN ELECTRONIC DEVICE INCLUDING A RESISTOR-CAPACITOR FILTER - A process of forming an electronic device can include forming a capacitor dielectric layer over a base region, wherein the base region includes a base semiconductor material, forming a gate dielectric layer over a substrate, forming a capacitor electrode over the capacitor dielectric layer, forming a gate electrode over the gate dielectric layer, and forming an input terminal and an output terminal to the capacitor electrode. The input terminal and the output terminal can be spaced apart from each other and are connected to different components within the electronic device. A filter can include the base region, the capacitor dielectric layer, and the capacitor electrode. A transistor structure can include the gate dielectric layer and the gate electrode. An electronic device can include a low-pass filter and a transistor structure, such as an n-channel transistor or a p-channel transistor. | 12-22-2011 |