Inventors list

Assignees list

Classification tree browser

Top 100 Inventors

Top 100 Assignees


Alexander A. Makarov, Bremen DE

Alexander A. Makarov, Bremen DE

Patent application numberDescriptionPublished
20090166528METHOD OF ION ABUNDANCE AUGMENTATION IN A MASS SPECTROMETER - A method of improving the detection limits of a mass spectrometer by: generating sample ions from an ion source; storing the sample ions in a first ion storage device; ejecting the stored ions into an ion selection device; selecting and ejecting ions of a chosen mass to charge ratio out of the ion selection device; storing the ions ejected from the ion selection device in a second ion storage device without passing them back through the ion selection device; repeating the preceding steps so as to augment the ions of the said chosen mass to charge ratio stored in the second ion storage device; and transferring the augmented ions of the said chosen mass to charge ratio back to the first ion storage device for subsequent analysis.07-02-2009
20100038533Ion Transfer Arrangement with Spatially Alternating DC and Viscous Ion Flow - A method of transporting gas and entrained ions between higher and lower pressure regions of a mass spectrometer comprises providing an ion transfer conduit 02-18-2010
20100098558Vacuum Pump or Vacuum Apparatus with Vacuum Pump - The invention relates to a vacuum pump or vacuum apparatus having a vacuum pump for the evacuation of one or a plurality of volumes, the vacuum pump having a plurality of pressure stages and at least two suction inlets. According to the invention, an outer suction inlet for a first pressure stage spatially encompasses an inner suction inlet for a second pressure stage such that the inner suction inlet seals only against pressure within the outer suction inlet, not against external pressure.04-22-2010
20100314538Parallel Mass Analysis - A system and method of mass spectrometry is provided. Ions from an ion source are stored in a first ion storage device and in a second ion storage device. Ions are ejected from the first ion storage device to a first mass analysis device during a first ejection time period, for analysis during a first analysis time period. Ions are ejected from the second ion storage device to a second mass analysis device during a second ejection time period. The ion storage devices are connected in series such that an ion transport aperture of the first ion storage device is in communication with an ion transport aperture of the second ion storage device. The first analysis time period and the second ejection time period at least partly overlap.12-16-2010
20110017907Multireflection Time-Of-Flight Mass Spectrometer - The present invention provides a method of reflecting ions in a multireflection time of flight mass spectrometer comprising providing an ion mirror having a plurality of electrodes, the ion mirror having a cross section with a first, minor axis (Y) and a second, major axis (X) each perpendicular to a longitudinal axis (Z) of the ion mirror which lies generally in the direction of time of flight separation of the ions in the mirror; guiding ions towards the ion mirror; applying a voltage to the electrodes so as to create an electric field which: (a) causes the mean trajectory of the ions to intersect a plane of symmetry of the ion mirror which contains the longitudinal (Z) and major axes (X) of the mirror; (b) causes the ions to reflect in the ion mirror; and (c) causes the ions to exit the ion mirror in a direction such that the mean trajectory of ions passing through the ion mirror has a component of movement in a direction (Y) perpendicular to and diverging from the said plane of symmetry thereof.01-27-2011
20110024619Mass Spectrometer Arrangement with Fragmentation Cell and Ion Selection Device - A method of mass spectrometry having the steps of, in a first cycle: storing sample ions in a first ion storage device; ejecting the stored ions out of the first ion storage device into a separate ion selection device; selecting a subset of the ions in the ion selection device; ejecting the subset of ions selected within the ion selection device to a fragmentation device; directing ions from the fragmentation device back to the first ion storage device without passing them through the said ion selection device; receiving at least some of the ions ejected from the first ion storage device, or their derivatives, back into the first ion storage device; and storing the received ions in the first ion storage device.02-03-2011
20110084205Collision Cell - A method of operating a gas-filled collision cell in a mass spectrometer is provided. The collision cell has a longitudinal axis. Ions are caused to enter the collision cell. A trapping field is generated within the collision cell so as to trap the ions within a trapping volume of the collision cell, the trapping volume being defined by the trapping field and extending along the longitudinal axis. Trapped ions are processed in the collision cell and a DC potential gradient is provided, using an electrode arrangement, resulting in a non-zero electric field at all points along the axial length of the trapping volume so as to cause processed ions to exit the collision cell. The electric field along the axial length of the trapping volume has a standard deviation that is no greater than its mean value.04-14-2011
20110095177Detection Apparatus for Detecting Charged Particles, Methods for Detecting Charged Particles and Mass Spectrometer - Embodiments of the invention provide a detection apparatus for detecting charged particles having a secondary particle generator for generating secondary charged particles in response to receiving incoming charged particles, a charged particle detector for receiving and detecting secondary charged particles generated by the secondary particle generator, a photon generator for generating photons in response to receiving secondary charged particles generated by the secondary particle generator, and a photon detector for detecting the photons generated by the photon generator.04-28-2011
20110095178Detection Apparatus for Detecting Charged Particles, Methods for Detecting Charged Particles and Mass Spectrometer - Embodiments of the invention provide a detection apparatus for detecting charged particles having a charged particle detector for receiving and detecting either incoming charged particles or secondary charged particles generated from the incoming charged particles, a photon generator for generating photons in response to receiving at least some of the same incoming charged particles or secondary charged particles generated from the incoming charged particles as are received and detected by the charged particle detector, and a photon detector for detecting photons generated by the photon generator.04-28-2011
20110101218Mass Spectrometer - A method of switching between two modes of power supply to a mass analyser is provided. In a first mode of operation, operated for a first predefined time duration, a first power supply, coupled to the mass analyser, generates a first non05-05-2011
20110163227Ion Trap for Cooling Ions - A method of changing the kinetic energy of ions is provided, comprising: trapping ions in a trapping region of an ion trap; and directing a beam of gas through the trapping region, so as to change the kinetic energy of the trapped ions thereby. Also provided is a method of separating ions, the method comprising: causing ions to enter a trapping region of an ion trap along a first axis of the trapping region; directing a beam of gas along the first axis and applying an electric potential in the direction of the first axis so as to cause separation of the ions based on their ion mobility. An ion trap and a mass spectrometer for performing the methods are also provided.07-07-2011

Patent applications by Alexander A. Makarov, Bremen DE