| Patent application number | Description | Published |
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| 20090033467 | RF IDENTIFICATION DEVICE WITH NEAR-FIELD-COUPLED ANTENNA - An embodiment of a RF identification device is formed by a tag and by a reader. The tag is formed by a processing circuit and a first antenna, which has the function both of transmitting and of receiving data. The reader is formed by a control circuit and by a second antenna, which has the function both of transmitting and of receiving data. The processing circuit is formed by a resonance capacitor, a modulator, a rectifier circuit, a charge-pump circuit and a detection circuit. The antenna of the tag and the processing circuit are integrated in a single structure in completely monolithic form. The first antenna has terminals connected to the input of the rectifier circuit, the output of which is connected to the charge-pump circuit. The charge-pump circuit has an output connected to the detection circuit. | 02-05-2009 |
| 20100134133 | METHOD FOR PERFORMING AN ELECTRICAL TESTING OF ELECTRONIC DEVICES - A method of electrical testing electronic devices DUT, comprising: connecting at least an electronic device DUT to an automatic testing apparatus suitable for performing the testing of digital circuits or memories or of digital circuits and memories; sending electrical testing command signals to the electronic device DUT by means of the ATE apparatus; performing electrical testing of the electronic device DUT by means of at least one advanced supervised self testing system “Advanced Low Pin Count BIST” ALB which is built in the electronic device DUT, the ALB system being digitally interfaced with the ATE through a dedicated digital communication channel; and sending reply messages, if any, which comprise measures, failure information and reply data to the command signals from the electronic device DUT toward the ATE apparatus by means of the digital communication channel. | 06-03-2010 |
| 20100308855 | PROBE CARD FOR TESTING INTEGRATED CIRCUITS - An embodiment of a probe card adapted for testing at least one integrated circuit integrated on a corresponding at least one die of a semiconductor material wafer, the probe card including a board adapted for the coupling to a tester apparatus, and a plurality of probes coupled to the said board, wherein the probe card comprises a plurality of replaceable elementary units, each one comprising at least one of said probes for contacting externally-accessible terminals of an integrated circuit under test, the plurality of replaceable elementary units being arranged so as to correspond to an arrangement of at least one die on the semiconductor material wafer containing integrated circuits to be tested. | 12-09-2010 |
| 20110049728 | METHOD TO PERFORM ELECTRICAL TESTING AND ASSEMBLY OF ELECTRONIC DEVICES - A method performs electrical testing and assembly of an electronic device on a wafer and comprising a pad made in an oxide layer covered by a passivation layer. The method includes connecting the electronic device to a testing apparatus; providing said electronic device with a metallization layer extending on the passivation layer from the pad to a non-active area of said wafer. The method comprises-performing the electrical testing on wafer of the electronic device by placing a probe of on a portion of the extended metallization layer; performing the cut of said wafer, reducing the extension of the metallization layer to the edge of the electronic device; embedding the device inside a package, forming on the metallization layer an electrical connection configured to connect the metallization layer to a circuit in said package. | 03-03-2011 |
| 20110050267 | ELECTROMAGNETIC SHIELD FOR TESTING INTEGRATED CIRCUITS - An embodiment of a probe card is proposed. The probe card comprises a plurality of probes. Each probe is adapted to contact a corresponding terminal of a circuit integrated in at least one die of a semiconductor material wafer during a test phase of the wafer. Said plurality of probes includes at least one probe adapted to provide and/or receive a radio frequency test signal to/from the corresponding terminal during the test phase. Said probe card comprises at least one electromagnetic shield structure corresponding to the at least one probe adapted to provide and/or receive the radio frequency test signal for the at least partial shielding of an electromagnetic field irradiated by such at least one probe adapted to provide and/or receive the radio frequency test signal. | 03-03-2011 |
| 20110089962 | TESTING OF ELECTRONIC DEVICES THROUGH CAPACITIVE INTERFACE - An embodiment of a test apparatus for executing a test of a set of electronic devices having a plurality of electrically conductive terminals, the test apparatus including a plurality of electrically conductive test probes for exchanging electrical signals with the terminals, and coupling means for mechanically coupling the test probes with the electronic devices. In an embodiment, the coupling means includes insulating means for keeping each one of at least part of the test probes electrically insulated from at least one corresponding terminal during the execution of the test. Each test probe and the corresponding terminal form a capacitor for electro-magnetically coupling the test probe with the terminal. | 04-21-2011 |
| 20110090030 | SIGNAL TRASMISSION THROUGH LC RESONANT CIRCUITS - An embodiment of an electronic system includes a first electronic circuit and a second electronic circuit. The electronic system further includes a resonant LC circuit having a resonance frequency for coupling the first electronic circuit and the second electronic circuit; each electronic circuit includes functional means for providing a signal at the resonance frequency to be transmitted to the other electronic circuit through the LC circuit and/or for receiving the signal from the other electronic circuit. The LC circuit also include capacitor means having at least one first capacitor plate included in the first electronic circuit and at least one second capacitor plate included in the second electronic circuit. The LC circuit further includes first inductor means included in the first electronic circuit and/or second inductor means included in the second electronic circuit. The at least one capacitor plate of each electronic circuit is coupled with the corresponding functional means through the possible corresponding inductor means. | 04-21-2011 |
| 20110156732 | PROCESS FOR CONTROLLING THE CORRECT POSITIONING OF TEST PROBES ON TERMINATIONS OF ELECTRONIC DEVICES INTEGRATED ON A SEMICONDUCTOR AND CORRESPONDING ELECTRONIC DEVICE - An embodiment for making a check of the electric type executed on wafer for testing the correct positioning or alignment of the probes of a probe card on the pads or bumps of the electronic devices integrated on semiconductor wafer. An embodiment consists in making a current circulate in at least part of the seal ring of at least one of the above devices, and in case it has to flow in the seal ring of more devices, these seal rings are suitably interconnected to each other. Thanks to an embodiment the seal ring may also be reinforced in the angle areas of the chip, and suitable circuits may be possibly inserted in the seal ring or between the seal rings. | 06-30-2011 |
