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Akio Koike

Akio Koike, Tokyo JP

Patent application numberDescriptionPublished
20100179047OPTICAL MEMBER COMPRISING TIO2-CONTAINING SILICA GLASS - The present invention relates to an optical member including a TiO07-15-2010
20100261597TIO2-CONTAINING SILICA GLASS - The present invention is to provide a TiO10-14-2010
20100317505TIO2-CONTAINING SILICA GLASS AND OPTICAL MEMBER FOR LITHOGRAPHY USING THE SAME - The present invention is to provide a TiO12-16-2010
20100323872TIO2-CONTAINING SILICA GLASS AND OPTICAL MEMBER FOR EUV LITHOGRAPHY USING THE SAME - The present invention provides a TiO12-23-2010
20100323873TIO2-CONTAINING SILICA GLASS AND OPTICAL MEMBER FOR LITHOGRAPHY USING THE SAME - The present invention provides a TiO12-23-2010
20110028299TIO2-CONTAINING SILICA GLASS FOR OPTICAL MEMBER FOR EUV LITHOGRAPHY - The present invention provides a TiO02-03-2011

Akio Koike, Chiyoda-Ku JP

Patent application numberDescriptionPublished
20090208760ENERGY-TRANSMITTING OR ULTRAVIOLET LIGHT-TRANSMITTING OPTICAL FIBER PREFORM AND PRODUCTION PROCESS THEREOF - The present invention is to provide an optical fiber preform suitable for the production of an energy-transmitting or ultraviolet light-transmitting optical fiber, which has an excellent transmittance of a high-energy light of 50 KW/cm08-20-2009
20100028787SUBSTRATE FOR EUV MASK BLANKS - A substrate that is suitable for an EUV mask or an EUV mask blank and excellent in flatness, is provided.02-04-2010
20100323871TIO2-CONTAINING SILICA GLASS AND OPTICAL MEMBER FOR EUV LITHOGRAPHY USING HIGH ENERGY DENSITIES AS WELL AS SPECIAL TEMPERATURE CONTROLLED PROCESS FOR ITS MANUFACTURE - The present invention provides a TiO12-23-2010

Akio Koike, Yokohama-Shi JP

Patent application numberDescriptionPublished
20090122281SILICA GLASS CONTAINING TIO2 AND PROCESS FOR ITS PRODUCTION - A silica glass containing TiO05-14-2009
20090242387PROCESS FOR PRODUCING SILICA GLASS CONTAINING TIO2, AND OPTICAL MATERIAL FOR EUV LITHOGRAPHY EMPLOYING SILICA GLASS CONTAINING TIO2 - The claimed invention relates to a process for producing an optical material for EUV lithography, wherein the optical material contains a silica glass having a TiO10-01-2009

Patent applications by Akio Koike, Yokohama-Shi JP