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Abu-Rahma
Mohamed Abu-Rahma, San Diego, CA US
| Patent application number | Description | Published |
|---|---|---|
| 20120113708 | Stable SRAM Bitcell Design Utilizing Independent Gate Finfet - Stable SRAM cells utilizing Independent Gate FinFET architectures provide improvements over conventional SRAM cells in device parameters such as Read Static Noise Margin (RSNM) and Write Noise Margin (WNM). Exemplary SRAM cells comprise a pair of storage nodes, a pair of bit lines, a pair of pull-up devices, a pair of pull-down devices and a pair of pass-gate devices. A first control signal and a second control signal are configured to adjust drive strengths of the pass-gate devices, and a third control signal is configured to adjust drive strengths of the pull-up devices, wherein the first control signal is routed orthogonal to a bit line direction, and the second and third control signals are routed in a direction same as the bit line direction. RSNM and WNM are improved by adjusting drive strengths of the pull-up and pass-gate devices during read and write operations. | 05-10-2012 |
Mohamed H. Abu-Rahma, San Diego, CA US
| Patent application number | Description | Published |
|---|---|---|
| 20090161413 | MRAM Device with Shared Source Line - In a particular embodiment, a memory device includes a first memory cell and a second memory cell. The memory device also includes a first bit line associated with the first memory cell and a second bit line associated with the second memory cell. The memory device also includes a source line coupled to the first memory cell and coupled to the second memory cell. | 06-25-2009 |
| 20110110174 | System and Method of Operating a Memory Device - A system and method of operating a memory device is disclosed. In a particular embodiment, an apparatus is disclosed that includes a bit cell coupled to a first bit line and to a second bit line. The apparatus also includes a sense amplifier coupled to the first bit line and to the second bit line. The apparatus includes a loop circuit configured to provide a sense amplifier enable signal to the sense amplifier in response to receiving a first signal. The apparatus also includes a wordline enable circuit configured to provide a wordline enable signal to a wordline driver in response to receiving a second signal. The loop circuit receives the first signal before the wordline enable circuit receives the second signal. | 05-12-2011 |
Mohamed Hassan Soliman Abu-Rahma, San Diego, CA US
| Patent application number | Description | Published |
|---|---|---|
| 20100142303 | Digitally-Controllable Delay for Sense Amplifier - Circuits, apparatuses, and methods of interposing a selectable delay in reading a magnetic random access memory (MRAM) device are disclosed. In a particular embodiment, a circuit includes a sense amplifier, having a first input, a second input, and an enable input. A first amplifier coupled to an output of a magnetic resistance-based memory cell and a second amplifier coupled to a reference output of the cell also are provided. The circuit further includes a digitally-controllable amplifier coupled to a tracking circuit cell. The tracking circuit cell includes at least one element that is similar to the cell of the magnetic resistance-based memory. The first input of the sense amplifier is coupled to the first amplifier, the second input of the sense amplifier is coupled to the second amplifier, and the enable input is coupled to the third digitally-controllable amplifier via a logic circuit. The sense amplifier may generate an output value based on the amplified values received from the output of the magnetic resistance-based memory cell and the reference cell once the sense amplifier receives an enable signal from the digitally-controllable amplifier via the logic circuit. | 06-10-2010 |
Mohamed R. Abu-Rahma, San Diego, CA US
| Patent application number | Description | Published |
|---|---|---|
| 20090154274 | Memory Read Stability Using Selective Precharge - A memory device utilizes selective precharge and charge sharing to reduce a bit line voltage before accessing a bit cell. A reduction in bit line voltage is achieved by precharging different sections of the bit line to different voltages (e.g., a supply voltage and ground) and using charge sharing between these sections. Read stability improves as a result of the reduction of bit line voltage. The relative capacitance difference between bit line sections determines the bit line voltage after charge sharing. Thus, the memory device is tolerant to process or temperature variations. The bit line voltage may be controlled in design by selecting the sections that are precharged to supply voltage or ground. | 06-18-2009 |