Inventors list |
Assignees list |
Classification tree browser |
Top 100 Inventors |
Top 100 Assignees |
Abbe
Francois Abbe, Martignas FR
| Patent application number | Description | Published |
|---|---|---|
| 20090205952 | ELECTROLYSIS INSTALLATION - The invention relates to an electrolysis installation comprising at least two rows of electrodes that are immersed at least in part in a liquid electrolyte giving off one or more gaseous species of corrosive nature at the electrodes, at least one separation membrane being disposed between two adjacent rows of electrodes. Each membrane is constituted by carbon fiber reinforcement stiffened by a carbon matrix and presents porous portion that is permeable to ions and impermeable to the or each gaseous species, given off at the electrolytes. | 08-20-2009 |
Makoto Abbe, Tsukuba JP
| Patent application number | Description | Published |
|---|---|---|
| 20110054835 | METHOD OF EVALUATING PRECISION OF OUTPUT DATA USING ERROR PROPAGATION - Method of evaluating precision of output data using error propagation includes performing numerical differentiation using input data in data processing, and thereby obtaining a Jacobian matrix J of the data processing; estimating variance-covariance of errors of the input data, and thereby obtaining an error matrix D of the input data; and calculating an error matrix from the Jacobian matrix J and the error matrix D of the input data, the error matrix R representing variance-covariance of errors of output data. | 03-03-2011 |
Makoto Abbe, Tsukuba-Shi JP
| Patent application number | Description | Published |
|---|---|---|
| 20080198387 | OPTICAL AXIS POLARIZATION TYPE LASER INTERFEROMETER - An optical axis polarization type laser interferometer including a reference sphere which forms a reference of measurement, a retro-reflecting means disposed at a measurement object, a laser interference measuring apparatus for outputting a measurement value corresponding to an increase or a decrease in the distance to and from the retro-reflecting means; and a two-axis turning mechanism for turning an emission beam of the corresponding laser interference measuring apparatus centering around the reference sphere, which measures, with the center coordinates of the reference sphere used as the reference, the distance to and from the retro-reflecting means where the optical axes of the emission beam from the laser interference measuring apparatus mounted on the two-axis turning mechanism and a return beam become parallel to each other, wherein the fixing portion of the first axis turning mechanism installed at the base part of the apparatus is disposed at the inner circumference thereof, the reference sphere is placed at the fixing portion thereof, and at the same time, the moving portion of the first axis turning mechanism is placed at the outer circumference of the fixing portion, and the second axis turning mechanism is mounted on the moving portion thereof. Therefore, complexities in mechanism design can be simplified to a large extent with respect to the first axis turning mechanism that composes the two-axis turning mechanism. | 08-21-2008 |
| 20080294364 | Two-dimensional lattice calibrating device, two-dimensional lattice calibrating method, two-dimensional lattice calibrating program and recording medium - A two-dimensional lattice calibrating device includes: a measuring unit that measures respective positions of marks for each of a plurality of measurement dispositions; a simultaneous-equations generating unit that generates simultaneous equations for acquiring deviations of the plurality of marks using a coordinate relational equation and a least-squares conditional equation that sets least-squares lines that minimize the deviation of actual position of the marks based on measurement values as coordinate axes of artifact coordinates; and a simultaneous-equations calculating unit that solves the derived simultaneous equations. | 11-27-2008 |