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Aalbert Stek

Aalbert Stek, Eindhoven NL

Patent application numberDescriptionPublished
20080225300Method of Measuring Relative Movement of an Object and an Optical Input Device Over a Range of Speeds - A method and optical module for measuring relative movement of an input device and object (09-18-2008
20080279025Electronic Circuit with Memory for Which a Threshold Level is Selected11-13-2008
20090212201METHOD OF MEASURING RELATIVE MOVEMENT IN TWO DIMENSIONS OF AN OBJECT AND AN OPTICAL INPUT DEVICE USING A SINGLE SELF-MIXING LASER - An optical input device for measuring relative movement between an object (08-27-2009
20110107111INFORMATION CARRIER COMPRISING ACCESS INFORMATION AND DUMMY INFORMATION - The invention relates to an information carrier for holding user information, the information carrier comprising access information for accessing the user information, the access information being stored in a pre-determined first region on the information carrier. The information carrier further comprises at least one further region different from the first region, the further region comprising dummy information.05-05-2011

Patent applications by Aalbert Stek, Eindhoven NL

Aalbert Stek, Emmen NL

Patent application numberDescriptionPublished
20090296531Methods of Calibrating a Clock Using Multiple Clock Periods with a Single Counter and Related Devices and Methods - A method of calibrating a first clock signal using a second clock signal and a plurality of calibration periods may include generating incremented counter values at a counter responsive to edges of the second clock signal. For at least two of the plurality of calibration periods, an initial incremented counter value from the counter may be stored in memory at an initial edge of the first clock signal for the respective calibration period, a final incremented counter value may be stored in memory at a final edge of the clock signal for the respective calibration period, and the at least two of the plurality of calibration periods may be overlapping with different initial and final edges of the first clock signal. For each of the plurality of calibration periods, a number of edges of the second clock signal occurring during the respective calibration period may be determined using the initial and final incremented counter values stored in memory. A relationship between the first and second clock signals may be determined using a sum of a number of edges of the second clock signal occurring during each of the plurality of calibration periods and using a sum of a number of first clock signal cycles occurring during each of the plurality of calibration periods.12-03-2009
20100098119LASER CONTROLLER - A controller (04-22-2010
20110087449Methods of Calibrating a Clock Using Multiple Clock Periods with a Single Counter and Related Devices and Methods - A method of calibrating a first clock signal using a second clock signal and a plurality of calibration periods may include generating incremented counter values at a counter responsive to edges of the second clock signal. For at least two of the plurality of calibration periods, an initial incremented counter value from the counter may be stored in memory at an initial edge of the first clock signal for the respective calibration period, a final incremented counter value may be stored in memory at a final edge of the clock signal for the respective calibration period, and the at least two of the plurality of calibration periods may be overlapping with different initial and final edges of the first clock signal. For each of the plurality of calibration periods, a number of edges of the second clock signal occurring during the respective calibration period may be determined using the initial and final incremented counter values stored in memory. A relationship between the first and second clock signals may be determined using a sum of a number of edges of the second clock signal occurring during each of the plurality of calibration periods and using a sum of a number of first clock signal cycles occurring during each of the plurality of calibration periods.04-14-2011

Patent applications by Aalbert Stek, Emmen NL