Robert Albert
Robert Albert Anderson, Walnut Creek, CA US
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20100072862 | Inertial sensor with dual cavity package and method of fabrication - Inertial sensor having a body with first and second cavities on opposite sides thereof, a sensing element in the first cavity, electronic circuitry in the second cavity, electrical conductors interconnecting the sensing element and the circuitry, and leads connected electrically to the circuitry and extending from the body for mounting the sensor and making connections with the circuitry. | 03-25-2010 |
20110010924 | Inertial sensor with dual cavity package and method of fabrication - Inertial sensor having a body with first and second cavities on opposite sides thereof, a sensing element in the first cavity, electronic circuitry in the second cavity, electrical conductors interconnecting the sensing element and the circuitry, and leads connected electrically to the circuitry and extending from the body for mounting the sensor and making connections with the circuitry. | 01-20-2011 |
Robert Albert Brown, Watford GB
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20130165018 | Wearable Garment and Its Use in Preventing Stretch Marks | 06-27-2013 |
Robert Albert Collamati, Webster, MA US
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20080197078 | Hplc Capillary Column Device - A high pressure liquid chromatography (HPLC) capillary column device, system and method for processing a HPLC sample with a cartridge housing a packed capillary column; at least one inlet connection to the capillary column for a sample fluid; and at least one outlet connection from the capillary column for the sample fluid. The outlet connection is able to accommodate either a spray tip for atomizing the sample fluid or a transport tube for transporting the sample fluid from a spray tip column to a spray tip. Inlet connections enable supply of electrical power to the capillary column through electrical connections disposed within the cartridge housing; and gas for evaporating the sample liquid is supplied to at least one outlet connection from the capillary column for the sample fluid through a gas supply line within the cartridge housing. The temperature of the sample liquid can be controlled through a heat connection. | 08-21-2008 |
Robert Albert Lammlein, Jr., Akron, OH US
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20090159182 | METHOD AND APPARATUS FOR BUILDING A PUNCTURE SEALANT PREASSEMBLED COMPONENT - A method and apparatus for making a preassembly of built in sealant useful in tire manufacturing. The method of making the preassembled sealant includes extruding a center strip and at least two axially outer strips of a sealant onto a first conveyor belt; wherein the center strip and the axially outer strips are in a side by side adjacent relationship. Conveying the center strip onto a second conveyor while the axially outer strips are conveyed on the first conveyor belt towards the end of the belt, wherein the center strip has two outer edges, wherein a divider strip is applied to each other edge in a continuous manner, wherein the center strip is then conveyed onto the axially outer strips and then stitched together forming a preassembled component. | 06-25-2009 |
20100154611 | TIRE COMPONENT CUTTER APPARATUS AND METHOD OF CUTTING - A method of cutting an elastomeric strip of material is described. The method includes the step of advancing a strip of material | 06-24-2010 |
Robert Albert Skulman, Fort Smith, AR US
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20150080181 | Systems and Methods for Deliberate Stride Over-Extension - A stretch stride system comprising a mat having a first stride pattern and a second stride pattern positioned thereon. The first stride pattern may include two or more step patterns spaced at a first interval. The second stride pattern may include two or more step pattern spaced at a second interval. The first interval and the second interval may be determined using different extended step lengths. | 03-19-2015 |
Robert Albert Tharaldsen, Sherman, CT US
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20100149548 | Reticle Inspection Systems and Method - A method and systems for reticle inspection. The method includes coherently illuminating surfaces of an inspection reticle and a reference reticle, applying a Fourier transform to scattered light from the illuminated surfaces, shifting the phase of the transformed light from the reference reticle such that a phase difference between the transformed light from the inspection reticle and the transformed light from the reference reticle is 180 degrees, combining the transformed light as an image subtraction, applying an inverse Fourier transform to the combined light, and detecting the combined light at a detector. An optical path length difference between two optical paths from the illumination source to the detector is less than a coherence length of the illumination source. The image detected by the detector represents a difference in amplitude and phase distributions of the reticles allowing foreign particles, defects, or the like, to be easily distinguished. | 06-17-2010 |
20110019173 | Diffraction Elements for Alignment Targets - A patterning device, including alignment targets having alignment features formed from a plurality of diffractive elements, each diffractive element including an absorber stack and a multi-layered reflector stack is provided. The diffractive elements are configured to enhance a pre-determined diffraction order used for pre-alignment and to diffract light in a pre-determined direction of a pre-alignment system when illuminated with light of a wavelength used for the pre-alignment. The diffractive elements may occupy at least half of an area of each alignment feature. The diffractive elements may be configured to enhance first or higher order diffractions, while substantially reducing zero | 01-27-2011 |
20120171600 | Time Differential Reticle Inspection - Disclosed are systems and methods for time differential reticle inspection. Contamination is detected by, for example, determining a difference between a first signature of at least a portion of a reticle and a second signature, produced subsequent to the first signature, of the portion of the reticle. | 07-05-2012 |
20120281197 | Holographic Mask Inspection System with Spatial Filter - Disclosed are apparatuses, methods, and lithographic systems for holographic mask inspection. A holographic mask inspection system ( | 11-08-2012 |