Bardos
Andras Bardos, Heiligenhaus DE
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20140196862 | Method for producing cast components for electrical applications - In a method for producing cast components for electrical applications, a hardenable aluminum alloy is melted and filled into a die casting mold. The melted aluminum alloy is cooled by the die casting mold that is comprised of a material that has a thermal conductivity causing the melted aluminium alloy to be cooled at a cooling rate of approximately ≧ | 07-17-2014 |
20150097463 | Stack of laminations and method for the production thereof - The stack of laminations consists of punched laminations ( | 04-09-2015 |
Gary M. Bardos, Remus, MI US
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20100096483 | Reducing machine rotor assembly and methods of constructing and operating the same - A fragmenting rotor assembly for comminuting waste wood and other fragmentable material. A hammer support is carried by a drive shaft driven in rotation about a longitudinal drive shaft axis. The hammer support projects radially relative to the drive shaft axis and includes a radially outer hammer head. A fragmenting knife is removably secured to the hammer head and has a reducing edge disposed in a radially outer cutting position. A deflecting member is carried by the drive shaft and has a radially outer end that deflects fragments away from at least a portion of the fragmenting knife. The hammer support and/or the deflecting member are carried by at least one rod of a plurality of circumferentially-spaced axially-extending rods that are carried on the drive shaft by axially-spaced rotor members. | 04-22-2010 |
Ladislav Bardos, Uppsala SE
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20140305795 | Magnetron Plasma Apparatus - A magnetron plasma apparatus boosted by hollow cathode plasma includes at least one electrically connected pair of a first hollow cathode plate and a second hollow cathode plate placed opposite to each other at a separation distance of at least 0.1 mm and having an opening following an outer edge of a sputter erosion zone on a magnetron target so that a magnetron magnetic field forms a perpendicular magnetic component inside a hollow cathode slit between plates and, wherein the plates and are connected to a first electric power generator together with the magnetron target to generate a magnetically enhanced hollow cathode plasma in at least one of a first working gas distributed in the hollow cathode slit and a second working gas admitted outside the slit in contact with a magnetron plasma generated in at least one of the first working gas and the second working gas. | 10-16-2014 |
Robert A. Bardos, New South Wales AU
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20110025839 | WAFER IMAGING AND PROCESSING METHOD AND APPARATUS | 02-03-2011 |
Robert A. Bardos, Surry Hills AU
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20130062536 | Illumination Systems and Methods for Photoluminescence Imaging of Photovoltaic Cells and Wafers - Methods are presented for analysing semiconductor materials ( | 03-14-2013 |
Robert A. Bardos, North Bondi AU
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20150323457 | WAFER IMAGING AND PROCESSING METHOD AND APPARATUS | 11-12-2015 |
Robert Andrew Bardos, Bronte AU
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20100025588 | DETERMINING DIFFUSION LENGTH OF MINORITY CARRIERS USING LUMINESCENCE | 02-04-2010 |
20140191776 | METHOD AND SYSTEM FOR TESTING INDIRECT BANDGAP SEMICONDUCTOR DEVICES USING LUMINESCENCE IMAGING - Embodiments of methods and systems for identifying or determining spatially resolved properties in indirect bandgap semiconductor devices such as solar cells are described. In one embodiment, spatially resolved properties of an indirect bandgap semiconductor device are determined by externally exciting the indirect bandgap semiconductor device to cause the indirect bandgap semiconductor device to emit luminescence ( | 07-10-2014 |
Robert Andrew Bardos, New South Wales AU
Patent application number | Description | Published |
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20090051914 | Method and System for Inspecting Indirect Bandgap Semiconductor Structure | 02-26-2009 |
20090206287 | METHOD AND SYSTEM FOR TESTING INDIRECT BANDGAP SEMICONDUCTOR DEVICES USING LUMINESCENCE IMAGING - Embodiments of methods and systems for identifying or determining spatially resolved properties in indirect bandgap semiconductor devices such as solar cells are described. In one embodiment, spatially resolved properties of an indirect bandgap semiconductor device are determined by externally exciting the indirect bandgap semiconductor device to cause the indirect bandgap semiconductor device to emit luminescence ( | 08-20-2009 |
20110117681 | THIN FILM IMAGING METHOD AND APPARATUS - Methods and apparatus are presented for monitoring the deposition and/or post-deposition processing of semiconductor thin films using photoluminescence imaging. The photoluminescence images are analysed to determine one or more properties of the semiconductor film, and variations thereof across the film. These properties are used to infer information about the deposition process, which can then be used to adjust the deposition process conditions and the conditions of subsequent processing steps. The methods and apparatus have particular application to thin film-based solar cells. | 05-19-2011 |
Robert Andrew Bardos, North Bondi AU
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20110188733 | Photovoltaic Cell Manufacturing - Disclosed is a method ( | 08-04-2011 |
20120033067 | Method and System for Inspecting Indirect Bandgap Semiconductor Structure | 02-09-2012 |
20120142125 | PHOTOLUMINESCENCE IMAGING SYSTEMS FOR SILICON PHOTOVOLTAIC CELL MANUFACTURING - A method of photoluminence (PL) imaging of a series of silicon wafers, the method including the step of: utilizing incident illumination of a wavelength greater than 808 nm. The present invention further provides a method of analysing silicon semiconductor material utilising various illumination, camera and filter combinations. In some embodiments the PL response is captured by a MOSIR camera. In another embodiment a camera is used to capture the entire PL response and a long pass filter is applied to block a portion of the signal reaching the camera/detector. | 06-07-2012 |
20120257044 | METHOD AND SYSTEM FOR INSPECTING INDIRECT BANDGAP SEMICONDUCTOR STRUCTURE | 10-11-2012 |
Robert Andrew Bardos, Surry Hills AU
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20130043405 | In-Line Photoluminescence Imaging of Semiconductor Devices - Methods and systems are presented for acquiring photoluminescence images ( | 02-21-2013 |
20150219560 | IN-LINE PHOTOLUMINESCENCE IMAGING OF SEMICONDUCTOR DEVICES - Methods and systems are presented for acquiring photoluminescence images ( | 08-06-2015 |