Duling
David Duling, Durham, NC US
Patent application number | Description | Published |
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20140059073 | Systems and Methods for Providing a Unified Variable Selection Approach Based on Variance Preservation - This disclosure describes a method, system and computer-program product for parallelized feature selection. The method, system and computer-program product may be used to access a first set of features, wherein the first set of features includes multiple features, wherein the features are characterized by a variance measure, and wherein accessing the first set of features includes using a computing system to access the features, determine components of a covariance matrix, the components of the covariance matrix indicating a covariance with respect to pairs of features in the first set, and select multiple features from the first set, wherein selecting is based on the determined components of the covariance matrix and an amount of the variance measure attributable to the selected multiple features, and wherein selecting the multiple features includes executing a greedy search performed using parallelized computation. | 02-27-2014 |
David Rawlins Duling, Durham, NC US
Patent application number | Description | Published |
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20100082469 | Constrained Optimized Binning For Scorecards - Computer-implemented systems and methods are provided for generating bins for a scorecard. An approximate set of bins is generated by applying an optimization model to binning data. The optimization model includes an objective function, constraints, and surrogate weight of evidence metric(s). The approximated set of bins are then used in scorecard operations. | 04-01-2010 |
20100153456 | Computer-Implemented Systems And Methods For Variable Clustering In Large Data Sets - Computer-implemented systems and methods are provided for creating a cluster structure from a data set containing input variables. Global clusters are created within a first stage, by computing a similarity matrix from the data set. A global cluster structure and sub-cluster structure are created within a second stage, where the global cluster structure and the sub-cluster structure are created using a latent variable clustering technique and the cluster structure output is generated by combining the created global cluster structure and the created sub-cluster structure. | 06-17-2010 |
20120310939 | Systems And Methods For Clustering Time Series Data Based On Forecast Distributions - In accordance with the teachings described herein, systems and methods are provided for clustering time series based on forecast distributions. A method for clustering time series based on forecast distributions may include: receiving time series data relating to one or more aspects of a physical process; applying a forecasting model to the time series data to generate forecasted values and confidence intervals associated with the forecasted values, the confidence intervals being generated based on distribution information relating to the forecasted values; generating a distance matrix that identifies divergence in the forecasted values, the distance matrix being generated based the distribution information relating to the forecasted values; and performing a clustering operation on the plurality of forecasted values based on the distance matrix. The distance matrix may be generated using a symmetric Kullback-Leibler divergence algorithm. | 12-06-2012 |
Irl Duling, Ann Arbor, MI US
Patent application number | Description | Published |
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20120304756 | SYSTEM AND METHOD FOR DETECTION AND MEASUREMENT OF INTERFACIAL PROPERTIES IN SINGLE AND MULTILAYER OBJECTS - A system for determining a material property at an interface between a first layer and a second layer includes a transmitter outputting electromagnetic radiation to the sample, a receiver receiving electromagnetic radiation that was reflected by or transmitted though the sample, and a data acquisition device. The data acquisition device is configured to digitize the electro-magnetic radiation reflected by or transmitted though the sample to yield waveform data, wherein the waveform data represents the radiation reflected by or transmitted though the sample, the waveform data having a first magnitude, a second magnitude and a third magnitude. The material property to be determined is generally the adhesive strength between the first and second layers. | 12-06-2012 |