Patent application number | Description | Published |
20110290090 | ROBOT SYSTEM AND METHOD OF MANUFACTURING PROCESSED PRODUCT - To automatically perform an attachment work of a material supply to a target object, a robot system includes a robot provided with a body, a first arm provided for the body and having a plurality of joints, a second arm provided for the body separately from the first arm and having a plurality of joints, and hand units respectively provided for the first arm and the second arm. The robot holds one of a plurality of types of workpiece components using the hand units of the first arm and the second arm at the same time, and the remaining type of the workpiece components is held and carried by the hand unit of the first arm or the second arm. | 12-01-2011 |
20120228892 | AUTOMATIC WORKING DEVICE - An automatic working device according to an aspect of an embodiment includes a robot hand and a determining unit. The robot hand grips a target workpiece. The determining unit determines the type of the workpiece on the basis of a gripping operation for making the robot hand grip a gripped piece that indicates the type of the workpiece provided in a supply vessel that supplies the workpiece to the robot hand. | 09-13-2012 |
20130110275 | ROBOT SYSTEM AND METHOD OF MANUFACTURING WORKPIECE | 05-02-2013 |
20130133189 | ROBOT SYSTEM AND METHOD OF MANUFACTURING WORKPIECE - A robot system according to an aspect of an embodiment includes a supply unit and a robot. The supply unit is fixedly provided at a predetermined position to supply a feed material that is used for processing a workpiece. The robot transfers the unprocessed workpiece handed from an operator at a predetermined transfer position to the vicinity of the supply unit to process the workpiece by using the feed material supplied from the supply unit and then transfers the processed workpiece to the transfer position. | 05-30-2013 |
20140115863 | ROBOT SYSTEM AND METHOD OF MANUFACTURING PROCESSED PRODUCT - To automatically perform an attachment work of a material supply to a target object, a robot system includes a robot provided with a body, a first arm provided for the body and having a plurality of joints, a second arm provided for the body separately from the first arm and having a plurality of joints, and hand units respectively provided for the first arm and the second arm. The robot holds one of a plurality of types of workpiece components using the hand units of the first arm and the second arm at the same time, and the remaining type of the workpiece components is held and carried by the hand unit of the first arm or the second arm. | 05-01-2014 |
20150032243 | ROBOT SYSTEM - A robot system according to an aspect of the embodiment includes at least one robot, a transporter, and a controller. The robot performs multi-axial operation based on an operation instruction by the controller. The transporter has a pair of guides arranged parallel to each other along a predetermined transport direction, the guides having a variable spacing therebetween, transports a workpiece to a working position of the robot while restricting the movement of the workpiece present in an area between the pair of guides toward the direction of the spacing, and sandwiches and holds the workpiece by the pair of guides at the working position. The controller instructs the robot to perform the operation to apply predetermined processing to the workpiece held at the working position. | 01-29-2015 |
20150039126 | ROBOT SYSTEM - A robot system according to an aspect of the present embodiment includes a robot (a first robot) and a controller. The robot has a robot hand (hand) equipped with one set of gripping claws that grips a tape member stuck on a workpiece to be processed. The controller instructs the robot to perform operation of peeling off the tape member while gripping the end of the tape member with the gripping claws. | 02-05-2015 |
Patent application number | Description | Published |
20110013461 | NON-VOLATILE SEMICONDUCTOR STORAGE DEVICE - For data erase from an electrically erasable and programmable non-volatile memory cell, the following operations are performed: an erase operation to apply an erase pulse voltage to a memory cell for data erase, an erase verify operation to verify whether data erase is completed, and a step-up operation to increase the erase pulse voltage by a certain step-up voltage if data erase is not completed. A control unit controls voltages so that at least a first erase pulse voltage initially generated in the erase operation has a longer rise time than that of a second erase pulse voltage generated subsequent to the first erase pulse voltage. | 01-20-2011 |
20110063917 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE - A nonvolatile semiconductor memory device includes a control circuit configured to control a soft program operation of setting nonvolatile memory cells to a first threshold voltage distribution state of the nonvolatile memory cells. When a characteristic of the nonvolatile memory cells is in a first state, the control circuit executes the soft program operation by applying a first voltage for setting the nonvolatile memory cells to the first threshold voltage distribution state to first word lines, and applying a second voltage higher than the first voltage to a second word line. When the characteristic of the nonvolatile memory cells is in a second state, the control circuit executes the soft program operation by applying a third voltage equal to or lower than the first voltage to the first word lines and applying a fourth voltage lower than the second voltage to the second word line. | 03-17-2011 |
20110228608 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE - According to one embodiment, a nonvolatile semiconductor memory device comprises a first memory cell, a second memory cell, and a control circuit. The first memory cell is connected to a first word line. The second memory cell is connected to a second word line which is adjacent to the first word line and has a width different from a width of the first word line. The control circuit applies a first voltage to the first word line and a second voltage different from the first voltage to the second word line. At least one of the first voltage and the second voltage is corrected by the control circuit based on write loop counts of the first memory cell and the second memory cell when the first memory cell and the second memory cell are write target cells in a write operation. | 09-22-2011 |
20120069672 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND OPERATING METHOD THEREOF - A nonvolatile semiconductor memory device in accordance with an embodiment includes a memory cell array. A control unit performs control of repeating a write operation, a write verify operation, and a step-up operation, the write operation being an operation to apply a write pulse voltage to a selected memory cell and an intermediate voltage to an unselected memory cell. The control unit controls the step-up operation such that, in a first period, the intermediate voltage is maintained at a constant value, and, in a second period, the intermediate voltage is raised by a certain value. The control unit controls the step-up operation such that the first period includes an operation to raise the write pulse voltage by a first step-up value, and the second period includes an operation to raise the write pulse voltage by a second step-up value smaller than the first step-up value. | 03-22-2012 |
20120072648 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE - A nonvolatile semiconductor memory device in accordance with an embodiment includes: a memory cell array having electrically rewritable nonvolatile memory cells; and a control unit. The control unit performs control of repeating a write operation, a write verify operation, and a step-up operation, the write verify operation being an operation to verify whether data write is completed or not, and the step-up operation being an operation to raise the write pulse voltage if data write is not completed. The control unit, during the write operation, raises a first write pulse voltage with a first gradient, and then raises a second write pulse voltage with a second gradient, thereby executing the write operation, the first write pulse voltage including at least a write pulse voltage generated at first, the second write pulse voltage being generated after the first write pulse voltage, and the second gradient being larger than the first gradient. | 03-22-2012 |
20120106257 | NON-VOLATILE SEMICONDUCTOR STORAGE DEVICE - For data erase from an electrically erasable and programmable non-volatile memory cell, the following operations are performed: an erase operation to apply an erase pulse voltage to a memory cell for data erase, an erase verify operation to verify whether data erase is completed, and a step-up operation to increase the erase pulse voltage by a certain step-up voltage if data erase is not completed. A control unit controls voltages so that at least a first erase pulse voltage initially generated in the erase operation has a longer rise time than that of a second erase pulse voltage generated subsequent to the first erase pulse voltage. | 05-03-2012 |
20120206968 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE - A nonvolatile semiconductor memory device includes a control circuit configured to control a soft program operation of setting nonvolatile memory cells to a first threshold voltage distribution state of the nonvolatile memory cells. When a characteristic of the nonvolatile memory cells is in a first state, the control circuit executes the soft program operation by applying a first voltage for setting the nonvolatile memory cells to the first threshold voltage distribution state to first word lines, and applying a second voltage higher than the first voltage to a second word line. When the characteristic of the nonvolatile memory cells is in a second state, the control circuit executes the soft program operation by applying a third voltage equal to or lower than the first voltage to the first word lines and applying a fourth voltage lower than the second voltage to the second word line. | 08-16-2012 |
20120206972 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE - A control circuit executes an erase operation that includes an erase pulse application operation and an erase verify operation. The erase pulse application operation applies an erase pulse voltage to a memory cell to change the memory cell from a write state to an erase state. The erase verify operation applies an erase verify voltage to the memory cell to judge whether the memory cell is in the erase state or not. The control circuit changes conditions of execution of the erase verify operation when the number of times of executions of the erase pulse application operation in one erase operation reaches a first number. | 08-16-2012 |
20120257453 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE - A nonvolatile semiconductor memory device according to one embodiment of the present invention includes: a memory cell array and a control circuit. The control circuit executes a first reading operation and a second reading operation. The first reading operation is an operation of reading a threshold voltage set in the selected memory cell by setting a voltage between a control gate electrode and source of the selected memory cell to a first value. The second reading operation is an operation of reading a threshold voltage set in the selected memory cell by setting a voltage between the control gate electrode and source of the selected memory cell to a second value lower than the first value. When executing the second reading operation, the control circuit keeps a voltage of the control gate electrode of the selected memory cell to 0 or a positive value. | 10-11-2012 |
20120269001 | NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE - A non-volatile semiconductor memory device according to one embodiment of the present invention includes a memory cell array and a control unit. The control unit is configured to control a repeat of an erase operation, an erase verify operation, and a step-up operation. The control unit is configured to perform a soft-programming operation of setting the memory cells from an over-erased state to a first threshold voltage distribution state when, in a series of erase operations, the number of erase voltage applications is more than a first number and less than a second number (the first number10-25-2012 | |
20120281477 | SEMICONDUCTOR MEMORY DEVICE - According to one embodiment, a semiconductor memory device includes a memory cell array includes a plurality of cell units each composed of a plurality of memory cells which are arranged at intersections of a plurality of bit lines and a plurality of word lines and whose current paths are connected in series and select transistors each connected to either end of the series connection, a voltage generator circuit which generates a voltage applied to the memory cell array, and a control circuit which controls the memory cell array and the voltage generator circuit. | 11-08-2012 |
20120281487 | SEMICONDUCTOR MEMORY DEVICE AND METHOD OF CONTROLLING THE SAME - According to one embodiment, a semiconductor memory device includes a memory cell array includes a plurality of memory cell units which are arranged at intersections of a plurality of bit lines and a plurality of word lines and whose current paths are connected in series, a voltage generator circuit which generates a voltage to be applied to the memory cell array, and a control circuit which controls the memory cell array and the voltage generator circuit. The control circuit, when writing data into the memory cell array, performs control so as to apply a first write pass voltage to unselected word lines in the memory cell units and, after a selected word line has reached a write voltage, further apply a voltage to the unselected word lines until a second write pass voltage higher than the first write pass voltage has been reached. | 11-08-2012 |
20130043523 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME - According to one embodiment, a nonvolatile semiconductor memory device includes a plurality of gate electrode structures formed on a semiconductor substrate and an insulating film which covers the gate electrode structures and has an air gap in it. Each of the gate electrode structures includes a gate insulting film, a charge storage layer, an intermediary insulating film, and a control gate electrode. The control gate electrode includes a first control gate and a second control gate whose width is greater than that of the first control gate. The air gap is formed so as to be higher than a space between the control gate electrodes and than the control gate electrodes. | 02-21-2013 |
20130058170 | NONVOLATILE SEMICONDUCTOR STORAGE DEVICE - A nonvolatile semiconductor storage device according to an embodiment includes a drive circuit. A voltage applied to a dummy wire connected to a first dummy cell adjacent to a memory string is defined as a first dummy wire voltage, a voltage applied to a selection wire connected to a first memory cell adjacent to the first dummy cell is defined as a first selection wire voltage, and a voltage applied to a selection wire connected to a second memory cell adjacent to the first memory cell is defined as a second selection wire voltage. When the second selection wire voltage is lower than the first dummy wire voltage in an erase operation, the drive circuit controls voltages so that a difference between the first dummy wire voltage and the second selection wire voltage is less than a difference between the first dummy wire voltage and the first selection wire voltage. | 03-07-2013 |
20130058171 | SEMICONDUCTOR STORAGE DEVICE - A semiconductor storage device has a plurality of memory cells each having a control gate that are formed on a well. The semiconductor storage device has a control circuit that applies a voltage to the well and the control gates. | 03-07-2013 |
20130135939 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE - A nonvolatile semiconductor memory device according to one embodiment of the present invention includes: a memory cell array and a control circuit. The control circuit executes a first reading operation and a second reading operation. The first reading operation is an operation of reading a threshold voltage set in the selected memory cell by setting a voltage between a control gate electrode and source of the selected memory cell to a first value. The second reading operation is an operation of reading a threshold voltage set in the selected memory cell by setting a voltage between the control gate electrode and source of the selected memory cell to a second value lower than the first value. When executing the second reading operation, the control circuit keeps a voltage of the control gate electrode of the selected memory cell to 0 or a positive value. | 05-30-2013 |
20130229873 | NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE - A non-volatile semiconductor memory device according to one embodiment of the present invention includes a memory cell array and a control unit. The control unit is configured to control a repeat of an erase operation, an erase verify operation, and a step-up operation. The control unit is configured to perform a soft-programming operation of setting the memory cells from an over-erased state to a first threshold voltage distribution state when, in a series of erase operations, the number of erase voltage applications is more than a first number and less than a second number (the first number09-05-2013 | |
20130301359 | NON-VOLATILE SEMICONDUCTOR STORAGE DEVICE - For data erase from an electrically erasable and programmable non-volatile memory cell, the following operations are performed: an erase operation to apply an erase pulse voltage to a memory cell for data erase, an erase verify operation to verify whether data erase is completed, and a step-up operation to increase the erase pulse voltage by a certain step-up voltage if data erase is not completed. A control unit controls voltages so that at least a first erase pulse voltage initially generated in the erase operation has a longer rise time than that of a second erase pulse voltage generated subsequent to the first erase pulse voltage. | 11-14-2013 |
20140050027 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE - A nonvolatile semiconductor memory device includes a control circuit configured to control a soft program operation of setting nonvolatile memory cells to a first threshold voltage distribution state of the nonvolatile memory cells. When a characteristic of the nonvolatile memory cells is in a first state, the control circuit executes the soft program operation by applying a first voltage for setting the nonvolatile memory cells to the first threshold voltage distribution state to first word lines, and applying a second voltage higher than the first voltage to a second word line. When the characteristic of the nonvolatile memory cells is in a second state, the control circuit executes the soft program operation by applying a third voltage equal to or lower than the first voltage to the first word lines and applying a fourth voltage lower than the second voltage to the second word line. | 02-20-2014 |
20140085988 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE - A nonvolatile semiconductor memory device according to one embodiment of the present invention includes: a memory cell array and a control circuit. The control circuit executes a first reading operation and a second reading operation. The first reading operation is an operation of reading a threshold voltage set in the selected memory cell by setting a voltage between a control gate electrode and source of the selected memory cell to a first value. The second reading operation is an operation of reading a threshold voltage set in the selected memory cell by setting a voltage between the control gate electrode and source of the selected memory cell to a second value lower than the first value. When executing the second reading operation, the control circuit keeps a voltage of the control gate electrode of the selected memory cell to 0 or a positive value. | 03-27-2014 |
20140254282 | NON-VOLATILE SEMICONDUCTOR STORAGE DEVICE - For data erase from an electrically erasable and programmable non-volatile memory cell, the following operations are performed: an erase operation to apply an erase pulse voltage to a memory cell for data erase, an erase verify operation to verify whether data erase is completed, and a step-up operation to increase the erase pulse voltage by a certain step-up voltage if data erase is not completed. A control unit controls voltages so that at least a first erase pulse voltage initially generated in the erase operation has a longer rise time than that of a second erase pulse voltage generated subsequent to the first erase pulse voltage. | 09-11-2014 |
20140286100 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE - A nonvolatile semiconductor memory device includes a control circuit configured to control a soft program operation of setting nonvolatile memory cells to a first threshold voltage distribution state of the nonvolatile memory cells. When a characteristic of the nonvolatile memory cells is in a first state, the control circuit executes the soft program operation by applying a first voltage for setting the nonvolatile memory cells to the first threshold voltage distribution state to first word lines, and applying a second voltage higher than the first voltage to a second word line. When the characteristic of the nonvolatile memory cells is in a second state, the control circuit executes the soft program operation by applying a third voltage equal to or lower than the first voltage to the first word lines and applying a fourth voltage lower than the second voltage to the second word line. | 09-25-2014 |
Patent application number | Description | Published |
20090230450 | NON-VOLATILE SEMICONDUCTOR STORAGE DEVICE - A non-volatile semiconductor storage device includes: a memory cell area in which a plurality of electrically rewritable memory cells are formed; and a peripheral circuit area in which transistors that configure peripheral circuits to control the memory cells are formed. The memory cell area has formed therein: a semiconductor layer formed to extend in a vertical direction to a semiconductor substrate; a plurality of conductive layers extending in a parallel direction to, and laminated in a vertical direction to the semiconductor substrate; and a property-varying layer formed between the semiconductor layer and the conductive layers and having properties varying depending on a voltage applied to the conductive layers. The peripheral circuit area has formed therein a plurality of dummy wiring layers that are formed on the same plane as each of the plurality of conductive layers and that are electrically separated from the conductive layers. | 09-17-2009 |
20100246255 | NONVOLATILE SEMICONDUCTOR STORAGE DEVICE AND METHOD FOR CONTROLLING THE SAME - A nonvolatile semiconductor storage device includes a memory cell array and a peripheral circuit. The memory cell array includes active areas extending in a first direction, a dummy active area extending in the first direction, memory cells on the plurality of active areas, first dummy cells on the dummy active area, diffusion layer areas each connected to the corresponding memory cell and the corresponding first dummy cell, first contacts in the respective active areas, and a second contact in the dummy active area. The peripheral circuit includes a voltage applying unit configured to apply to each of the first contacts a first voltage to set each of the memory cells in a write enable state or a second voltage to set the memory cells in a write inhibit state, and to apply to the second contact a third voltage to change a threshold of the dummy cell. | 09-30-2010 |
20130077409 | NONVOLATILE SEMICONDUCTOR STORAGE DEVICE - A nonvolatile semiconductor storage device according to an embodiment includes: a memory cell array including plural memory cells; and a control circuit that repeatedly performs a write loop including a program operation and a verify operation in data write performed to the memory cell, the verify operation including a preverify step to check whether a threshold voltage of the memory cell transitions to a preverify voltage, and a real verify step to check whether the threshold voltage of the memory cell transitions to the real verify voltage, the write loop including one or at least two verify operations corresponding to pieces of the data, the control circuit performing the write loop in which the preverify step of the verify operation corresponding to a first data is omitted after obtaining a first condition. | 03-28-2013 |
20130148430 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE - A non-volatile semiconductor memory device according to one embodiment includes: a cell array; and a data writing unit that repeatedly executes a write loop including a programming operation of applying a program voltage to a selected word line and a passage voltage to non-selected word lines during writing of data, in which, when a difference between the passage voltage used in an n-th write loop and the passage voltage used in an n+1-th write loop is expressed as ΔVn and when a condition of L06-13-2013 | |
20130329495 | SEMICONDUCTOR MEMORY AND SEMICONDUCTOR MEMORY CONTROL METHOD - According to one embodiment, a semiconductor memory includes memory cells, word lines connected to gate of memory cells arranged in a row direction, a control circuit which controls the operation of the memory cells. During k-level data writing to a selected cell, the control circuit applies the corrected unselect voltage in accordance with the result of the reading of data from the unselected cell connected to the adjacent word line to the adjacent word line and applies a read voltage to the selected word line to read (k−1)-level data from the selected cell, and the control circuit writes data to the selected cell in accordance with the read (k−1)-level and the k-level data to be written. | 12-12-2013 |
20140241058 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF CONTROLLING SAME - According to an embodiment, a semiconductor memory device includes a memory cell array and a control circuit. The memory cell array comprises a plurality of memory cells that each include a control gate and a charge accumulation layer and that each are configured to have a threshold set to be included in any of a plurality of threshold distributions, the memory cell being connected between a bit line and a source line. The control circuit, in at least one of a write verify operation and a read operation on a selected memory cell, applies to the control gate a control gate voltage to determine the threshold of the selected memory cell, the control gate voltage having a plurality of values respectively corresponded to the plurality of threshold distributions, and sets a voltage between the bit line and the source line based on the control gate voltage. | 08-28-2014 |
20140340964 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE - According to one embodiment, a nonvolatile semiconductor memory device includes a memory cell array and a control circuit configured to repeat a program operation and a verify operation. The control circuit performs a first verify operation of sensing whether threshold voltages of selected memory cells are greater than or equal to a first threshold voltage, and a second verify operation of sensing whether the threshold voltages of the selected memory cells are greater than or equal to a second threshold voltage (first threshold voltage11-20-2014 | |
20150070986 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE - A nonvolatile semiconductor memory device according to an embodiment includes: a memory cell array configured having NAND strings arranged therein; a plurality of word lines; a plurality of bit lines; a source line; and a control circuit configured to apply a verify voltage to a selected word line, apply a read pass voltage that renders conductive an unselected memory cell regardless of cell data to an unselected word line, and apply a bit line voltage of a certain value to a selected bit line, thereby executing a write verify operation that determines whether a selected memory cell has a desired threshold voltage or not. The control circuit is configured capable of changing a voltage value of the bit line voltage based on a position of the selected word line among the plurality of word lines relative to the NAND string. | 03-12-2015 |