Patent application number | Description | Published |
20100049466 | Tracking Thermal Mini-Cycle Stress - Monitoring temperature excursions an assembly experiences over a life of the assembly is provided. A determination is made as to whether the assembly has been in service beyond a predetermined end of life objective. Responsive to the assembly failing to be in service beyond the predetermined end of life objective, a new temperature value associated with the assembly is read. A modifier value for a figure of merit (FOM) value is computed and added to a cumulative figure of merit value. The cumulative figure of merit value is compared to a cumulative stress figure of merit budget. Responsive to the cumulative figure of merit value exceeding the cumulative stress figure of merit budget, an identified stress management solution is implemented. | 02-25-2010 |
20100049995 | Enhanced Thermal Management for Improved Module Reliability - Mitigating effects of delamination of components in the data processing system is provided. A signal is received from one or more sensors in the data processing system. A determination is made as to whether the signal indicates that one threshold in a plurality of thresholds has been reached or exceeded. Responsive to the signal indicating that one threshold in the plurality of thresholds has been reached or exceeded, a determination is made as to whether the one threshold is a low temperature threshold or a high temperature threshold. Responsive to the one threshold being a low temperature threshold, one of a plurality of actions is initiated to increase a temperature of the data processing system thereby mitigating effects of delamination of the components in the data processing system. | 02-25-2010 |
20100094572 | Dynamic Frequency And Voltage Scaling For A Computer Processor - Methods, apparatus, and computer program products are described for dynamic frequency and voltage scaling for a computer processor, including identifying during manufacture a nominal operating point of frequency and voltage for a computer processor, the nominal operating point including a nominal operating voltage identified for a design nominal operating frequency; determining, in dependence upon the nominal operating point, an operating range of frequency and voltage over which the computer processor is to function; and storing, in non-volatile storage on the computer processor during manufacture, information specifying the nominal operating point and the operating range. | 04-15-2010 |
20100125436 | Identifying Deterministic Performance Boost Capability of a Computer System - A benchmark tester retrieves a voltage margin that corresponds to a device that a system includes. The voltage margin indicates an additional amount of voltage to apply to a nominal voltage that, when added, results in the device operating at a power limit while executing a worst-case power workload. Next, the benchmark tester (or thermal power management device) sets an input voltage for the device to a value equal to the sum of the voltage margin and the nominal voltage. The benchmark tester then dynamically benchmark tests the system, which includes adjusting the device's frequency and input voltage while ensuring that the device does not exceed the device's power limit. In turn, the benchmark tester records a guaranteed minimum performance boost for the system based upon a result of the benchmark testing. | 05-20-2010 |
20100268968 | MANAGING PROCESSOR POWER-PERFORMANCE STATES - Disclosed are systems, methods, and computer program products for managing power states in processors of a data processing system. In one embodiment, the invention is directed to a data processing system having dynamically configurable power-performance states (“pstates”). The data processing system includes a processor configured to operate at multiple states of frequency and voltage. The data processing system also has a power manager module configured to monitor operation of the data processing system. The data processing system further includes a pstates table having a plurality of pstate definitions, wherein each pstate definition includes a voltage value, a frequency value, and at least one unique pointer that indicates a transition from a given pstate to a different pstate. The voltage value, frequency value, and unique pointer of a given pstate definition are configurable, during operation of the data processing system, by the power manager module in response to changes in the operating parameters of the data processing system. | 10-21-2010 |
20120198255 | ESTABLISHING AN OPERATING RANGE FOR DYNAMIC FREQUENCY AND VOLTAGE SCALING - During manufacture, an operating range for dynamic voltage and frequency scaling can be established. A nominal operating point is identified based on a design nominal operating frequency for a computer processor. The nominal operating point comprises a nominal operating voltage identified for the design nominal operating frequency. In dependence upon the nominal operating point, an operating range of frequency and voltage over which the computer processor is to function is determined. Information specifying the nominal operating point and the operating range is stored in non-volatile storage associated with the computer processor. | 08-02-2012 |
Patent application number | Description | Published |
20080209243 | Scheduling processor voltages and frequencies based on performance prediction and power constraints - A power management system schedules the voltage and frequency of processors in a data processing system based on two criteria. The first criterion is a prediction of the performance that the work currently running on the processor will experience at the different frequencies that are available. The second criterion is a system-wide constraint on the total power budget allocated to processors. Based on these criteria, low-level code sets the frequency and voltage of the processors in the system to match what the operating system is currently running on them. | 08-28-2008 |
20080300817 | SENSOR SUBSET SELECTION FOR REDUCED BANDWIDTH AND COMPUTATION REQUIREMENTS - A system for identifying a subset of sensors to sample to reduce the frequency of sensor access. The system determines rise times and records values for the sensors in the system. A time criticality of the sensors is determined based on the rise times. The system processes the sensors by first creating sensor subsets based on one or more constraints on the sensors. The system monitors the values of the sensors in a sensor subset and flags a sensor when it makes a determination that, prior to a next scheduled sampling of the sensor subset, the value of a sensor in the monitored sensor subset will exceed a threshold constraint. The system moves those flagged sensors to a second sensor subset which complies with the sensor's constraints. | 12-04-2008 |
20080307238 | System for Unified Management of Power, Performance, and Thermals in Computer Systems - A system is provided for unified management of power, performance, and thermals in computer systems. This system incorporates elements to effectively address all aspects of managing computing systems in an integrated manner, instead of independently. The system employs an infrastructure for real-time measurements feedback, an infrastructure for regulating system activity, component operating levels, and environmental control, a dedicated control structure for guaranteed response/preemptive action, and interaction and integration components. The system provides interfaces for user-level interaction. The system also employs methods to address power/thermal concerns at multiple timescales. In addition, the system improves efficiency by adopting an integrated approach, rather than treating different aspects of the power/thermal problem as individual issues to be addressed in a piecemeal fashion. | 12-11-2008 |
20090099817 | Sensor Subset Selection for Reduced Bandwidth and Computation Requirements - A system for identifying a subset of sensors to sample to reduce the frequency of sensor access. The system determines rise times and records values for the sensors in the system. A time criticality of the sensors is determined based on the rise times. The system processes the sensors by first creating sensor subsets based on one or more constraints on the sensors. The system monitors the values of the sensors in a sensor subset and flags a sensor when it makes a determination that, prior to a next scheduled sampling of the sensor subset, the value of a sensor in the monitored sensor subset will exceed a threshold constraint. The system moves those flagged sensors to a second sensor subset which complies with the sensor's constraints. | 04-16-2009 |