Pryce
Andrew Pryce, Bicester GB
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20120008148 | VEHICLE TYRE MEASUREMENT - An apparatus measures the tread of a tyre on a vehicle, in which a laser line generator ( | 01-12-2012 |
Daniel James Pryce, Redcliffe AU
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20120279936 | DIVE GEAR STAND - A dive gear stand ( | 11-08-2012 |
Imogen Pryce, Santa Monica, CA US
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20120154793 | Tunable compliant optical metamaterial structures - A tunable metamaterial structure, comprises a flexible substrate capable of being strained, a metamaterial pattern on a surface of the flexible substrate, and a metal layer on the metamaterial pattern. The flexible substrate of the tunable metamaterial structure is a strained and relaxed substrate which has been strained to a degree sufficient to register a resonant response upon relaxation that is shifted relative to the resonant response of the flexible substrate prior to being strained. The application of strain to the flexible substrate of the metamaterial structure enables tuning of the resonant frequency. | 06-21-2012 |
20130155484 | PLASMONIC MODULATOR INCORPORATING A SOLID-STATE PHASE CHANGE MATERIAL - Systems and methods are provided for modulating light of a wavelength of interest. The modulator assembly includes a plasmonic layer that supports surface plasmon polaritons at the wavelength of interest and a layer of solid-state phase change material having a first phase in which it is substantially transparent to light of the wavelength of interest and a second phase in which it is substantially opaque to light of the wavelength of interest. A control mechanism is configured to alter the phase of the solid-state phase change material between the first phase and the second phase. Each of the plasmonic layer and the layer of solid-state phase change material are configured as to provide a plasmonic mode of transmission for light of the wavelength of interest. | 06-20-2013 |
Jonathan David Godfree Pryce, Broadstone GB
Patent application number | Description | Published |
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20100023294 | AUTOMATED TEST SYSTEM AND METHOD - An efficient automated testing system and method are presented. In one embodiment, an automated testing system includes a control component and an automated test instrument for testing a device or a plurality of devices (e.g., packages or wafers containing multiple independent different devices) under test. The automated test instrument component performs testing operation on the device or devices under test (DUT). The control component manages testing activities of a test instrument testing the device under test, including managing implementation of a plurality of test programs loaded as a group. In one exemplary implementation, the automated test system also includes a DUT interface and a user interface. The device under test interface interfaces with a device or devices under test. | 01-28-2010 |