Patent application number | Description | Published |
20090025561 | CONTAMINANT CONTROL FILTER WITH FILL PORT - Filters, methods, and an apparatus for filling housings and both encapsulated porous and non-porous spaces with contaminant control media for placement in electronic enclosures, such as disk drive enclosures, are disclosed. In one embodiment, a filter assembly includes a housing comprising an internal cavity configured to receive contaminant control media, a fill port in communication with the internal cavity, and an opening in communication with the internal cavity, and filter media at least partially covering the opening; and contaminant control media occupying the internal cavity. Contaminant control media is deposited within the internal cavity via the fill port by means of creating a negative pressure within the internal cavity. The application of a partial vacuum facilitates movement of the contaminant control media into the internal cavity and minimizes the contamination of the filter, housing, and work space common to other loose fill filling methods. Other aspects and embodiments are provided herein. | 01-29-2009 |
20120118158 | CONTAMINANT CONTROL FILTER WITH FILL PORT - Filters, methods, and an apparatus for filling housings and both encapsulated porous and non-porous spaces with contaminant control media for placement in electronic enclosures, such as disk drive enclosures, are disclosed. In one embodiment, a filter assembly includes a housing comprising an internal cavity configured to receive contaminant control media, a fill port in communication with the internal cavity, and an opening in communication with the internal cavity, and filter media at least partially covering the opening; and contaminant control media occupying the internal cavity. Contaminant control media is deposited within the internal cavity via the fill port by means of creating a negative pressure within the internal cavity. The application of a partial vacuum facilitates movement of the contaminant control media into the internal cavity and minimizes the contamination of the filter, housing, and work space common to other loose fill filling methods. | 05-17-2012 |
Patent application number | Description | Published |
20120273677 | IN-COLUMN DETECTOR FOR PARTICLE-OPTICAL COLUMN - The invention relates to an in-column back-scattered electron detector, the detector placed in a combined electrostatic/magnetic objective lens for a SEM. The detector is formed as a charged particle sensitive surface, preferably a scintillator disk that acts as one of the electrode faces forming the electrostatic focusing field. The photons generated in the scintillator are detected by a photon detector, such as a photo-diode or a multi-pixel photon detector. The objective lens may be equipped with another electron detector for detecting secondary electrons that are kept closer to the axis. A light guide may be used to offer electrical insulation between the photon detector and the scintillator. | 11-01-2012 |
20140070098 | Method of Using a Compound Particle-Optical Lens - The invention relates to a compound objective lens for a Scanning Electron Microscope having a conventional magnetic lens excited by a first lens coil, an immersion magnetic lens excited by a second lens coil, and an immersion electrostatic lens excited by the voltage difference between the sample and the electrostatic lens electrode. For a predetermined excitation of the lens, the electron beam can be focused on the sample using combinations of excitations of the two lens coils. More BSE information can be obtained when the detector distinguishes between BSE's ( | 03-13-2014 |
20140097341 | IN-COLUMN DETECTOR FOR PARTICLE-OPTICAL COLUMN - The invention relates to an in-column back-scattered electron detector, the detector placed in a combined electrostatic/magnetic objective lens for a SEM. The detector is formed as a charged particle sensitive surface, preferably a scintillator disk that acts as one of the electrode faces forming the electrostatic focusing field. The photons generated in the scintillator are detected by a photon detector, such as a photo-diode or a multi-pixel photon detector. The objective lens may be equipped with another electron detector for detecting secondary electrons that are kept closer to the axis. A light guide may be used to offer electrical insulation between the photon detector and the scintillator. | 04-10-2014 |
20140110597 | Configurable Charged-Particle Apparatus - The invention relates to a charged-particle apparatus having
| 04-24-2014 |
20140361165 | METHOD FOR IMAGING A SAMPLE IN A CHARGED PARTICLE APPARATUS - The invention relates to a dual beam apparatus equipped with an ion beam column and an electron beam column having an electrostatic immersion lens. When tilting the sample, the electrostatic immersion field is distorted and the symmetry round the electron optical axis is lost. As a consequence tilting introduces detrimental effects such as traverse chromatic aberration and beam displacement. Also in-column detectors, detecting either secondary electrons or backscattered electrons in the non-tilted position of the sample, will, due to the loss of the symmetry of the immersion field, show a mix of these electrons when tilting the sample. | 12-11-2014 |
Patent application number | Description | Published |
20120046762 | PERFORMANCE IMPROVEMENT OF SIGNAL TRANSFORMATION SCHEMES FOR ULTRA-FAST SCANNING - A mechanism for controlling a plant is provided. A reference signal is received at a signal transformation loop of a feedback controller. The signal transformation loop causes the reference signal to include a disturbance signal and a nominal signal. Also, the reference signal is received at a feed-forward controller, and the feed-forward controller recreates the disturbance signal that was caused by the signal transformation loop. The output of the feedback controller is input into a plant. The output of the feed-forward controller is input into the plant such that the disturbance signal is removed from the output of the feedback controller. | 02-23-2012 |
20130197882 | EVALUATING AND OPTIMIZING A TRAJECTORY FUNCTION - A method for evaluating a trajectory function to be followed by a physical system includes providing the trajectory function; determining a set of sampling points by sampling a trajectory based on the trajectory function in the time domain; associating a cell to each of the sampling points; assessing at least one cell metric for each of the cells; aggregating the at least one cell metric of the cells to obtain an aggregated metric measure; and evaluating the trajectory as determined by the provided trajectory function depending on the one or more aggregated metric measures. | 08-01-2013 |
20130318793 | POSITIONING DEVICE FOR SCANNING A SURFACE - A positioning device for scanning a surface includes a movable element; at least one spring-like element having a resilience element for providing a tunable resilience in at least one direction; wherein the spring-like element is configured to tune the resilience by applying a force onto the resilience element of the at least one spring-like element. | 12-05-2013 |
20130321892 | POSITIONING DEVICE FOR SCANNING A SURFACE - A positioning device for scanning a surface includes a movable element; at least one spring-like element having a resilience element for providing a tunable resilience in at least one direction; wherein the spring-like element is configured to tune the resilience by applying a force onto the resilience element of the at least one spring-like element. | 12-05-2013 |
20150062747 | ALIGNING A FIRST ELEMENT COUPLED TO AN ACTUATOR WITH A SECOND ELEMENT OF A MAIN SYSTEM - A control system for aligning a first element coupled to an actuator with a second element of a main system includes a position sensor that measures an absolute position of the first element relative to the main system as a sensor signal, a position error signal-based compensator that generates a second control signal as a function of a position error signal, wherein the position error signal indicates a relative position of the first element as a difference between the actual position of the first element and a target position of the first element relative to the second element, a sensor-based compensator that generates a first control signal as a function of the sensor signal and the second control signal, and an actuator that changes the position of the first element relative to the second element dependent on the first control signal to align the first element with the second element. | 03-05-2015 |