Workman, CA
Dennis Workman, Morgan Hill, CA US
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20100149030 | POSITION DETERMINATION SYSTEM AND METHOD - An improved position determination system and method are described. The method includes determining that a failure to generate an acceptable GNSS position fix has occurred. In response to determining that the failure to generate an acceptable GNSS position fix has occurred, terrestrial positioning information is accessed which is derived from at least one broadcast signal. A second position fix based upon the terrestrial positioning information is generated. | 06-17-2010 |
James G. Workman, San Francisco, CA US
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20100274657 | Integrated Credit Exchange System for Incentivizing Conservation - A scalable integrated credit exchange system for incentivizing conservation of a resource is provided, which includes a credit allocation system, a consumer interface, and an online trading system. Data is utilized from a measuring system using a smart meter, geospatial monitoring system, and the utility. The incentive is provided in the form of an awarded “ECOSHARE credit” that can be traded in the provided online trading system or can be utilized to reduce the consumer's utility bill. | 10-28-2010 |
Lucas Remington Workman, Scotts Valley, CA US
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20140091751 | System And Method Of Using High Energy Battery Packs - Energy storage system having one or more battery packs and a system controller for controlling the battery packs. Each battery pack has rechargeable storage cells and a battery pack controller in communication with the system controller. Through the operation of the system controller, battery packs with different initial charge states can be operated in parallel during the charge or discharge process. Discharging multiple battery packs in parallel offers not only higher capacity and longer run time than is available from a single battery pack, but also offers higher peak currents than available from a single battery pack, important in motor control applications. Battery pack design including a battery pack connector with both power and control contacts supporting user replacement of the battery packs. | 04-03-2014 |
20140125344 | System and Method for Improved Battery Charge State Determination - Improved battery charge state determination. The estimated charge state of a battery comprising a plurality of series connected cells is updated using Coulomb counting during battery operation, for example, while operating an electric vehicle motor. The estimated charge state may be coupled to a fuel gauge. When the battery is in a no load state, a no load voltage measurement is made. During testing, a set of relationships between battery no load voltages and associated known good charge states have been determined. The measured no load voltage is compared to the set of no load voltages associated with known good charge states. A known good charge state associated with the measured no load voltage is used to update the estimated charge state, thereby providing a more accurate indication of the actual battery charge state, thus providing a more robust and accurate fuel gauge. | 05-08-2014 |
Michael D. Workman, Palm Desert, CA US
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20090288691 | SOLAR PANEL CLEANING SYSTEM - A solar power cleaning system is provided including a fluid supply line. A first end of the fluid supply line is utilized for receiving water. A second end of the fluid supply line is coupled to a plurality of nozzles for dispensing fluid onto solar panels. The cleaning system also includes a housing. Disposed within the housing is a valve for regulating soap from a storage compartment into the fluid supply line. The valve is controlled by a programmable controller. When the valve is open, soap mixes with water and is dispensed onto the solar panels via the nozzles. When the valve is closed, water may be dispensed onto the solar panels. A filter may be coupled to the fluid supply line to remove impurities from the water before dispensation onto the solar panels. A motor and pump may also be disposed within the housing to regulate the fluid pressure within the fluid supply line. | 11-26-2009 |
Michael Lee Workman, Saratoga, CA US
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20090271543 | Storage device with instructions for performing methods of processing I/O requests - The invention classifies volumes (e.g., file systems or LUNS) of a data storage system according to application requirements and allocates space for the volumes on storage devices (e.g., hard disk drives) accordingly. A person such as an IT administrator configures the volumes specifying size, type (e.g., file system or SAN LUN), and priority (e.g., high, medium, low, or archive). The host schedules I/O requests to the storage devices in priority queues using the volume definition to match the application requirements and reduce storage seek time between volumes of different priorities. The host also allocates high performance bands of the storage devices to high performance applications and lower performance bands to lower performance applications. In this manner, the data storage system places data on the band of the storage device that best supports its performance needs. | 10-29-2009 |
Richard K. Workman, Sunnyvale, CA US
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20090062935 | Automatic Generation Of PID Parameters For An Atomic Force Microscope - Linear PID controllers have a transfer function that resembles the frequency response of a notch filter. The PID parameters, K | 03-05-2009 |
20140137300 | ATOMIC FORCE MICROSCOPE SYSTEM USING SELECTIVE ACTIVE DAMPING - An atomic force microscope (AFM) system comprises a cantilever arm attached to a probe tip. The system controls a height of the cantilever arm to press the probe tip against a sample and then separate the probe tip from the sample, to detect a disturbance of the cantilever arm after the separation of the probe tip from the surface, and to engage active damping of the cantilever arm to suppress the disturbance. | 05-15-2014 |
Richard Kenton Workman, Sunnyvale, CA US
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20090112957 | System and methods for data sample decimation and display of scanning probe microscope images - Methods, systems and components for producing a scanning probe microscope (SPM) image. One method embodiment includes receiving sample data from a scanning probe microscope wherein said sample data comprises data sample many times per pixel of the SPM image to be displayed; selecting at least one decimation scheme from a plurality of different decimation schemes, for decimating the sample data to provide a single data value per pixel; and decimating the sample data, using the at least one selected decimation scheme. A method of decimating sample data scanned along scan lines from a surface of an object to be imaged includes at least temporarily storing multiple adjacent scan lines of the sample data prior to decimating at least a portion of the sample data; correlating adjacent samples of the sample data; and selecting a decimation scheme different from a decimation scheme previously selected to be applied to sample data within a pixel pertaining to an image to be formed from the sample data, when correlating provides results in which a value from one line of comparison is different from a value from another line of comparison by at least a predetermined value, but otherwise maintaining the previously selected decimation scheme for decimating the sample data pertaining to that pixel. | 04-30-2009 |
20090139313 | Time-Tagged Data for Atomic Force Microscopy - A scanning probe microscope and method for using the same are disclosed. The scanning probe microscope includes a probe, an electromechanical actuator that moves the sample relative to the probe, an external interface, and a controller. The probe has a tip that moves in response to an interaction between the tip and a local characteristic of a sample. The external interface provides a connection between the scanning probe microscope and a device external to the scanning probe microscope. The controller records scanning probe microscope data measurements, each scanning probe microscope data measurement including a location of the probe in the three dimensions and a label that uniquely identifies that measurement and allows that measurement to be correlated with data generated by a device that is external to the scanning probe microscope. The unique label could include the time at which the data measurement was made. | 06-04-2009 |
20100269232 | Scanning Probe Microscope that Outputs Metadata with Image - A scanning probe microscope and method for using the same are disclosed. The scanning probe microscope includes a probe mount, a probe position signal generator, and a controller. The probe mount is adapted to receive a probe having a tip that moves in response to an interaction between the tip and a local characteristic of a sample. The probe position signal generator generates a position signal indicative of a position of the probe tip. The controller receives the position signal and derives a pixel value for a corresponding location on the sample from the position signal over a pixel time period. The controller generates an image that includes the pixel value. The controller stores a plurality of intermediate pixel data values at different times during the pixel time period. | 10-21-2010 |
Richard R. Workman, Sunnyvale, CA US
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20090107266 | PROBE TIP ASSEMBLY FOR SCANNING PROBE MICROSCOPES - A probe assembly for a scanning probe microscope (SPM), a cartridge for a probe assembly for an SPM, and a method of attaching a probe tip to an SPM are described. | 04-30-2009 |
Thomas Workman, San Jose, CA US
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20140079884 | Methods, Materials and Apparatus for improving control and efficiency of layer-by-layer processes - The disclosure provides materials, apparatuses, and methods for making multilayer coatings with a high degree of efficiency and control. In some aspects, for example, coatings are described having multiple layers of nanoparticles and a polyelectrolyte, wherein the nanoparticles form tightly packed monolayers. The interface between monolayers may include polyelectrolyte material. One or more aspects of such monolayers and interfaces are controllable. | 03-20-2014 |
William Buchanan Workman, Lafayette, CA US
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20090192545 | Curved suture anchor guide and method of use - A rigid, curved and hollow guide that can be used to facilitate a variety of arthroscopic surgeries is provided as well as a method of using the guide. In one embodiment, the guide ( | 07-30-2009 |
20090198258 | Curved arthroscopic guide - A rigid, curved and hollow guide ( | 08-06-2009 |