Kunibe
Hirotaka Kunibe, Nagoya JP
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20110153180 | ELECTRONIC CONTROL UNIT FOR CONTROLLING ELECTRICALLY DRIVEN LOADS IN ENHANCED FAIL SAFE MANNER - A first judgment circuit and a second judgment circuit are adapted to set a judging signal high when a judgment data sent from a microprocessor indicates failure. The high level judging signal triggers a forced idle command connected to a motor driver, to be high level whereby the motor is forcibly suspended. Subsequently, when a reset command is accidentally transmitted by the microprocessor due to an unexpected fault, a first judging signal from the first judgment circuit is reset to low level. However, a second judging signal from the second judgment circuit remains high level. As a result, the forced idle command stays high level. | 06-23-2011 |
Toshiju Kunibe, Kanagawa JP
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20090250340 | Ion source and plasma processing apparatus - It is an object of this invention to provide an ion source and a plasma processing apparatus capable of generating stable and long-life plasma. The ion source is provided with a high-frequency antenna ( | 10-08-2009 |
Toshijyu Kunibe, Chigasaki-Shi JP
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20110064198 | ANALYTICAL METHOD - The object of the present invention is to analyze a functional organic compound with high accuracy. In the present invention, cluster ions are accelerated so that the kinetic energy of cluster ions is less than 3.1 eV per one atom that makes up the cluster ion and the cluster ions enter a sample. Since the functional organic compound in the sample is etched without the breakdown of the chemical structure, the functional organic compound, which has not been chemically denatured, is exposed on the surface of the sample. By alternately performing the etching and the surface analysis of the sample, or performing the surface analysis of the sample while performing the etching, the sample can be accurately analyzed in the depth direction. | 03-17-2011 |