Patent application number | Description | Published |
20080278126 | VOLTAGE DOWN CONVERTER - A voltage down converter includes a voltage comparator for comparing a first reference voltage and an internal voltage to provide a first driving signal; a driving signal controller coupled with the voltage comparator, the driving signal controller configured to generate a second driving signal in response to an external voltage and selectively providing any one of the first and second driving signals; and a voltage supply coupled with the driving signal controller, the voltage supply configured to receive the selectively provided first and second driving signals, wherein the voltage supply is activated in accordance with the first or second driving signal, thereby providing the internal voltage. | 11-13-2008 |
20090091311 | CIRCUIT FOR GENERATING REFERENCE VOLTAGE OF SEMICONDUCTOR MEMORY APPARATUS - A reference voltage generating circuit in a semiconductor memory apparatus comprises a driving control signal generating unit configured to generate a driving control signal according to a temperature variation, wherein the driving control signal generating unit is enabled in response to a power-up signal, a driving unit configured to control a voltage level, which is applied to a voltage transfer node, in response to the power-up signal and the driving control signal, and a reference voltage generating unit configured to generate a reference voltage when a voltage level on the voltage transfer node is higher than a predetermined voltage level. | 04-09-2009 |
20120013318 | VOLTAGE DOWN CONVERTER - A voltage down converter includes a voltage comparator for comparing a first reference voltage and an internal voltage to provide a first driving signal; a driving signal controller coupled with the voltage comparator, the driving signal controller configured to generate a second driving signal in response to an external voltage and selectively providing any one of the first and second driving signals; and a voltage supply coupled with the driving signal controller, the voltage supply configured to receive the selectively provided first and second driving signals, wherein the voltage supply is activated in accordance with the first or second driving signal, thereby providing the internal voltage. | 01-19-2012 |
Patent application number | Description | Published |
20080225609 | VOLTAGE GENERATING CIRCUIT AND REFERENCE VOLTAGE GENERATING CIRCUIT FOR SEMICONDUCTOR MEMORY APPARATUS, AND SEMICONDUCTOR SYSTEM USING THE SAME - A voltage generating circuit for a semiconductor memory apparatus according includes a data logic voltage generating unit that, when a data output unit outside a semiconductor memory apparatus outputs low-level data, generates an internal data logic voltage at the same potential level as the low-level data in response to an on-die termination signal. In addition, a reference voltage generating circuit for a semiconductor memory apparatus that uses the voltage generating circuit includes a reference voltage generating unit that can be configured to generate a reference voltage at an average potential level between a maximum potential and a minimum potential of input data. | 09-18-2008 |
20090045796 | SEMICONDUCTOR INTEGRATED CIRCUIT - A semiconductor integrated circuit can include a reference voltage pad that can be configured to receive an external reference voltage and supply the external reference voltage to the inside of the semiconductor integrated circuit, an internal reference voltage generator that can be configured to generate an internal reference voltage by voltage dividing, a selector that can be configured to select and output one of the external reference voltage and the internal reference voltage in response to a selection signal, and a voltage trimming block that can be configured to regulate the level of the output voltage from the selector in response to trimming signals and outputs the level-regulated voltage as a reference voltage. | 02-19-2009 |
20090045874 | DIFFERENTIAL AMPLIFIER AND INPUT CIRCUIT USING THE SAME - A differential amplifier comprises a plurality of first switching elements configured to output differentially amplified signals through output terminals when a voltage level of a first input signal and a second input signal belongs to a first range and a plurality of second switching elements configured to output the differentially amplified signals through the output terminals when the voltage level of the first input signal and the second input signal belongs to a second range. | 02-19-2009 |
20090174425 | TEST CIRCUIT FOR A SEMICONDUCTOR INTEGRATED CIRCUIT - A test circuit includes an output control section for generating a plurality of output buffer control signals in response to a plurality of data masking signals when a test mode signal is activated in read operation; and a data output buffer for masking some of data input and output pins in response to the plurality of output buffer control signals. | 07-09-2009 |
20100097865 | DATA TRANSMISSION CIRCUIT AND A SEMICONDUCTOR INTEGRATED CIRCUIT USING THE SAME - A data transmission circuit includes a data input unit configured to latch data in response to a data strobe signal and to output the data as input data, and a data input timing control unit configured to latch the input data in response to the data strobe signal delayed for a predetermined time interval and to output the input data to a bank group as delay data. | 04-22-2010 |