Patent application number | Description | Published |
20130156689 | METHOD FOR PRODUCING MTW-TYPE ZEOLITE - The method for producing an MTW-type zeolite according to the present invention includes: mixing a silica source, an alumina source, an alkali source, a lithium source, and water so as to obtain a reaction mixture having a composition represented by specific molar ratios; (2) adding an MTW-type zeolite which has a SiO | 06-20-2013 |
20150086474 | METHOD FOR PRODUCING PAU ZEOLITE - Provided is a method that is for producing a PAU zeolite and that can have an environmental impact that is reduced while, as much as possible, not using a structure-defining agent. The method for producing a PAU zeolite produces by means of (1) mixing a silica source, an alumina source, an alkali source, and water in a manner so as to result in a reaction mixture having a composition represented by a specific mole ratio, (2) using as the seed crystal a PAU zeolite that does not contain organic compounds and has a SiO | 03-26-2015 |
20150086786 | BETA ZEOLITE AND METHOD FOR PRODUCING SAME - The present invention provides a beta zeolite that is useful as a catalyst, adsorbent agent, or the like, and that is both microporous and mesoporous. The beta zeolite is characterized by (i) the SiO | 03-26-2015 |
Patent application number | Description | Published |
20090189485 | PIEZOELECTRIC ACTUATOR PROVIDED WITH A DISPLACEMENT METER, PIEZOELECTRIC ELEMENT USED THEREFOR, AND POSITIONING DEVICE USING A PIEZOELECTRIC ACTUATOR - By resistor attached by a piezoelectric element, measurement with high accuracy is possible by strain of the piezoelectric element and there is not a trouble by a short, a piezoelectric actuator, the piezoelectric element and a positioning device therewith. The piezoelectric actuator includes; a piezoelectric element which is formed into an arbitrary shape, polarized in an arbitrary direction, and includes electrodes provided on at least two surfaces opposed in a thickness direction thereof; a driver power supply for applying a voltage between the electrodes to generate strain in the piezoelectric element; a driver power supply for applying a voltage to generate strain in the piezoelectric element; resistors provided on the electrodes through intermediation of insulators; and a displacement detection device connected with the resistors; The electrodes of the piezoelectric element on which the resistors are provided are set at a ground potential. | 07-30-2009 |
20090206707 | Circular cylinder type piezoelectric actuator and piezoelectric element and scanning probe microscope using those - The cylindrical piezoelectric actuator which comprised a piezoelectric element which provided electrode in each of an inner peripheral face and an outer peripheral face which was cylindrical at least, and drive power supply to drive it. And the outer side electrode of the piezoelectric element covered the substantially circumferential outer face entirety and it was connected to a ground potential, and the electrode in the internal perimeter surface connected to drive power supply. | 08-20-2009 |
20090265819 | SENSOR FOR OBSERVATIONS IN LIQUID ENVIRONMENTS AND OBSERVATION APPARATUS FOR USE IN LIQUID ENVIRONMENTS - The sensor has the self-detecting probe including a body portion, an elongated belt-like flexible substrate, connecting members, a resinous portion, and external contacts formed at the ends of the flexible substrate brought out of liquid. The probe further includes a cantilever whose base end is supported to the body portion, a strain resistive element whose resistance value varies according to the amount of displacement of the cantilever, and interconnects electrically connected with the strain resistive element. A probe tip is formed at the front end of the cantilever. The flexible substrate has an interconnect pattern sandwiched between two insulating sheets. The flexible substrate supports the body portion while the cantilever protrudes outwardly. At least one end of the flexible substrate is brought out of liquid. The connecting members connect the interconnects with the interconnect pattern. The interconnects, connecting members, and the portions of the connecting members electrically connected with the interconnect pattern are coated with the resinous portion. | 10-22-2009 |
20100107284 | Cantilever, cantilever system, scanning probe microscope, mass sensor apparatus, viscoelasticity measuring instrument, manipulation apparatus, displacement determination method of cantilever, vibration method of cantilever and deformation method of cantilever - Provided is a cantilever that is capable of bending and deforming in an active manner by itself. The cantilever includes: a lever portion having a proximal end that is supported by a main body part; and a resistor member that is formed in the cantilever and generates heat when a voltage is applied, to thereby deform the lever portion by thermal expansion due to the heat. | 04-29-2010 |
20100132075 | Self displacement sensing cantilever and scanning probe microscope - Provided is a self displacement sensing cantilever, including: a cantilever ( | 05-27-2010 |
20100154085 | Cantilever for Scanning Probe Microscope and Scanning Probe Microscope Equipped With It - A microscope including both an atomic force microscope and a near-field optical microscope and capable of performing electrochemical measurements and a cantilever for the microscope are disclosed. A pointed light transmitting material employed as the probe of an atomic force microscope is coated with a metal layer; the metal layer is further coated with an insulating layer; the insulating layer is removed only at the distal end to expose the metal layer; the slightly exposed metal layer is employed as a working electrode; and the probe can be employed not only as the probe of the atomic force microscope and the near-field optical microscope but also as the electrode of an electrochemical microscope. Consequently, the microscope can have the functions of an atomic force microscope, a near-field optical microscope and an electrochemical microscope. | 06-17-2010 |
20100205697 | APPROACH METHOD FOR PROBE AND SAMPLE IN SCANNING PROBE MICROSCOPE - In detecting a displacement of a cantilever ( | 08-12-2010 |