Patent application number | Description | Published |
20080222585 | INTERLEAVED VOLTAGE CONTROLLED OSCILLATOR - A design structure embodied in a machine readable medium used in a design process includes an interleaved voltage-controlled oscillator, including a ring circuit of main logic inverter gates; a plurality of delay elements connected in parallel with a selected sequence of the main logic inverter gates; wherein each delay element comprises a feedforward section, comprising controls for regulating signal transmission through feedforward elements responsive to one or more control voltages; and a proportional section for regulating signal transmission through at least one logic inverter gate; at least one temperature compensation circuit responsive to a compensating voltage input that is proportional to temperature; an electronic circuit in communication with the temperature compensation circuit and configured to provide a voltage signal responsive to temperature; an amplifier in connection with the electronic circuit to amplify the voltage signal; and a DC offset generator configured to adjust the voltage of the amplified voltage signal. | 09-11-2008 |
20080229270 | Design Structure for a Duty Cycle Correction Circuit - A design structure for a Duty Cycle Correction (DCC) circuit is provide in which pairs of field effect transistors (FETs) in known DCC circuit topologies are replaced with linear resistors coupled to switches of the DCC circuit such that when the switch is open, the input signal is routed through the linear resistors. The linear resistors are more tolerant of process, voltage and temperature (PVT) fluctuations than FETs and thus, the resulting DCC circuit provides a relatively smaller change in DCC correction range with PVT fluctuations than the known DCC circuit topology that employs FETs. The linear resistors may be provided in parallel with the switches and in series with a pair of FETs having relatively large resistance values. The linear resistors provide resistance that pulls-up or pulls-down the pulse width of the input signal so as to provide correction to the duty cycle of the input signal. | 09-18-2008 |
20080246524 | Duty Cycle Correction Circuit Whose Operation is Largely Independent of Operating Voltage and Process - A Duty Cycle Correction (DCC) circuit is provide in which pairs of field effect transistors (FETs) in known DCC circuit topologies are replaced with linear resistors coupled to switches of the DCC circuit such that when the switch is open, the input signal is routed through the linear resistors. The linear resistors are more tolerant of process, voltage and temperature (PVT) fluctuations than FETs and thus, the resulting DCC circuit provides a relatively smaller change in DCC correction range with PVT fluctuations than the known DCC circuit topology that employs FETs. The linear resistors may be provided in parallel with the switches and in series with a pair of FETs having relatively large resistance values. The linear resistors provide resistance that pulls-up or pulls-down the pulse width of the input signal so as to provide correction to the duty cycle of the input signal. | 10-09-2008 |
20080309395 | Systems and Methods for Level Shifting using AC Coupling - Systems and methods for conveying signals between integrated circuit (IC) components in domains having different supply voltages. AC coupling is used to increase the speed at which the common mode voltage of a signal is shifted from one level to another. One embodiment comprises a method for level shifting a binary signal in an IC. This method includes receiving an input binary signal and decoupling its AC component from its common mode component. A second common mode component is added to the AC component, providing a binary output signal. The common mode voltage of the input signal may be greater (or smaller) than that of the output signal. In one embodiment of the method, duty cycle compensation (DCC) is performed. The DCC drives the duty cycle toward a desired value. | 12-18-2008 |
20090002038 | Phase Locked Loop with Stabilized Dynamic Response - A hybrid phase locked loop (PLL) circuit for obtaining stabilized dynamic response and independent adjustment of damping factor and loop bandwidth is provided. The hybrid PLL circuit of the illustrative embodiments includes the resistance/capacitance (RC) filter elements of a conventional RC PLL and the feed-forward path from the output of the phase frequency detector to the voltage controlled oscillator (VCO). The hybrid PLL essentially enhances the performance of the conventional feed-forward PLL by providing the RC filter whose components can be weighted to provide a dynamic response that is significantly less sensitive to parameter variation and which allows loop bandwidth optimization without sacrificing damping. | 01-01-2009 |
20090007047 | Design Structure for a Phase Locked Loop with Stabilized Dynamic Response - A design structure for a hybrid phase locked loop (PLL) circuit that obtains stabilized dynamic response and independent adjustment of damping factor and loop bandwidth is provided. The hybrid PLL circuit of the illustrative embodiments includes the resistance/capacitance (RC) filter elements of a conventional RC PLL and the feed-forward path from the output of the phase frequency detector to the voltage controlled oscillator (VCO). The hybrid PLL essentially enhances the performance of the conventional feed-forward PLL by providing the RC filter whose components can be weighted to provide a dynamic response that is significantly less sensitive to parameter variation and which allows loop bandwidth optimization without sacrificing damping. | 01-01-2009 |
20090021314 | Structure for a Phase Locked Loop with Adjustable Voltage Based on Temperature - A design structure for an apparatus for utilizing a single set of one or more thermal sensors, e.g., thermal diodes, provided on the integrated circuit device, chip, etc., to control the operation of the integrated circuit device, associated cooling system, and high-frequency PLLs, is provided. By utilizing a single set of thermal sensors to provide multiple functions, e.g., controlling the operation of the integrated circuit device, the cooling system, and the PLLs, silicon real-estate usage is reduced through combining circuitry functionality. Moreover, the integrated circuit device yield is improved by reducing circuitry complexity and increasing PLL robustness to temperature. Furthermore, the PLL circuitry operating range is improved by compensating for temperature. | 01-22-2009 |
20090024349 | ADJUSTING VOLTAGE FOR A PHASE LOCKED LOOP BASED ON TEMPERATURE - A mechanism for utilizing a single set of one or more thermal sensors, e.g., thermal diodes, provided on the integrated circuit device, chip, etc., to control the operation of the integrated circuit device, associated cooling system, and high-frequency PLLs is provided. By utilizing a single set of thermal sensors to provide multiple functions, e.g., controlling the operation of the integrated circuit device, the cooling system, and the PLLs, silicon real-estate usage is reduced through combining circuitry functionality. Moreover, the integrated circuit device yield is improved by reducing circuitry complexity and increasing PLL robustness to temperature. Furthermore, the PLL circuitry operating range is improved by compensating for temperature. | 01-22-2009 |
20090066424 | Programmable Interpolative Voltage Controlled Oscillator with Adjustable Range - A programmable interpolative voltage controlled oscillator (VCO) with adjustable frequency range output is provided. With the VCO, programmable delay cells whose size is modifiable based on control inputs to the programmable delay cells are utilized. A different set of control inputs may be provided to programmable delay cells of an inner sub-ring from the set of control inputs provided to programmable delay cells of a main ring of the VCO. The minimum frequency output of the VCO is governed by the main ring programmable delay cell strength with the maximum frequency output of the VCO being governed by a ratio of strengths of the main ring programmable delay cells to the inner sub-ring programmable delay cell. By modifying the control inputs to the inner sub-ring and main ring programmable delay cells, the minimum and maximum frequency outputs, and thus the range between these two frequency outputs, are made programmable. | 03-12-2009 |
20090125262 | Absolute Duty Cycle Measurement Method and Apparatus - A method and apparatus for measuring the absolute duty cycle of a signal are provided. A non-inverted path from a signal source is selected and various DCC circuit setting indices are cycled through until a divider, coupled to the output of the DCC circuit, fails. A first minimum pulse width at which the divider fails is then determined based on the index value of the DCC circuit at the time of the failure. An inverted path from the signal source is selected and the various DCC circuit setting indices are cycled through again until the divider fails. A second minimum pulse width at which the divider fails is then determined based on the index value of the DCC circuit at the time of this second failure. The duty cycle is then calculated based on a difference of the first and second minimum pulse width values. | 05-14-2009 |
20090125857 | Design Structure for an Absolute Duty Cycle Measurement Circuit - A design structure for a circuit for measuring the absolute duty cycle of a signal, is provided. A non-inverted path from a signal source is selected and various DCC circuit setting indices are cycled through until a divider, coupled to the output of the DCC circuit, fails. A first minimum pulse width at which the divider fails is then determined based on the index value of the DCC circuit at the time of the failure. An inverted path from the signal source is selected and the various DCC circuit setting indices are cycled through again until the divider fails. A second minimum pulse width at which the divider fails is then determined based on the index value of the DCC circuit at the time of this second failure. The duty cycle is then calculated based on a difference of the first and second minimum pulse width values. | 05-14-2009 |
20090128133 | Duty Cycle Measurement Method and Apparatus for Various Signals Throughout an Integrated Circuit Device - A method and apparatus for measuring the absolute duty cycle of a signal anywhere on an integrated circuit device are provided. The mechanism employs a circuit having a plurality of substantially identical pulse shaper elements, each of which expand the pulse of an input signal whose duty cycle is to be measured by a same amount. The outputs of the pulse shaper elements may be coupled to substantially identical divider circuits whose outputs are coupled to a multiplexer that selects two inputs for output to a set of master/slave configured flip-flops, one input serving as a clock and the other as data to the flip-flops. The flip-flops sample the divider outputs selected by the multiplexer to detect if the dividers have failed or not. The outputs of the flip-flops are provided to an XOR gate which outputs a duty cycle signal indicative of the duty cycle of the input signal. | 05-21-2009 |
20090128206 | Apparatus and Method for Obtaining Desired Phase Locked Loop Duty Cycle without Pre-Scaler - An apparatus and method for obtaining a desired phase locked loop (PLL) duty cycle without a pre-scaler are provided. The PLL circuit of the illustrative embodiments utilizes two separate loops that simultaneously operate on the VCO. One loop ensures the frequency and phase lock while the other loop ensures the duty cycle lock. The VCO is modified to have an additional control port to adjust the duty cycle. Thus, the VCO has one control port for performing frequency adjustment and one control port for duty cycle adjustment. As a result, both the duty cycle and the frequency may be controlled using the VCO of the PLL circuit of the illustrative embodiments so as to achieve any desired duty cycle output without requiring a VCO pre-scaler circuit or duty cycle correction circuit. | 05-21-2009 |
20090132971 | Structure for a Circuit Obtaining Desired Phase Locked Loop Duty Cycle without Pre-Scaler - A design structure for a circuit for obtaining a desired phase locked loop (PLL) duty cycle without a pre-scaler is provided. The PLL circuit of the illustrative embodiments utilizes two separate loops that simultaneously operate on the VCO. One loop ensures the frequency and phase lock while the other loop ensures the duty cycle lock. The VCO is modified to have an additional control port to adjust the duty cycle. Thus, the VCO has one control port for performing frequency adjustment and one control port for duty cycle adjustment. As a result, both the duty cycle and the frequency may be controlled using the VCO of the PLL circuit of the illustrative embodiments so as to achieve any desired duty cycle output without requiring a VCO pre-scaler circuit or duty cycle correction circuit. | 05-21-2009 |
20090138834 | Structure for a Duty Cycle Measurement Circuit - A design structure for a circuit for measuring the absolute duty cycle of a signal anywhere on an integrated circuit device is provided. The circuit has a plurality of substantially identical pulse shaper elements, each of which expand the pulse of an input signal whose duty cycle is to be measured by a same amount. The outputs of the pulse shaper elements may be coupled to substantially identical divider circuits whose outputs are coupled to a multiplexer that selects two inputs for output to a set of master/slave configured flip-flops, one input serving as a clock and the other as data to the flip-flops. The flip-flops sample the divider outputs selected by the multiplexer to detect if the dividers have failed or not. The outputs of the flip-flops are provided to an XOR gate which outputs a duty cycle signal indicative of the duty cycle of the input signal. | 05-28-2009 |
20090146743 | Systems and Methods for PLL Linearity Measurement, PLL Output Duty Cycle Measurement and Duty Cycle Correction - Systems and methods for enabling the determination of voltage controlled oscillator (VCO) linearity, duty cycle determination and duty cycle correction in phase locked loop circuits (PLL's.) One embodiment comprises a method including the steps of determining the frequency response of a PLL's VCO as a function of duty cycle, applying a signal based on the VCO output to the VCO input, measuring the resulting frequency of the VCO output signal, determining the duty cycle corresponding to the measured frequency, and configuring a duty cycle correction unit correct the duty cycle of the VCO output signal to about 50%. Determining the frequency response of the VCO may include, for each of several different duty cycle values between 0% and 100%, applying the VCO input signal to the VCO and determining the corresponding frequency of the VCO output signal. This may also be done for duty cycles of 0% and 100%. | 06-11-2009 |
20090183136 | Structure for a Programmable Interpolative Voltage Controlled Oscillator with Adjustable Range - A design structure for a programmable interpolative voltage controlled oscillator (VCO) with adjustable frequency range output is provided. Programmable delay cells whose size is modifiable based on control inputs to the programmable delay cells are utilized. A different set of control inputs may be provided to programmable delay cells of an inner sub-ring from the set of control inputs provided to programmable delay cells of a main ring of the VCO. The minimum frequency output of the VCO is governed by the main ring programmable delay cell strength with the maximum frequency output of the VCO being governed by a ratio of strengths of the main ring programmable delay cells to the inner sub-ring programmable delay cell. By modifying the control inputs to the inner sub-ring and main ring programmable delay cells, the minimum and maximum frequency outputs, and thus the range between these two frequency outputs, are made programmable. | 07-16-2009 |
20090285344 | Phase Locked Loop with Temperature and Process Compensation - Mechanisms are provided for compensating for process and temperature variations in a circuit. The mechanisms may select at least one resistor in a plurality of resistors in the circuit to provide a resistance value for generating a calibration voltage input to the circuit to compensate for variations in process. A reference signal may be compared to a feedback signal generated by the circuit based on the calibration signal. A determination is made as to whether the feedback signal is within a tolerance of the reference signal and, if so, an identifier of the selected at least one resistor is stored in a memory device coupled to the circuit. The circuit may be operated using the selected at least one resistor based on the identifier stored in the memory device. An apparatus and integrated circuit device utilizing these mechanisms are also provided. | 11-19-2009 |
20110121874 | Systems and Methods for PLL Linearity Measurement, PLL Output Duty Cycle Measurement and Duty Cycle Correction - Systems and methods for enabling the determination of voltage controlled oscillator (VCO) linearity, duty cycle determination and duty cycle correction in phase locked loop circuits (PLL's.) One embodiment comprises a method including the steps of determining the frequency response of a PLL's VCO as a function of duty cycle, applying a signal based on the VCO output to the VCO input, measuring the resulting frequency of the VCO output signal, determining the duty cycle corresponding to the measured frequency, and configuring a duty cycle correction unit correct the duty cycle of the VCO output signal to about 50%. Determining the frequency response of the VCO may include, for each of several different duty cycle values between 0% and 100%, applying the VCO input signal to the VCO and determining the corresponding frequency of the VCO output signal. This may also be done for duty cycles of 0% and 100%. | 05-26-2011 |
20110126162 | Design Structure for a Duty Cycle Correction Circuit - A design structure for a Duty Cycle Correction (DCC) circuit is provide in which pairs of field effect transistors (FETs) in known DCC circuit topologies are replaced with linear resistors coupled to switches of the DCC circuit such that when the switch is open, the input signal is routed through the linear resistors. The linear resistors are more tolerant of process, voltage and temperature (PVT) fluctuations than FETs and thus, the resulting DCC circuit provides a relatively smaller change in DCC correction range with PVT fluctuations than the known DCC circuit topology that employs FETs. The linear resistors may be provided in parallel with the switches and in series with a pair of FETs having relatively large resistance values. The linear resistors provide resistance that pulls-up or pulls-down the pulse width of the input signal so as to provide correction to the duty cycle of the input signal. | 05-26-2011 |
20120001691 | VARIABLE GAIN AMPLIFIER WITH REDUCED POWER CONSUMPTION - A variable gain amplifier includes a first common mode (CM) node configured to receive a first differential signal of a pair of differential signals. A first regulator couples to the first CM node, the first regulator being configured to generate a first CM offset. A second CM node is configured to receive a second differential signal of the pair of differential signals. A second regulator couples to the second CM node, the second regulator being configured to generate a second CM offset. In one embodiment, the first CM offset and the second CM offset together comprise a net CM offset, the net CM offset being configured to replace a current source net offset. | 01-05-2012 |