Patent application number | Description | Published |
20100232578 | Line Testing - Embodiments related to line testing are described and depicted. | 09-16-2010 |
20120063499 | Line Testing - Embodiments related to line testing are described and depicted. A digital subscriber line testing apparatus comprises a plurality of resistors and a switching device. The switching device comprises first and second signal inputs to couple the switching device to a signal generator output, and a plurality of wire terminals. The switching device is configured to switch the plurality of resistors into a first switching state and a second switching state. | 03-15-2012 |
20150035581 | SWITCH CIRCUIT ARRANGEMENTS AND METHOD FOR POWERING A DRIVER CIRCUIT - In various embodiment, a switch circuit arrangement is provided. The switch circuit arrangement may include a switch circuit, a driver circuit and a supply circuit. The driver circuit may be configured to control the switch circuit. The supply circuit may be configured to power the driver circuit. The supply circuit may include a first circuit configured to modify an output impedance of the supply circuit to have a first impedance when the driver circuit controls the switch circuit to be in a conducting state and to have a second impedance when the driver circuit controls the switch circuit to change from a non-conducting state to the conducting state. | 02-05-2015 |
20160065064 | System and Method for a Switch Having a Normally-on Transistor and a Normally-off Transistor - In accordance with an embodiment, a circuit includes a first driver having a first output configured to be coupled to a control node of a normally-off transistor. The first driver is configured to drive a first switching signal at the first output in a cascode mode and configured to drive a first constant voltage at the first output in a direct drive mode. The circuit further includes a second driver having a second output configured to be coupled to a control node of a normally-on transistor that has a second load path terminal coupled to a first load path terminal of the normally-off transistor. The second driver is configured to drive a second switching signal at the second output in the direct drive mode. | 03-03-2016 |
20160065086 | System and Method for Driving a Transistor - In accordance with an embodiment, a circuit for driving a control terminal of a switching transistor includes a driver having an output configured to be coupled to the control terminal of the switching transistor, a first power supply terminal configured to be coupled to a first terminal of a floating power supply, a second power supply terminal configured to be coupled to a second terminal of the floating power supply, and a switching input terminal configured to receive a switching signal. The circuit further includes a bias circuit having an output terminal configured to be coupled to a common-mode control terminal of the floating power supply, wherein the bias circuit is configured to provide a time dependent voltage. | 03-03-2016 |
20160065203 | System and Method for a Switch Having a Normally-on Transistor and a Normally-off Transistor - In accordance with an embodiment, a circuit includes a normally-off transistor, and a normally-on transistor comprising a second load path terminal coupled to a first load path terminal of the normally off transistor, and a control terminal coupled to a second load path terminal of the normally-off transistor. The circuit further includes a driver circuit having an output coupled to a control terminal of the normally off transistor, a first power supply terminal configured to be coupled to a first power supply terminal of a first power supply, and a second power supply terminal configured to be coupled to a second power supply terminal of a second power supply. The second load path terminal of the normally on transistor is further configured to be coupled to a second power supply terminal of the first power supply and to a first power supply terminal of the second power supply. | 03-03-2016 |
20160065204 | System and Method for Generating an Auxiliary Voltage - In accordance with an embodiment, a circuit includes a first normally-on transistor having a drain coupled to a first switching output node, a normally-off transistor having a drain coupled to a source of the first normally-on transistor, a driver circuit configured to receive a switching signal, the driver circuit having an output coupled to a gate of the first normally-on transistor, and a second normally-on transistor having a drain terminal coupled to a supply node, a gate terminal coupled to the output of the driver circuit, and a source terminal configured to provide an auxiliary voltage. | 03-03-2016 |
Patent application number | Description | Published |
20090160470 | SEMICONDUCTOR AND METHOD - A semiconductor and method is disclosed. One embodiment includes a detector arrangement to detect the position of a connection element. A probe tip, the detector arrangement including first connection pads are arranged on a substrate surface. A first circuit is connected to the first connection pads. | 06-25-2009 |
20090278404 | Circuit Arrangement and System for Use in a Motor Vehicle - A circuit arrangement comprises a fuse element from which degradation can start. The circuit arrangement also comprises a sensor element for detecting the degradation, and a circuit part to be protected. The sensor element can detect degradation into a region between the fuse element and the circuit part to be protected. | 11-12-2009 |
20130127066 | Integrated Circuit Including Interconnect Levels - An integrated circuit as described herein includes an upper interconnect level including a continuous upper interconnect area, the continuous upper interconnect area including a plurality of upper contact openings. The integrated circuit further includes a lower interconnect level including a continuous lower interconnect area, the continuous lower interconnect area including a plurality of lower contact openings. First contacts extend through the lower contact openings to the upper interconnect area and second contact openings extend through the upper contact openings to the lower interconnect area. | 05-23-2013 |
20140040853 | Semiconductor Device with Damage Detection Circuit and Method for Producing the Same - A semiconductor chip having a current source coupled between a first potential and an electrical node, a detection circuit having an input coupled to the electrical node, and a first active component coupled in series with the current source and further coupled between the electrical node and a second potential, wherein the first active component is coupled to the electrical node via a first conductive interconnect. | 02-06-2014 |