Patent application number | Description | Published |
20100091603 | KNEADING SCREW, TWIN SCREW EXTRUDER, AND METHOD FOR ASSEMBLING KNEADING SCREW - To provide a kneading screw which can reduce such a phenomenon that a disproportional load is imposed onto a shaft of the kneading screw without degrading kneading performance of the kneading screw, a twin screw extruder with the kneading screw, and a method for assembling the kneading screw. In the kneading screw, each of the kneading rotor segments has at least one of a spiral kneading blade or a kneading blade extending in parallel with the axial direction, and is incorporated in the kneading screw such that top blade portions of the kneading blades at the adjacent ends of the kneading rotor segments adjacent to each other in the axial direction of the kneading screw are shifted in phase to each other, and such that the top blade portions of the kneading blades at the respective central positions in the axial direction of the adjacent kneading rotor segments are shifted larger in phase than the case where the top blade portions of the adjacent ends of the adjacent kneading rotor segments are equal in phase to each other. | 04-15-2010 |
20100271901 | KNEADING DEGREE ADJUSTING MECHANISM, EXTRUDER, CONTINUOUS MIXER, KNEADING DEGREE ADJUSTING METHOD, AND KNEADING METHOD - The degree of kneading of a material to be kneaded is to be capable of being adjusted with a high accuracy. | 10-28-2010 |
20100309745 | KNEADING DEGREE ADJUSTING APPARATUS, EXTRUDER AND CONTINUOUS KNEADER - Provided is a kneading degree adjusting apparatus, which can have a wide adjusting range for a kneading degree even if a gate member and a cylindrical segment are not made so close as to invite a fear of metallic contacts. The kneading degree adjusting apparatus is disposed in a kneading treatment equipment, which includes a cylindrical segment formed at a predetermined portion and a kneading screw for kneading a material while feeding the same to the downstream side, thereby to adjust the kneading degree of the material. The kneading degree adjusting apparatus comprises a gate member having an opposed face confronting the outer circumference of the cylindrical segment and moved toward and away from the outer circumference of the cylindrical segment thereby to change the area of the material passage to be formed between the opposed face and the outer circumference of the cylindrical segment. The outer circumference and the opposed face are corrugated to form the passage into a bent shape. | 12-09-2010 |
Patent application number | Description | Published |
20090097350 | Kneader - One object of the present invention is to provide a kneader which can diminish wear of screws and a barrel while preventing the manufacturing process for the screws and barrel from becoming complicated. In this kneader, a pair of screws are rotated about respective axes thereof to knead a material to be kneaded which is introduced into a kneading space formed within a barrel. Each screw has such a shape generating deflection in a predetermined direction perpendicular to an arranged direction of the axes of the pair of screws during kneading of the material to be kneaded, and the kneading space has a shape such that a pair of accommodating spaces which accommodate each of the screws respectively are connected together so as to overlap each other partially in the radial direction, each accommodating space being formed in such a manner that the diameter thereof in the predetermined direction in which there occurs deflection of each screw is larger than in any other direction. | 04-16-2009 |
20090135016 | LOAD MONITORING METHOD AND LOAD MONITORING APPARATUS FOR KNEADING APPARATUS - In an extruder or a kneader, load (torque T) values on an input shaft portion of a screw shaft are detected by a load detector installed on the input shaft portion, then an overload condition is determined from a load mean value (T | 05-28-2009 |
20090213683 | KNEADING DISC SEGMENT AND TWIN-SCREW EXTRUDER - The kneading disc segment according to the present invention comprises plural disc sets each comprising two kneading discs and mounted on a kneading screw ( | 08-27-2009 |
20100110822 | DEVICE AND METHOD FOR ADJUSTING THE DEGREE OF MIXING - The device for adjusting the degree of mixing according to the present invention is installed in mixing equipment equipped with a kneading/mixing screw for mixing material while feeding the material to a downstream side, wherein a gate member is moved relative to a portion of a circular section provided for the kneading/mixing screw so as to cause a change in the area of a flow path formed between the gate member and the portion of a circular section, thereby adjusting the degree of mixing of the material. Drive quantity changing means is disposed between the gate member and drive means. The drive quantity changing means is constructed so as to change the drive quantity, x, into the movement quantity, Δδ, in accordance with a profile such that a change rate of the movement quantity, Δδ, relative to the drive quantity, x, is made smaller when the degree of opening, δ, of the gate member is smaller and the change rage of the movement quantity, Δδ, relative to the drive quantity, x, is made larger when the degree of opening, δ, of the gate member is larger. Through such construction, it is possible to let the degree of mixing change at a constant change rate relative to the drive quantity of the drive means. | 05-06-2010 |
20130163373 | CONTINUOUS MIXER AND MIXING METHOD - A continuous mixer includes a barrel with a hollow interior, and a pair of mixing rotors housed in the barrel and that rotate in mutually different directions, each mixing rotor including a mixing portion with plural mixing flights formed about an axial center of the mixing rotor and projecting radially outward. The mixing rotors have a center distance therebetween smaller than a rotation outer diameter of each of the respective mixing flights. An inter-rotor clearance, which is the smallest clearance between the mixing portions at each rotation phase of the mixing rotors in a cross section perpendicular to axial directions of the both mixing rotors, has a dimension allowing an extensional flow to be generated in a material passing through the inter-rotor clearance. The continuous mixer can reliably and efficiently mix a material having a large viscosity difference between a dispersed phase and a matrix phase. | 06-27-2013 |
20130176810 | GEL REDUCTION DEVICE AND GEL REDUCTION METHOD - A gel reduction device | 07-11-2013 |
Patent application number | Description | Published |
20090141264 | Method and Apparatus for Observing and Inspecting Defects - A defect inspecting apparatus includes a sample mounting device for mounting a sample; lighting and detecting apparatus for illuminating a patterned sample mounted on a mount and detecting the optical image of the reflected light obtained therefrom. Also included is a display for displaying the optical image detected by this lighting and detecting apparatus; an optical parameter setting device for setting and displaying optical parameters for the lighting and detecting apparatus on the display; and optical parameter adjusting apparatus for adjusting optical parameters set for the lighting and detecting apparatus according to the optical parameters set by the optical parameter setting apparatus; a storage device for storing comparative image data; and a defect detecting device for detecting defects from patterns formed on the sample by comparing the optical image detected by the optical image detecting apparatus with the comparative image data stored in the storage. | 06-04-2009 |
20090214102 | DEFECT INSPECTION METHOD AND APPARATUS - A method of inspecting patterns, including: adjusting a brightness of at least one of a first bright field image and a second bright field image detected from a specimen and directed to similar patterns on differing parts of the specimen, so as to more closely match a brightness; comparing the images which are adjusted in brightness to match with each other to detect dissimilarities indicative of a defect of the pattern, wherein in adjusting the brightness, the brightness between the first bright field image and the second bright field image is adjusted by performing a gradation conversion of at least one of the brightness between the first bright field image and the second bright field image; and wherein in the comparing, said defect of the pattern is detected by using information of a scattered diagram of brightness of the first bright field image and the second bright field image. | 08-27-2009 |
20110170765 | DEFECT INSPECTION METHOD AND APPARATUS - Arrangements for inspecting a specimen on which plural patterns are formed; capturing a first image of a first area; capturing a second image of a second area in which patterns which are essentially the same with the patterns formed in the first area; creating data relating to corresponding pixels of the first and second images, for each pixel; determining a threshold for each pixel for detecting defects directly in accordance with the first and second images; and detecting defects on the specimen by processing the first and second images by using the threshold for each pixel and information of a scattered diagram of brightness of the first and second images, wherein the threshold is determined by using information of brightness of a local region of at least one of the first and second images, with the local region including an aimed pixel and peripheral pixels of the aimed pixel. | 07-14-2011 |
20120128230 | DEFECT INSPECTION METHOD AND APPARATUS - An inspection method, including: illuminating a light on a wafer on which plural chips having identical patterns are formed; imaging corresponding areas of two chips formed on the wafer to obtain inspection images and reference images with an image sensor; and processing the obtained inspection image and the reference image to produce a difference image which indicates a difference between the inspection image and the reference image and detect a defect by comparing the difference image with a threshold, wherein a threshold applied to a difference image which is produced by comparing the inspection image and the reference image obtained by imaging peripheral portion of the wafer is different from a threshold applied to a difference image which is produced by comparing the inspection image and the reference image obtained by imaging central portion of the wafer. | 05-24-2012 |