Patent application number | Description | Published |
20080218974 | Method and Structure for Connecting, Stacking, and Cooling Chips on a Flexible Carrier - A heat sink apparatus having a plurality of chips attached to a first surface of a flexible carrier and a plurality of heat sink fins. One or more additional chips may be attached to a second surface of the flexible carrier. The flexible carrier has at least one complementary fold, the complementary fold having a counterclockwise fold and a clockwise fold as seen from the side. A first chip back surface of a first chip and a second chip back surface of a second chip are in thermal contact with a particular heat sink fin, that is, sharing the same heat sink fin. Thermal contact between the chips and heat sink fins is effected by force, by thermally conducting adhesive, by thermal grease, or by a combination of force and/or thermally conducting adhesive and/or thermal grease. | 09-11-2008 |
20080270968 | APPARATUS, AND COMPUTER PROGRAM PRODUCT FOR IMPLEMENTING VERTICALLY COUPLED NOISE CONTROL THROUGH A MESH PLANE IN AN ELECTRONIC PACKAGE DESIGN - A method, apparatus and computer program product are provided for implementing vertically coupled noise control through a mesh plane in an electronic package design. Electronic package physical design data are received. Instances of vertically coupled noise in the electronic package physical design data are identified. The identified instances of vertically coupled noise are quantified. Then the electronic package physical design data are modified to limit the vertically coupled noise. | 10-30-2008 |
20080307252 | Method and Apparatus for Implementing Redundant Memory Access Using Multiple Controllers on the Same Bank of Memory - A method and apparatus implement redundant memory access using multiple controllers on the same bank of memory. A first memory controller uses the memory as its primary address space, for storage and fetches. A second redundant controller is also connected to the same memory. System control logic is used to notify the redundant controller of the need to take over the memory interface. The redundant controller initializes if required and takes control of the memory. The memory only needs to be initialized if the system has to be brought down and restarted in the redundant mode. This invention allows the system to continue to stay up and continue running during a memory controller or link failure. | 12-11-2008 |
20080307253 | Method and Apparatus for Implementing Redundant Memory Access Using Multiple Controllers on the Same Bank of Memory - A method and apparatus implement redundant memory access using multiple controllers on the same bank of memory, and a design structure on which the subject circuit resides is provided. A first memory controller uses the memory as its primary address space, for storage and fetches. A second redundant controller is also connected to the same memory. System control logic is used to notify the redundant controller of the need to take over the memory interface. The redundant controller initializes if required and takes control of the memory. The memory only needs to be initialized if the system has to be brought down and restarted in the redundant mode. This invention allows the system to continue to stay up and continue running during a memory controller or link failure. | 12-11-2008 |
20090138832 | IMPLEMENTING ENHANCED WIRING CAPABILITY FOR ELECTRONIC LAMINATE PACKAGES - Structures and a computer program product are provided for implementing enhanced wiring capability for electronic laminate packages. Electronic package physical design data are received. Instances of line width and space limit violations in the electronic package physical design data are identified. The identified instances of line width and space limit violations are evaluated using predefined qualified options and tolerance limitations and the electronic package physical design data are modified to optimize shapes to replace the instances of line width and space limit violations. | 05-28-2009 |
20090273098 | Enhanced Architectural Interconnect Options Enabled With Flipped Die on a Multi-Chip Package - A particular chip is designed having a first variant (front side connected chip) of the chip and a second variant (back side connected chip). The first variant of the chip is attached to a carrier. The second variant of the chip is attached to the carrier inverted relative to the first variant of the chip. The first and second variants of the chip are attached to the carrier such that a vertical surface (side) of the first variant of the chip faces a corresponding vertical surface of the second variant of the chip. A circuit on the first variant of the chip is electrically connected to a corresponding circuit on the second variant of the chip. | 11-05-2009 |
20090300291 | Implementing Cache Coherency and Reduced Latency Using Multiple Controllers for Memory System - A method and apparatus implement cache coherency and reduced latency using multiple controllers for a memory system, and a design structure is provided on which the subject circuit resides. A first memory controller uses a first memory as its primary address space, for storage and fetches. A second memory controller is also connected to the first memory. A second memory controller uses a second memory as its primary address space, for storage and fetches. The first memory controller is also connected to the second memory. The first memory controller and the second memory controller, for example, are connected together by a processor communications bus. A request and send sequence of the invention sends data directly to a requesting memory controller eliminating the need to re-route data back through a responding controller, and improving the latency of the data transfer. | 12-03-2009 |
20090300411 | Implementing Redundant Memory Access Using Multiple Controllers for Memory System - A method and apparatus implement redundant memory access using multiple controllers for a memory system, and a design structure on which the subject circuit resides are provided. A first memory controller uses a first memory and a second memory controller uses the second memory as its respective primary address space, for storage and fetches. The second memory controller is also connected to the first memory. The first memory controller is also connected to the second memory. The first memory controller and the second memory controller, for example, are connected together by a processor communications bus. When one of the first memory controller or the second memory controller fails, then the other memory controller is notified. The other memory controller takes control of the memory for the failed controller, using the direct connection to that memory, and maintains coherence of both the first memory and second memory. | 12-03-2009 |
20100019385 | Implementing Reduced Hot-Spot Thermal Effects for SOI Circuits - Methods and structures are provided for implementing reduced hot spot thermal effects for silicon-on-insulator (SOI) circuits. A silicon-on-insulator (SOI) structure includes a silicon substrate layer, a thin buried oxide (BOX) layer carried by the silicon substrate layer, an active layer carried by the thin BOX layer, and a pad oxide layer carried by the active layer. A thermal conductive path is built to reduce thermal effects of a hotspot area in the active layer and extends from the active layer to the backside of the SOI structure. A trench etched from the topside to the active layer, and is filled with a thermal connection material. A thermal connection from a backside of the SOI structure includes an opening etched into the silicon substrate layer from the backside and filled with a thermal connection material. | 01-28-2010 |
20100024202 | Enhanced On-Chip Inductance Structure Utilizing Silicon Through Via Technology - This invention utilizes silicon through via technology, to build a Toroid into the chip with the addition of a layer of magnetic material such as Nickel above and below the T-coil stacked multi-ring structure. This allows the connection between the inner via and an array of outer vias. This material is added on a BEOL metal layer or as an external coating on the finished silicon. Depending on the configuration and material used for the via, the inductance will increase approximately two orders of magnitude (e.g., by utilizing a nickel via core). Moreover, a ferrite material with proper thermal conduction properties is used in one embodiment. | 02-04-2010 |
20100032799 | Implementing Decoupling Capacitors With Hot-Spot Thermal Reduction on Integrated Circuit Chips - A method and structures are provided for implementing decoupling capacitors with hot spot thermal reduction on integrated circuit chips including silicon-on-insulator (SOI) circuits. A silicon-on-insulator (SOI) structure includes a silicon substrate layer, a thin buried oxide (BOX) layer carried by the silicon substrate layer, and an active layer carried by the thin BOX layer. A thermal conductive path is built proximate to a hotspot area in the active layer to reduce thermal effects including a backside thermal connection from a backside of the SOI structure. The backside thermal connection includes a backside etched opening extending from the backside of the SOI structure into the silicon substrate layer, a capacitor dielectric formed on said backside etched opening; and a thermal connection material deposited on said capacitor dielectric filling said backside etched opening. | 02-11-2010 |
20100187525 | IMPLEMENTING TAMPER EVIDENT AND RESISTANT DETECTION THROUGH MODULATION OF CAPACITANCE - A method and tamper detection circuit for implementing tamper and anti-reverse engineering evident detection in a semiconductor chip, and a design structure on which the subject circuit resides are provided. A capacitor is formed with the semiconductor chip including the circuitry to be protected. A change in the capacitor value results responsive to the semiconductor chip being thinned, which is detected and a tamper-detected signal is generated. | 07-29-2010 |
20100271046 | IMPLEMENTING AT-SPEED WAFER FINAL TEST (WFT) WITH COMPLETE CHIP COVERAGE - A method, an apparatus and a computer program product are provided for implementing At-Speed Wafer Final Test (WFT) with total integrated circuit chip coverage including high speed off-chip receiver and driver input/output (I/O) circuits. An integrated circuit (IC) chip includes off-chip Controlled Collapse Chip Connection (C4) nodes and a driver and a receiver of the off-chip receiver and driver input/output (I/O) circuits connected to respective off-chip C4 nodes. Through Silicon Vias (TSVs) are added to the connections of the driver and the receiver and the respective off-chip C4 nodes to a backside of the IC chip. A metal wire is added to the IC chip backside connecting the TSVs and creating a connection path between the driver and the receiver that is used for the at-speed WFT testing of the I/O circuits. | 10-28-2010 |