Gunyan
Daniel Gunyan, Rohnert Park, CA US
Patent application number | Description | Published |
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20090237069 | METHOD AND APPARATUS FOR DETERMINING A RESPONSE OF A DUT TO A DESIRED LARGE SIGNAL, AND FOR DETERMINING INPUT TONES REQUIRED TO PRODUCE A DESIRED OUTPUT - A method for determining input tones required to produce a desired output includes the step of extracting a linearization of a spectral map representing a device under test (DUT) that i) is under drive of a large signal having one or more fundamental frequencies with associated amplitudes and phases, and ii) produces an approximation of a desired output having at least one unwanted spectral component. The method includes the further step of using an inverse of the extracted linearization to determine the input tones required to produce the desired output under a given load condition. | 09-24-2009 |
Daniel B. Gunyan, Santa Rosa, CA US
Patent application number | Description | Published |
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20090184722 | Large Signal Scattering Functions From Orthogonal Phase Measurements - The invention measures the X-parameters (or large-signal S and T scattering functions, sometimes called linearized scattering functions, which are the correct way to define “large-signal S-parameters”) with only two distinct phases for small-signals on a frequency grid established by intermodulation frequencies and harmonics of the large-tones, with guaranteed well-conditioned data from which the X-parameter functions can be solved explicitly, without the need for regression, and not limited by performance limits of the reference generator or phase-noise. | 07-23-2009 |
Daniel B. Gunyan, Rohnert Park, CA US
Patent application number | Description | Published |
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20090125264 | Nonlinear Measurement System Error Correction - A method for eliminating the systematic measurement errors from a measurement system, for example a vector network analyzer, such that an accurate representation of the behavior of a nonlinear device can be measured or characterized. The cross-frequency phase and absolute amplitude of the measured voltage waves applied to and emanating from the nonlinear device are measured and error corrected. These waves may be used for nonlinear device characterization or modeling. | 05-14-2009 |