Patent application number | Description | Published |
20090027957 | VOLTAGE SUPPLY CIRCUIT AND FLASH MEMORY DEVICE INCLUDING THE SAME, AND METHOD OF SUPPLYING OPERATING VOLTAGE - A voltage supply circuit includes a voltage generator and a controller. The voltage generator is configured to pump an externally input voltage and store the pumped external voltage as a first voltage having a set voltage level, before power-up begins, or pump the external voltage, add the pumped voltage to the stored voltage, and output the added voltage as an operating voltage. The controller is configured to output a first control signal to drive the voltage generator or stop operation of the voltage generator, according to an operating state. | 01-29-2009 |
20090052247 | FUSE CIRCUIT AND FLASH MEMORY DEVICE HAVING THE SAME - A fuse circuit in a flash memory device is disclosed. The fuse circuit includes a plurality of memory cells turned on/off by a first voltage in accordance with program state, a switching circuit configured to switch in response to a control signal, thereby transmitting a verifying signal for verifying program of the memory cell to the memory cell, and a cell controller configured to output the verifying signal for controlling program, verification and erase of the memory cells and the control signal. | 02-26-2009 |
20090122615 | NON-VOLATILE MEMORY DEVICE AND METHOD OF OPERATING THE SAME - Program voltages of a non-volatile memory device are controlled variably according to a program/erase operation count. The non-volatile memory device includes a program voltage supply unit for applying a program voltage to a memory cell, a program/erase count storage unit for storing a total program/erase operation count of the non-volatile memory device, a program start voltage storage unit for storing levels of program start voltages to be differently supplied according to the program/erase operation count, and a program voltage controller for controlling the program start voltage according to the program/erase operation count. | 05-14-2009 |
20090122616 | NON-VOLATILE MEMORY DEVICE AND METHOD OF CONTROLLING A BULK VOLTAGE THEREOF - A threshold voltage of a non-volatile memory device is compensated by a voltage supplier and a controller. The voltage supplier supplies a set voltage to a bulk of a memory cell array, including memory cells, at the time of a read operation of the memory cells. The controller controls the voltage supplier to set and supply a bulk voltage depending on a threshold voltage change of the memory cells. | 05-14-2009 |
20090172482 | METHODS FOR PERFORMING FAIL TEST, BLOCK MANAGEMENT, ERASING AND PROGRAMMING IN A NONVOLATILE MEMORY DEVICE - Methods for performing a fail test, block management, erase operations and program operations are used in a nonvolatile memory device having a block switch devoid of a fuse and a PMOS transistor. A method for performing a fail test in a nonvolatile memory device includes performing a fail test for a memory cell block; storing good block information in a block information store associated with the corresponding block when the memory cell block is a good block; and repeating the performing and storing steps for all memory cell blocks. | 07-02-2009 |
20090238007 | METHOD OF SUPPLYING AN OPERATING VOLTAGE OF A FLASH MEMORY DEVICE - A method of supplying an operating voltage of a flash memory device includes supplying an operating voltage to a word line selected according to an input address, and changing a pass voltage according to a change of the operating voltage level. The pass voltage is supplied to unselected word lines other than the selected word line. | 09-24-2009 |
20100284222 | FUSE CIRCUIT AND FLASH MEMORY DEVICE HAVING THE SAME - A flash memory device includes a main cell array configured to have main memory cells for storing data and a redundancy cell array configured to have redundancy memory cells for repairing a failed memory cell of the main cell array. A page buffer circuit is configured to perform a program operation, a verifying operation and a read operation on the main cell array and the redundancy cell array. A repair circuit includes fuse circuits having fuse memory cells each of which is programmed in response to address information. The repair circuit is operated in response to a program state of the fuse memory cells and output a repair signal. A data input/output controller is configured to control input/output of data to/from the main memory cell or the redundancy memory cell in accordance with the repair signal outputted by the repair circuit. | 11-11-2010 |
20120087197 | SEMICONDUCTOR MEMORY APPARATUS AND METHOD FOR CONTROLLING THE SAME - A semiconductor memory apparatus includes: a skew monitoring unit configured to receive a reference voltage and monitor a voltage characteristic of a corresponding MOS transistor; a voltage sensing unit configured to provide a sensing voltage corresponding to the monitoring result of the voltage characteristic; a coding unit configured to multiplex an output signal of the voltage sensing unit and provide a skew control signal; and an internal voltage regulation unit configured to provide an internal voltage by regulating an internal bias voltage in response to the skew control signal. | 04-12-2012 |
20120306470 | DOWN-CONVERTING VOLTAGE GENERATING CIRCUIT - A down-converting voltage generating circuit includes a reference voltage providing unit, an initial setting unit, a driving unit, and a driving force control unit. The reference voltage providing unit provides a reference voltage to a first node. The initial setting unit drops a voltage level of the first node to substantially a level of a ground voltage when an initial setting signal is activated. The driving unit drives a down-converted voltage derived from an external voltage in response to the voltage level of the first node. The driving force control unit is connected to the driving unit, and controls a driving force for driving the down-converted voltage of the driving unit in response to the initial setting signal. | 12-06-2012 |
20120313679 | PUMP CIRCUIT AND METHOD FOR PUMPING VOLTAGE IN SEMICONDUCTOR APPARATUS - A pump circuit includes a first clock generation unit, a second clock generation unit and a pumping stage unit. The first clock generation unit is configured to generate a first clock with a first amplitude by using an input clock and an external voltage. The second clock generation unit is configured to generate a second clock with a second amplitude larger than the first amplitude by using the input clock and an amplified voltage generated by amplifying the external voltage. The pumping stage unit is configured to increase an input voltage using the first clock and the second clock and generate amplified output voltages. | 12-13-2012 |
Patent application number | Description | Published |
20090251983 | SEMICONDUCTOR MEMORY APPARATUS CAPABLE OF REDUCING GROUND NOISE - An apparatus includes a plurality of first driving signal driving units, and generates a first driving signal by driving an input signal, a plurality of second driving signal driving units, each of which drives an input signal and generates a second driving signal, a timing control unit that controls each of the first driving signal driving units such that a predetermined time difference is generated between an enable timing of the first driving signal and an enable timing of the second driving signal, a plurality of sense amplifier driving units, each of which generates a first driving level and a second driving level according to the first driving signal and the second driving signal, and a plurality of sense amplifiers that are provided for respective bit line pairs, and each include first type switching elements operating according to the first driving level and second type switching elements operating according to the second driving level. | 10-08-2009 |
20090257302 | Semiconductor memory apparatus capable of reducing ground noise - An apparatus includes a plurality of first driving signal driving units, and generates a first driving signal by driving an input signal, a plurality of second driving signal driving units, each of which drives an input signal and generates a second driving signal, a timing control unit that controls each of the first driving signal driving units such that a predetermined time difference is generated between an enable timing of the first driving signal and an enable timing of the second driving signal, a plurality of sense amplifier driving units, each of which generates a first driving level and a second driving level according to the first driving signal and the second driving signal, and a plurality of sense amplifiers that are provided for respective bit line pairs, and each include first type switching elements operating according to the first driving level and second type switching elements operating according to the second driving level. | 10-15-2009 |
20100008137 | NONVOLATILE MEMORY DEVICE AND PROGRAM OR ERASE METHOD USING THE SAME - A nonvolatile memory device includes a comparison unit configured to compare a reference voltage and a voltage of each of a plurality of nodes of a sample memory cell string, a state storage unit configured to store state information of each of memory cells depending on the corresponding comparison result of the comparison unit, and a high voltage generation unit configured to change a program start voltage depending on data stored in the state storage unit. | 01-14-2010 |
20120007662 | HIGH VOLTAGE CONTROL CIRCUIT OF SEMICONDUCTOR DEVICE - A high voltage control circuit of a semiconductor device includes an output node control circuit configured to set an initial potential of an output terminal or to discharge the potential of the output terminal, in response to an input signal and a high voltage supply circuit comprising an acceleration unit and a potential control unit coupled in series between the output terminal and a supply terminal for supplying a high voltage. The acceleration unit is operated in response to the potential of the output terminal, and the potential control unit is operated in response to the input signal. | 01-12-2012 |
20120169396 | VOLTAGE DOWN CONVERTER - A voltage down converter includes a first driver having a first input terminal configured to generate a first voltage by using an external voltage in response to a first driving signal being inputted to the first input terminal, a control circuit configured to output the first driving signal to the first input terminal in response to a level of the first voltage, a second driver having a second input terminal configured to generate a second voltage by using the external voltage in response to the first driving signal or a second driving signal being inputted to the second input terminal, wherein the first driving signal is transferred from the first input terminal to the second input terminal through a conductive line, and a driving control circuit configured to generate the second driving signal and transferred to the second input terminal in response to a level of the second voltage. | 07-05-2012 |
20120274396 | SEMICONDUCTOR DEVICE AND SEMICONDUCTOR SYSTEM INCLUDING THE SAME - A semiconductor device and a power voltage supply circuit for a test operation of a semiconductor system including the semiconductor device. The semiconductor device receives first and second power supply voltages in a normal operation mode from an external device and receives the first power supply voltage in a test operation mode. The semiconductor device includes a voltage level setting unit configured to set a power connection node at a voltage between a voltage level of a first power supply voltage terminal and a voltage level of a ground voltage terminal according to an operation mode signal, and a voltage driving unit configured to drive a second power supply voltage terminal with the first power supply voltage in the test operation mode, wherein the driving power is controlled according to the voltage level of the power connection node. | 11-01-2012 |
20140062583 | INTEGRATED CIRCUIT AND METHOD OF OPERATING THE SAME - An integrated circuit includes a first internal voltage generation unit configured to generate a first voltage and output the first voltage through an internal voltage terminal in an active operation period, a second internal voltage generation unit configured to generate a second voltage and output the second voltage through the internal voltage terminal in an initial section of a standby operation period, and a third internal voltage generation unit configured to generate a third voltage and output the third voltage through the internal voltage terminal in the remaining section of the standby operation period. | 03-06-2014 |