Patent application number | Description | Published |
20090169111 | SYSTEM AND METHOD FOR FINDING EDGE POINTS OF AN OBJECT - A method for finding edge points of an object is disclosed. The method includes receiving an electronic image of an object, selecting one or more edge points in the image of the object, creating an image template for each edge point in the object image. The method further includes receiving a command to measure a second object of the same kind as the object and obtaining a measured object image, reading the image templates for the same kind of object from the storage device, and finding a matched sub-image to each image template from the measured object image according to an image matching algorithm, obtaining a central point of each matched sub-image and displaying coordinates of the central point of the matched sub-image. | 07-02-2009 |
20100053191 | SYSTEM AND METHOD FOR COMPUTING AND DISPLAYING A ROUNDNESS ERROR OF AN OBJECT - A method and system for computing and displaying a roundness error of an object specifies different colors that respectively represents an error range of points. The method and system receives a point cloud of the object and fits a circle based on the point cloud. The method and system computes an error of each point in the point cloud by computing a distance between the each point and the circle, colorizes the points in the point cloud according to the errors and the specified colors, and generates and outputting a graphic roundness error analysis report. | 03-04-2010 |
20100096539 | CALIBRATION PLATE AND CALIBRATION METHOD - A calibration plate is configured for revising an image capture apparatus of a vision measuring system. The vision measuring system includes a worktable which is configured for supporting the calibration plate. The calibration plate includes a quadrate portion. A calibration area and a zero marker are formed on the quadrate portion. The calibration area includes a plurality of regions having the same shape. | 04-22-2010 |
20100165086 | LIGHT SOURCE FOR VISION MEASURING INSTRUMENT AND POSITIONING SYSTEM USING THE SAME - A light source is configured to be mounted to a vision measuring instrument that includes a primary image capture unit capturing an image of an object to be measured, and an auxiliary image capture unit providing a means to aim the primary image capture unit at a determined position. The light source includes a main body defining a through hole for receiving the primary image capture unit, and a mounting hole for readily mounting an auxiliary image capture unit. A luminescent surface is formed on an inner wall bounding the through hole of the main body. A number of light-emitting diodes (LEDs) is disposed on the luminescent surface. | 07-01-2010 |
20100182487 | SYSTEM AND METHOD FOR AUTOMATICALLY FOCUSING AN OPTICAL LENS OF AN IMAGE MEASURING MACHINE - A system and method for automatically focusing an optical lens controls the light generated by a light-emitting device of an image measuring machine to penetrate a glass sheet, so as to project a picture of the glass sheet onto an object. The system and method further moves an optical lens along a Z-axis of the image measuring machine to capture one or more digital images of the object, and computes a definition value of each captured digital image. Furthermore, the system and method obtains a focus position corresponding to the highest definition value of the captured digital image. | 07-22-2010 |
20100238406 | FOCUS ASSISTING DEVICE - A focus assisting device is configured to assist a vision measuring system to focus on an object with smooth low-contrast surfaces. The focus assisting device includes a plurality of transparent portion and a plurality of nontransparent portion. | 09-23-2010 |
20110069383 | MEASUREMENT APPARATUS - A measurement apparatus includes a lamp mount including a first mount and a second mount. The first mount has a first cavity to mount an observation module. The second mount has a second cavity to mount an image capture module. The measurement apparatus further includes a plurality of light modules mounted on an undersurface of the lamp mount. The second mount is disposed with an included angle relative to a first axis of the first cavity so that a second axis of the second cavity and the first axis converge on a point. The undersurface of the lamp mount is concave so that light from the light modules tilts toward the first axis, and the light and the first axis also converge on the point. | 03-24-2011 |
20110128427 | FOCUS APPARATUS OF IMAGE MEASURING SYSTEM - A focus apparatus comprises a first illuminator for emitting light onto an object, an optical apparatus, an image capture apparatus for receiving an image of the object through the optical apparatus, and converting the image into electronic signals, a spectroscope, a coaxial light apparatus and a patterned light apparatus. The coaxial light apparatus and the patterned light apparatus are perpendicularly mounted to a spectroscope. The coaxial light apparatus is perpendicular to the patterned light apparatus. The spectroscope refracts patterned light from the patterned light apparatus and coaxial light from the coaxial light apparatus to the optical apparatus. | 06-02-2011 |
20110149546 | FOCUS APPARATUS OF IMAGE MEASURING SYSTEM - A focus apparatus comprises a light apparatus emits the light onto an object, an optical apparatus, an image capture apparatus for receiving an image of the object through the optical apparatus, and converting the image into electronic signals, and a adapter. The adapter connects the light apparatus and the optical apparatus. The light apparatus transfers thermal energy generated by the light apparatus to the air of the surrounding environment, and scatters the light to make the light propagate uniformly. | 06-23-2011 |
20110161876 | COMPUTER AND METHOD FOR GENERATIING EDGE DETECTION COMMANDS OF OBJECTS - A computer and a method for generation commands include loading a data exchange format (DXF) image, and selecting a measurement tool and selecting a DXF feature of the DXF image. The generation commands method further includes generating an edge detection command of the selected DXF feature according to the measurement tool when the size of the selected DXF feature is not larger than the size of an image area. And an edge detection command corresponding to each of the reselected measurement tools is generated when the size of the selected DXF feature is larger than the size of the image area. | 06-30-2011 |
20110191049 | SYSTEM AND METHOD FOR VERIFYING MANUFACTURING ACCURACY - In a method for verifying manufacturing accuracy, a point cloud of a workpiece is read. A first determined point is determined according to the first point of the point cloud and a second determined point is determined according to the final point of the point cloud. A first line, a second line, and a third line are all located by respectively connecting the first point and the first determined point, the final point and the second determined point, and the first determined point and the second determined point. Qualification of the workpiece is determined by measuring a first angle of the first line and the third line, a second angle of the second line and the third line, a first distance between the first determined point and the second line, and a second distance between the second determined point and the first line. | 08-04-2011 |
20110211730 | IMAGE MEASURING DEVICE FOR CALIBRATION TEST AND METHOD THEREOF - An image measuring device comprises a storage, a processor, an acquiring module, a positioning module and a determining module. The acquiring module acquires an image of a production object by scanning the production object. The positioning module positions the image of the production object in a coordinate plane according to predefined parameters and acquiring the edge of the image of the production object. The determining module determines whether the difference between the positioned image and the predefined parameters is over a tolerance, wherein the acquiring module, the positioning module and the determining module are stored in the storage and controlled by the processor. | 09-01-2011 |
20120230605 | COMPUTING DEVICE AND OFFLINE PROGRAMMING METHOD - A computing device and method for programming a measuring program into the device. The system and method divide an ideal image into one or more sections and obtains the attributes of each of the sections. The system and method measure dimensions from a desired position located in each of the sections based on a coordinate system created for each of the sections, and obtains ideal measurements from the desired position. The system and method generate a measuring program which is capable of executing the steps mentioned above. | 09-13-2012 |
20120232835 | ELECTRONIC DEVICE AND METHOD FOR ANALYZING ADJOINING PARTS OF A PRODUCT - A scanner obtains point-cloud data of adjoining parts of a product. A computing device reads two point-clouds from the point-cloud data, fits two or more lines according to the two point-clouds, selects two lines that have the same ascending direction from the two or more lines, and creates a two-dimensional coordinates system base on the two selected lines. The computing device determines a highest point in each of the two point-clouds based on distances from each point in either of the point-clouds to a corresponding selected line, and determines two nearest points in the two point-clouds. A difference between Y coordinates of the two highest points is determined as a gap-height of two adjoining parts of the product, and a difference between X coordinates of the two nearest points is determined as a gap-width between two adjoining parts. | 09-13-2012 |
20120278063 | ELECTRONIC DEVICE AND METHOD FOR SUPPORTING MULTIPLE LANGUAGES IN IMAGE MEASUREMENT PROGRAMS - An electronic device connected to a measurement machine is installed with an image measurement program. The electronic device records detailed information in relation to a new language file added to a template file provided by the image measurement program, and creates one or more executable files for the image measurement program based on the template file. When the image measurement program is started, the electronic device adds the new language to a language selection menu of a user interface of the image measurement program by executing the one or more executable files, displays all languages available to the image measurement program under the language selection menu of the user interface, and after selection and displays all information in a user-selected language. | 11-01-2012 |
20130077089 | COMPUTING DEVICE AND PRECISION TESTING METHOD OF OPTICAL LENS USING THE COMPUTING DEVICE - In a precision testing method of an optical lens using a computing device, the computing device is connected to an imaging system. The computing device controls the imaging system to generate an image of an object according to light rays reflected from the object and collected by the optical lens. A dimension of the object is measured from the image. A maximum value and a minimum value of the dimension of the object are determined. A difference between the maximum value and the minimum value is calculated. According to the difference, it is determined whether the optical lens agrees with a precision requirement. | 03-28-2013 |
20130096709 | COMPUTING DEVICE AND METHOD FOR GENERATING ENGINEERING TOLERANCES OF A MANUFACTURED OBJECT - In a method for generating engineering tolerances of a manufactured object using a computing device, the computing device sets engineering tolerances to a determined number of decimal places and stores the engineering tolerances into a storage system. The computing device receives a measured dimension of the manufactured object and a nominal dimension corresponding to the measured dimension. A number of decimal places of the nominal dimension is determined, and a pair of engineering tolerances of the manufactured object is retrieved from the storage system. The measured dimension, the nominal dimension, and the retrieved pair of engineering tolerances are displayed on a display device. | 04-18-2013 |
20130120562 | COMPUTING DEVICE AND METHOD FOR CALIBRATING STAR PROBE OF IMAGE MEASURING MACHINE - In a method for calibrating a star probe of an image measuring machine, the star probe includes one or more probe heads. Probe configuration information for the star probe is configured when there is no probe configuration file of the star probe stored in a storage device of the image measuring machine, and one of the probe heads to be calibrated is selected from the star probe. The method calibrates a radius value of the selected probe head, and calibrates the deviation between the center point of the selected probe head and the focus of the camera lens. The method further generates a star probe model of the star probe according to the probe configuration information and the probe calibration information, and displays the star probe model of the star probe on a display device of the image measuring machine. | 05-16-2013 |
20130138974 | SYSTEM AND METHOD FOR ENCRYPTING AND STORING DATA - A computing device connects with a vision measuring machine (VMS). Then the computing device generates a one time password (OTP). A size of the OTP, the OTP are stored in a predefined file. The computing device obtains a size of measurement program codes of the VMS. The size of the OTP and the size of the measurement program codes are stored in the predefined file. The measurement program codes are encrypted by the OTP. If the measurement data includes image data of an object which is measured by the VMS, the computing device stores the encrypted program codes, a type of the image data, image data, and a size of the image data in the predefined file. | 05-30-2013 |
20130155313 | ELECTRONIC DEVICE AND METHOD FOR FOCUSING AND MEASURING POINTS OF OBJECTS - In an electronic device, an image point A on an image of an object is selected. A spectral confocal sensor is controlled to move to a position above a measuring point A′ on the object, where the measuring point A′ corresponds to the image point A, and a Z-coordinate of the measuring point A′ is computed using the spectral confocal sensor. A focal position of the measuring point A′ is computed according to the Z-coordinate of the measuring point A′, and a CCD lens is controlled to move to the focal position. The Z-coordinate of the measuring point A′ is stored into a storage unit of the electronic device. | 06-20-2013 |
20130169975 | COMPUTING DEVICE AND METHOD FOR SCANNING EDGES OF AN OBJECT - In a method for scanning edges of an object using a computing device, the computing device is connected to an image measuring machine including an image capturing device. A start point, an end point, a scan direction, and a scan distance interval are set. Scan points on the edges of the object are determined. For each scan point, the computing device aims the image capturing device at the scan point, controls the image capturing device to capture images of the object at different depths, and records focal points. Definition values of the images are calculated and an image with a highest definition value is determined. A focal point corresponds to the image with the highest definition value and so coordinates of the scan point are determined. Scanned edges of the object are formed based on all the scan points. | 07-04-2013 |
20130242178 | OPTICAL MODULE FOR IMAGE MEASURING APPARATUS - An optical module includes a first sleeve, a second sleeve, a connecting member and a beam splitter. The first sleeve defines a first hollow cavity and includes a first light source and a pattern plate. The second sleeve defines a second hollow cavity and a second light source. The connecting member is connected to the first sleeve and the second sleeve, and communicates with the first hollow cavity and the second hollow cavity. The beam splitter is positioned in the connecting member. Light from the first light source passes through the pattern plate, and the beam splitter, light from the second light source passes through the beam splitter, the beam splitter refracts the light from the first light source and the second light source to a tested workpiece. | 09-19-2013 |