Lightfoot
Andrew Lightfoot, Harlow GB
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20120283273 | INDOLE AND AZAINDOLE MODULATORS OF THE ALPHA 7 NACHR - This invention relates to modulation of the α7 nicotinic acetylcholine receptor (nAChR) by a compound of formula (I) or a pharmaceutically acceptable salt thereof. | 11-08-2012 |
Andrew Lightfoot, Essex GB
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20080269197 | AROMATIC SULFONES AND THEIR MEDICAL USE - The invention provides compounds of formula (I): | 10-30-2008 |
Andrew Lightfoot, Ware GB
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20140341932 | Novel pepetides - The present invention relates to novel peptides derivable from the polypeptide chaperonin 60.1 and to their use in medicine, such as for the prevention and/or treatment of inflammatory conditions. | 11-20-2014 |
Andrew Lightfoot, Middlesex GB
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20130310380 | ALPHA-7 NICOTINIC RECEPTOR MODULATORS FOR THE TREATMENT OF PAIN, A PSYCHOTIC DISORDER, COGNITIVE IMPAIRMENT OR ALZHEIMER'S DISEASE - Compounds are disclosed which modulate the α7 nicotinic acetyl choline receptor (nAChR), having the formula (I) wherein the variables are as specified in the description and claims. | 11-21-2013 |
Andrew P. Lightfoot, Harlow, Essex GB
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20110034515 | INDOLE MODULATORS OF THE ALPHA 7 NICOTINIC ACETYLCHOLINE RECEPTOR - This invention relates to modulation of the α7 nicotinic acetylcholine receptor (nAChR) by a compound of formula (I) or a salt thereof | 02-10-2011 |
Andrew P. Lightfoot, Essex GB
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20110028486 | INDOLES AS MODULATORS OF NICOTICIC ACETYLCHOLINE RECEPTOR SUBTYPE ALPHA-7 - The present invention relates to modulation of the α7 nicotinic acetylcholine receptor (nAChR) by a compound of List A or a salt thereof, which may be represented, but is not limited to the compound N-[(2-Trifluoromethyl-1H-indol-5-yl)methyl]-5-(trifluoromethyl)-2-pyrimidinecarboxamide. | 02-03-2011 |
Damien Lightfoot, Netherby AU
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20140013465 | PAPAVER BRACTEATUM WITH MODIFIED ALKALOID CONTENT - The present invention relates to genetically modified plants of the species | 01-09-2014 |
John Lightfoot, Cumbria GB
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20100010764 | CORRECTION OF A RADIOACTIVITY MEASUREMENT USING PARTICLES FROM ATMOSPHERIC SOURCE - A method of correcting a measure of radioactive material within a body of material includes measuring a characteristic of the radioactive material to provide a measure, such as gamma emissions; detecting muons and/or electrons generated by muons which have not passed through the body of material to give a first value; detecting muons and/or electrons generated by muons which have passed through the body of material to give a second value; processing the first value and second value to give a factor, for instance indicative of the density of the body of material; and correcting the measure using the factor to obtain a corrected measure of the radioactive material with the body of material, for instance to correct for the density of the body of material and attendant issues such as attenuation and shielding. | 01-14-2010 |
John Adrian Lightfoot, Cumbria GB
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20090114836 | INSTRUMENTS - Monitoring radioactive emissions includes providing a processor having a plurality of potential data input channels, providing data input to the processor the potential data input channels, that data input being generated by an instrument, and combining all the data inputs in the processor. The processor is configured to handle data input from at least two of each of the following groups: (i) a gamma detector, a low resolution gamma detector, a high resolution gamma detector, a beta detector, an alpha detector, an ion detector, an X-ray detector, a neutron detector, a detectors responding to passive emissions, a detector responsive to active emissions, a detector responsive to a transmission source; and (ii) a distance measurer, such as a range finder, a visual radiation detector, such as a still camera and/or digital camera and/or video camera, a measurer of weight, a measurer of mass, a measurer of size. | 05-07-2009 |
Nigel Lightfoot, Malvern GB
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20090122313 | Broad-range spectrometer - In one general aspect, a particle characterization instrument is disclosed that includes a first spatially coherent light source with a beam output aligned with an optical axis. A focusing optic is positioned along the optical axis after the coherent light source, and a sample cell is positioned along the optical axis after the focusing optic. The instrument also includes a diverging optic positioned along the optical axis after the sample cell, and a detector positioned outside of the optical axis to receive scattered light within a first range of scattering angles from the diverging optic. In another general aspect, an instrument can direct at least a portion of a first beam and at least a portion of a second beam along a same optical axis and a can receive scattered light from the sample cell resulting from interaction between the sample and either the first beam or the second beam. | 05-14-2009 |
Paul Thomas Lightfoot, Stoke-On-Trent GB
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20090065487 | Method of Providing a Machine Readable Marking - A method of providing a machine readable marking on a substrate being a part of an actuator is described, in which the marking includes at least first and second marks, and the method including repeatedly firing a laser device so that at each of a plurality of row positions of a first area of the substrate, substrate material is heated and displaced thus to provide a depression in the surface of the substrate at least partially surrounded by displaced material, the method including providing a plurality of rows of such depressions in the first area to form the first mark, repeatedly firing a laser device so that at each of a plurality of row positions of a second area of the substrate, substrate material is heated and displaced thus to provide a depression in the surface of the substrate at least partially surrounded by displaced material, the method including providing a plurality of rows of such depressions in the second area to form the second mark, and wherein each depression of the rows of depressions of the first and second marks has a depth determined from the general surface of the substrate less than 4 μm, and the height of the displaced material determined from the general surface of the substrate is not greater than 4 μm. | 03-12-2009 |